scholarly journals SCIP: a new simultaneous vapor phase coating and infiltration process for tougher and UV-resistant polymer fibers

RSC Advances ◽  
2020 ◽  
Vol 10 (27) ◽  
pp. 15976-15982 ◽  
Author(s):  
Itxasne Azpitarte ◽  
Gabriele A. Botta ◽  
Christopher Tollan ◽  
Mato Knez
Keyword(s):  
Vapor Phase ◽  
Inorganic Materials ◽  
Polymer Fibers ◽  
Infiltration Process ◽  
Phase Coating

Simultaneous coating and infiltration of Kevlar fibers with two different inorganic materials significantly improves the modulus of toughness of the polymer and provides protection against UV-induced degradation.

scholarly journals Dimensional crossover of heat conduction in amorphous polyimide nanofibers

2018 ◽  
Vol 5 (4) ◽  
pp. 500-506 ◽  
Author(s):  
Lan Dong ◽  
Qing Xi ◽  
Dongsheng Chen ◽  
Jie Guo ◽  
Tsuneyoshi Nakayama ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Heat Conduction ◽  
Amorphous Polymers ◽  
Inorganic Materials ◽  
Three Dimensions ◽  
Polymer Fibers ◽  
One Dimension ◽  
Upper Limit ◽  
Conduction Behavior ◽  
Random Walk Theory

ABSTRACT The mechanism of thermal conductivity in amorphous polymers, especially polymer fibers, is unclear in comparison with that in inorganic materials. Here, we report the observation of a crossover of heat conduction behavior from three dimensions to quasi-one dimension in polyimide nanofibers at a given temperature. A theoretical model based on the random walk theory has been proposed to quantitatively describe the interplay between the inter-chain hopping and the intra-chain hopping in nanofibers. This model explains well the diameter dependence of thermal conductivity and also speculates on the upper limit of thermal conductivity of amorphous polymers in the quasi-1D limit.

scholarly journals Analysing trimethylaluminum infiltration into polymer brushes using a scalable area selective vapor phase process

2021 ◽  
Author(s):  
M. Snelgrove ◽  
C. McFeely ◽  
K. Shiel ◽  
G. Hughes ◽  
P. Yadav ◽  
...  
Keyword(s):  
Vapor Phase ◽  
Polymer Brushes ◽  
Polymer Brush ◽  
Critical Factors ◽  
Infiltration Process ◽  
Phase Process

This work identifies the critical factors when developing a polymer brush vapor phase infiltration process, while also demonstrating the use of novel pyridines for area selective purposes.

Planar defects in ordered (Ga,In)P

1988 ◽  
Vol 46 ◽  
pp. 902-903
Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy
Keyword(s):  
Electron Diffraction ◽  
Vapor Phase ◽  
Growth Direction ◽  
High Density ◽  
Ordered Structure ◽  
Planar Defects ◽  
Diffraction Patterns ◽  
Ternary Semiconductors ◽  
Anion Species ◽  
Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

Limits for high-resolution electron microscopy of inorganic materials?

1987 ◽  
Vol 45 ◽  
pp. 4-5
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Inorganic Materials ◽  
Atomic Scale ◽  
Resolution Limit ◽  
Contrast Transfer Function ◽  
Existing Problems ◽  
Resolution Electron ◽  
Electron Microscopes

The era of atomic-resolution electron microscopy has finally arrived. In virtually all inorganic materials, including oxides, metals, semiconductors and ceramics, it is possible to image individual atomic columns in low-index zone-axis projections. A whole host of important materials’ problems involving defects and departures from nonstoichiometry on the atomic scale are waiting to be tackled by the new generation of intermediate voltage (300-400keV) electron microscopes. In this review, some existing problems and limitations associated with imaging inorganic materials are briefly discussed. The more immediate problems encountered with organic and biological materials are considered elsewhere.Microscope resolution. It is less than a decade since the state-of-the-art, commercially available TEM was a 200kV instrument with a spherical aberration coefficient of 1.2mm, and an interpretable resolution limit (ie. first zero crossover of the contrast transfer function) of 2.5A.

Polarized microbeam FT-IR analysis of single fibers

1996 ◽  
Vol 54 ◽  
pp. 206-207
Author(s):  
Liling Cho ◽  
David L. Wetzel
Keyword(s):  
Molecular Orientation ◽  
Transition Point ◽  
Polymer Fibers ◽  
Single Fiber ◽  
Wire Grid ◽  
Polyester Fibers ◽  
Ft Ir ◽  
Ir Analysis ◽  
The Relationship ◽  
Wire Grid Polarizer

Polarized infrared microscopy has been used for forensic purposes to differentiate among polymer fibers. Dichroism can be used to compare and discriminate between different polyester fibers, including those composed of polyethylene terephthalate that are frequently encountered during criminal casework. In the fiber manufacturering process, fibers are drawn to develop molecular orientation and crystallinity. Macromolecular chains are oriented with respect to the long axis of the fiber. It is desirable to determine the relationship between the molecular orientation and stretching properties. This is particularly useful on a single fiber basis. Polarized spectroscopic differences observed from a single fiber are proposed to reveal the extent of molecular orientation within that single fiber. In the work presented, we compared the dichroic ratio between unstretched and stretched polyester fibers, and the transition point between the two forms of the same fiber. These techniques were applied to different polyester fibers. A fiber stretching device was fabricated for use on the instrument (IRμs, Spectra-Tech) stage. Tension was applied with a micrometer screw until a “neck” was produced in the stretched fiber. Spectra were obtained from an area of 24×48 μm. A wire-grid polarizer was used between the source and the sample.

Scanning tunneling microscopy (STM) of DNA and RNA

1989 ◽  
Vol 47 ◽  
pp. 34-35
Author(s):  
Patricia G. Arscott ◽  
Gil Lee ◽  
Victor A. Bloomfield ◽  
D. Fennell Evans
Keyword(s):  
Molecular Structures ◽  
Inorganic Materials ◽  
Resolving Power ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Form And Function ◽  
Dna And Rna ◽  
Calf Thymus ◽  
And Function ◽  
The Relationship

STM is one of the most promising techniques available for visualizing the fine details of biomolecular structure. It has been used to map the surface topography of inorganic materials in atomic dimensions, and thus has the resolving power not only to determine the conformation of small molecules but to distinguish site-specific features within a molecule. That level of detail is of critical importance in understanding the relationship between form and function in biological systems. The size, shape, and accessibility of molecular structures can be determined much more accurately by STM than by electron microscopy since no staining, shadowing or labeling with heavy metals is required, and there is no exposure to damaging radiation by electrons. Crystallography and most other physical techniques do not give information about individual molecules.We have obtained striking images of DNA and RNA, using calf thymus DNA and two synthetic polynucleotides, poly(dG-me5dC)·poly(dG-me5dC) and poly(rA)·poly(rU).

Shot-noise simulations of HREM images of polymer crystals

1989 ◽  
Vol 47 ◽  
pp. 342-343
Author(s):  
Philippe Pradère ◽  
Edwin L. Thomas
Keyword(s):  
Low Dose ◽  
Molecular Level ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
Inorganic Materials ◽  
Photographic Emulsion ◽  
Polymer Crystals ◽  
Resolution Electron ◽  
Recent Developments ◽  
Lattice Images

High Resolution Electron Microscopy (HREM) is a very powerful technique for the study of crystal defects at the molecular level. Unfortunately polymer crystals are beam sensitive and are destroyed almost instantly under the typical HREM imaging conditions used for inorganic materials. Recent developments of low dose imaging at low magnification have nevertheless permitted the attainment of lattice images of very radiation sensitive polymers such as poly-4-methylpentene-1 and enabled molecular level studies of crystal defects in somewhat more resistant ones such as polyparaxylylene (PPX) [2].With low dose conditions the images obtained are very noisy. Noise arises from the support film, photographic emulsion granularity and in particular, the statistical distribution of electrons at the typical doses of only few electrons per unit resolution area. Figure 1 shows the shapes of electron distribution, according to the Poisson formula :

A Super-High-Resolution HVEM (H-1500) Newly Installed in NIRIM

1990 ◽  
Vol 48 (1) ◽  
pp. 142-143
Author(s):  
S. Horiuchi ◽  
Y. Matsui
Keyword(s):  
Magnetic Field ◽  
High Resolution ◽  
Chromatic Aberration ◽  
Inorganic Materials ◽  
Electron Gun ◽  
Resolving Power ◽  
National Budget ◽  
Voltage Electron ◽  
Specimen Holder ◽  
The Magnetic Field

A new high-voltage electron microscope (H-1500) specially aiming at super-high-resolution (1.0 Å point-to-point resolution) is now installed in National Institute for Research in Inorganic Materials ( NIRIM ), in collaboration with Hitachi Ltd. The national budget of about 1 billion yen including that for a new building has been spent for the construction in the last two years (1988-1989). Here we introduce some essential characteristics of the microscope.(1) According to the analysis on the magnetic field in an electron lens, based on the finite-element-method, the spherical as well as chromatic aberration coefficients ( Cs and Cc ). which enables us to reach the resolving power of 1.0Å. have been estimated as a function of the accelerating As a result of the calculaton. it was noted that more than 1250 kV is needed even when we apply the highest level of the technology and materials available at present. On the other hand, we must consider the protection against the leakage of X-ray. We have then decided to set the conventional accelerating voltage at 1300 kV. However. the maximum accessible voltage is 1500 kV, which is practically important to realize higher voltage stabillity. At 1300 kV it is expected that Cs= 1.7 mm and Cc=3.4 mm with the attachment of the specimen holder, which tilts bi-axially in an angle of 35° ( Fig.1 ). In order to minimize the value of Cc a small tank is additionally placed inside the generator tank, which must serve to seal the magnetic field around the acceleration tube. An electron gun with LaB6 tip is used.

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