scholarly journals Monte-Carlo Simulation in Electron Microscopy and Spectroscopy

10.5772/16122 ◽  
2011 ◽  
Author(s):  
Vladimir Stary
Keyword(s):  
Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo

scholarly journals Examining metallic glass formation in LaCe:Nb by ion implantation

2017 ◽  
Vol 32 (2) ◽  
pp. 127-135
Author(s):  
Richard Sisson ◽  
Cameron Reinhart ◽  
Paul Bridgman ◽  
Tatjana Jevremovic
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Metallic Glass ◽  
Metallic Glasses ◽  
Material Characterization ◽  
Volume Distribution ◽  
Molten Metals ◽  
Fast Cooling

In order to combine niobium (Nb) with lanthanum (La) and cerium (Ce), Nb ions were deposited within a thin film of these two elements. According to the Hume-Rothery rules, these elements cannot be combined into a traditional crystalline metallic solid. The creation of an amorphous metallic glass consisting of Nb, La, and Ce is then investigated. Amorphous metallic glasses are traditionally made using fast cooling of a solution of molten metals. In this paper, we show the results of an experiment carried out to form a metallic glass by implanting 9 MeV Nb 3+ atoms into a thin film of La and Ce. Prior to implantation, the ion volume distribution is calculated by Monte Carlo simulation using the SRIM tool suite. Using multiple methods of electron microscopy and material characterization, small quantities of amorphous metallic glass are indeed identified.

scholarly journals Computational Structure Refinement by Hybrid Reverse Monte Carlo Simulation Incorporating Fluctuation Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 794-795
Author(s):  
J. Hwang ◽  
Z.H. Melgarejo ◽  
Y.E. Kalay ◽  
M.J. Kramer ◽  
D.S. Stone ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Structure Refinement ◽  
Reverse Monte Carlo ◽  
Computational Structure ◽  
Reverse Monte Carlo Simulation ◽  
Fluctuation Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission

2018 ◽  
Vol 24 (6) ◽  
pp. 634-646 ◽  
Author(s):  
Etienne Brodu ◽  
Emmanuel Bouzy
Keyword(s):  
Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Diffraction Pattern ◽  
Cross Sections ◽  
Large Angle ◽  
Spatial Relationship ◽  
Silicon Sample ◽  
Interaction Volume ◽  
Set Up

AbstractThe finding of this study is that the interaction volume in electron microscopy in transmission is well ordered laterally, with a remarkable and unexpected consequence being that lateral subsections of the interaction volume produce subsections of the Kikuchi diffraction pattern. It makes the microstructure of samples directly visible in Kikuchi patterns. This is first illustrated with polycrystalline Ti–10Al–25Nb with an on-axis transmission Kikuchi diffraction set-up in a scanning electron microscope. It is then shown via a Monte Carlo simulation and a large-angle convergent-beam electron diffraction experiment that this phenomenon finds its origin in the nature of the differential elastic and quasi-elastic cross sections. This phenomenon is then quantified by a careful image analysis of Kikuchi patterns recorded across a vertical interface in a silicon sample specifically designed and fabricated. A Monte Carlo simulation reproducing all the geometric parameters is conducted. Experiments and simulations match very well qualitatively, but with a slight quantitativity gap. The specificity of the thermal diffuse scattering cross-section, not available in the simulation, is thought to be responsible for this gap. Beside Kikuchi diffraction, the case of diffraction spots and diffuse background present in the pattern is also discussed.

Sign in / Sign up

Export Citation Format

Share Document