scholarly journals Synchronous Vapor-Phase Coating of Conducting Polymers for Flexible Optoelectronic Applications

10.5772/16028 ◽  
2011 ◽  
Author(s):  
Keon-Soo Jang ◽  
Jae-Do Nam
Keyword(s):  
Conducting Polymers ◽  
Vapor Phase ◽  
Phase Coating ◽  
Optoelectronic Applications

Vapor Phase Selective Growth of Two-Dimensional Perovskite/WS2 Heterostructures for Optoelectronic Applications

2019 ◽  
Vol 11 (43) ◽  
pp. 40503-40511 ◽  
Author(s):  
Ufuk Erkılıç ◽  
Pablo Solís-Fernández ◽  
Hyun Goo Ji ◽  
Keisuke Shinokita ◽  
Yung-Chang Lin ◽  
...  
Keyword(s):  
Vapor Phase ◽  
Selective Growth ◽  
Two Dimensional ◽  
Optoelectronic Applications

Remote vapor phase processing of organic semiconductors for optoelectronic applications

2001 ◽  
Author(s):  
Sumant Padiyar ◽  
Li Chen ◽  
Harry Efsthadiatis ◽  
Robert E. Geer
Keyword(s):  
Organic Semiconductors ◽  
Vapor Phase ◽  
Optoelectronic Applications

scholarly journals Evidence for ‘bottom up’ growth during vapor phase polymerization of conducting polymers

Polymer ◽  
2014 ◽  
Vol 55 (16) ◽  
pp. 3458-3460 ◽  
Author(s):  
Robert Brooke ◽  
Manrico Fabretto ◽  
Pejman Hojati-Talemi ◽  
Peter Murphy ◽  
Drew Evans
Keyword(s):  
Conducting Polymers ◽  
Vapor Phase ◽  
Bottom Up ◽  
Vapor Phase Polymerization

Vapor-Phase Incommensurate Heteroepitaxy of Oriented Single-Crystal CsPbBr3 on GaN: Toward Integrated Optoelectronic Applications

ACS Nano ◽  
2019 ◽  
Vol 13 (9) ◽  
pp. 10085-10094 ◽  
Author(s):  
Liyun Zhao ◽  
Yan Gao ◽  
Man Su ◽  
Qiuyu Shang ◽  
Zhen Liu ◽  
...  
Keyword(s):  
Single Crystal ◽  
Vapor Phase ◽  
Optoelectronic Applications ◽  
Oriented Single Crystal

scholarly journals SCIP: a new simultaneous vapor phase coating and infiltration process for tougher and UV-resistant polymer fibers

RSC Advances ◽  
2020 ◽  
Vol 10 (27) ◽  
pp. 15976-15982 ◽  
Author(s):  
Itxasne Azpitarte ◽  
Gabriele A. Botta ◽  
Christopher Tollan ◽  
Mato Knez
Keyword(s):  
Vapor Phase ◽  
Inorganic Materials ◽  
Polymer Fibers ◽  
Infiltration Process ◽  
Phase Coating

Simultaneous coating and infiltration of Kevlar fibers with two different inorganic materials significantly improves the modulus of toughness of the polymer and provides protection against UV-induced degradation.

Surface smoothness and conductivity control of vapor-phase polymerized poly(3,4-ethylenedioxythiophene) thin coating for flexible optoelectronic applications

2008 ◽  
Vol 516 (18) ◽  
pp. 6020-6027 ◽  
Author(s):  
Thuy Le Truong ◽  
Dong-Ouk Kim ◽  
Youngkwan Lee ◽  
Tae-Woo Lee ◽  
Jong Jin Park ◽  
...  
Keyword(s):  
Vapor Phase ◽  
Thin Coating ◽  
Surface Smoothness ◽  
Optoelectronic Applications

Planar defects in ordered (Ga,In)P

1988 ◽  
Vol 46 ◽  
pp. 902-903
Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy
Keyword(s):  
Electron Diffraction ◽  
Vapor Phase ◽  
Growth Direction ◽  
High Density ◽  
Ordered Structure ◽  
Planar Defects ◽  
Diffraction Patterns ◽  
Ternary Semiconductors ◽  
Anion Species ◽  
Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

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