scholarly journals Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers

2007 ◽  
Vol 90 (8) ◽  
pp. 083111 ◽  
Author(s):  
Makoto Suzuki ◽  
Toshishige Yamada ◽  
Cary Y. Yang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Carbon Nanofibers ◽  
Bright Contrast ◽  
Scanning Electron

Bright Contrast Imaging of Carbon Nanofiber-Substrate Interface using Scanning Electron Microscopy

2006 ◽  
Vol 963 ◽  
Author(s):  
Makoto Suzuki ◽  
Yusuke Ominami ◽  
Quoc Ngo ◽  
Toshishige Yamada ◽  
Bill Roth ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Beam ◽  
Carbon Nanofiber ◽  
Contrast Imaging ◽  
Bright Contrast ◽  
Gap Height ◽  
Scanning Electron

ABSTRACTScanning electron microscopy (SEM) for imaging the interface between carbon nanofibers (CNFs) and the underlying substrate is presented. By irradiating the electron beam perpendicular to the substrate, bright contrast is observed at the region where a small gap exists between the CNF and substrate. The energy-diameter diagram for the observation of the bright contrast is derived, which can be understood by using the theory of electron penetration into solid. Monte Carlo simulation is performed to reproduce the experimental observation based on our model, and the contrast sensitivity to the gap height is discussed.

Microanalysis Techniques for the Investigation of Interphases Formed between Thermoset and Thermoplastic Polymers: Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis

2011 ◽  
Vol 471-472 ◽  
pp. 309-314 ◽  
Author(s):  
Michael T. Heitzmann ◽  
Meng Hou ◽  
Martin Veidt ◽  
Rowan Paton ◽  
Ron Rasch
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Spatial Resolution ◽  
Energy Dispersive ◽  
Polymer Interfaces ◽  
X Ray ◽  
Acceleration Voltage ◽  
Scanning Electron

Prepreg resin systems are typically of complex composition and require very specific manufacturing conditions. These characteristics restrict the use of some commonly used micro analysis techniques. This paper investigates the use of low acceleration voltage scanning electron microscopy and energy dispersive x-ray analysis for the characterization of diffused polymer interfaces. It is shown that, by operating at the dynamic charge balance, high resolution secondary electron images of polymer interfaces can be obtained and that conductive coating is not required. In addition, the effect of acceleration voltage on the interaction volume in EDX analysis is discussed using Monte Carlo simulation. X-ray intensity measurements in combination with afore mentioned Monte Carlo simulation is used to define practically obtainable spatial resolution limits. It is shown that by reducing the acceleration voltage below 5kV spatial resolution higher the 500nm can be obtained.

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