scholarly journals In-depth component distribution in electrodeposited alloys and multilayers

2018 ◽  
Vol 8 (1) ◽  
pp. 49-71
Author(s):  
László Péter ◽  
Kálmán Vad ◽  
Attila Csik ◽  
Rocío Muñíz ◽  
Lara Lobo ◽  
...  
Keyword(s):  
Depth Profile ◽  
Depth Profiling ◽  
Impurity Level ◽  
Gradual Transition ◽  
Side Reactions ◽  
Rotating Disc ◽  
Bulk Analysis ◽  
Component Distribution ◽  
Deposited Metal ◽  
Composition Depth Profile

It is shown in this overview that modern composition depth profiling methods like secondary neutral mass spectroscopy (SNMS) and glow-discharge – time-of-flight mass spectrometry (GD-ToFMS) can be used to gain highly specific composition depth profile information on electrodeposited alloys. In some cases, cross-sectional transmission electron microscopy was also used for gaining complementary information; nevertheless, the basic component distribution derived with each method exhibited the same basic features. When applying the reverse sputtering direction to SNMS analysis, the near-substrate composition evolution can be revealed with unprecedented precision. Results are presented for several specific cases of electrodeposited alloys and mulitlayers. It is shown that upon d.c. plating from an unstirred solution, the preferentially deposited metal accumulates in the near-substrate zone, and the steady-state alloy composition sets in at about 150-200 nm deposit thickness only. If there is more than one preferentially deposited metal in the alloy, the accumulation zones of these metals occur in the order of the deposition preference. This accumulation zone can be eliminated by well-controlled hydrodynamic conditions (like the application of rotating disc electrodes) or by pulse plating where the systematic decrease in the duty cycle provides a gradual transition from a graded to a uniform composition depth profile. The application of composition depth profile measurements enabled detecting the coincidence in the occurrence of some components in the deposits down to the impurity level. This was exemplified by the GD-ToFMS measurements of Ni-Cu/Cu multilayers where all detected impurities accumulated in the Cu layer. The wealth of information obtained by these methods provides a much more detailed picture than the results normally obtained with bulk analysis through conventional integral depth profiling and help in the elucidation of the side reactions taking place during the plating processes.

Light Impurity Depth Profiling in the Nuclear Reaction AnalysiS

1993 ◽  
Vol 316 ◽  
Author(s):  
Oleg I. Zabashta ◽  
A.I. Kul'ment'ev ◽  
V.E. Storizko
Keyword(s):  
Nuclear Reaction ◽  
Depth Profile ◽  
General Problem ◽  
Depth Profiling ◽  
Measured Data ◽  
Point Of View ◽  
Nuclear Reaction Analysis ◽  
Incorrect Problem ◽  
Non Destructive ◽  
Non Destructive Techniques

The general problem in the analysis of a sample by non-destructive techniques such as nuclear microanalysis, ellipsometry, etc. is the interpretation of the measured data. The impurity depth profile obtained may noticeable non-physical fluctuations. From the mathematical point of view this could be explain by the fact that while interpreting the results we have to solve an incorrect problem to which routine computational methods are not applicable.

Lithium nanocluster formation in Li+ - ion implanted MgO

2000 ◽  
Vol 647 ◽  
Author(s):  
A. van Veen ◽  
M.A. van Huis ◽  
A.V. Fedorov ◽  
H. Schut ◽  
C.V. Falub ◽  
...  
Keyword(s):  
Depth Profile ◽  
Considerable Increase ◽  
Depth Profiling ◽  
Positron Beam ◽  
Photon Absorption ◽  
Doppler Broadening ◽  
Neutron Depth Profiling ◽  
Metallic Lithium ◽  
Beam Analysis ◽  
Li Ion

AbstractPhoton absorption (PA), Positron Beam Analysis (PBA) and Neutron Depth Profiling (NDP) is applied to study the relation between photon absorption behavior and the precipitates formed by ion implantation and thermal annealing. Monocrystals of MgO(100) were implanted with 1.0×10166Li ions cm−2 at an energy of 30 keV. The samples were thermally annealed in air in steps up to 1200 K. After each step Doppler broadening Positron Beam Analysis (PBA) was applied to monitor the depth profile of the implantation defects. The evolution of the depth profile of lithium was followed with the aid of NDP. During the annealing there is hardly any change in the location of the lithium implantation peak at 150 nm (peak concentration 2 at. %). Only after annealing to 1200 K the majority of the lithium has left the crystal and optical absorption effects have disappeared. During annealing at 750 K an absorption band develops between 400 and 600 nm; at 950 K the maximum absorption is centered at 450 nm corresponding to Mie absorption and scattering by lithium nanoclusters. Positron beam analysis shows a considerable increase of annihilations with low momentum electrons in the implanted zone. A positron method for measuring electron momentum distributions (2D-ACAR) coupled to an intense positron beam gave evidence for the presence of semi-coherent metallic lithium inclusions.

Depth profile analysis with glow discharge spectrometry

2017 ◽  
Vol 32 (5) ◽  
pp. 920-930 ◽  
Author(s):  
Lara Lobo ◽  
Beatriz Fernández ◽  
Rosario Pereiro
Keyword(s):  
Glow Discharge ◽  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profiling ◽  
Depth Profile Analysis ◽  
Compositional Depth Profiling

Glow discharge spectrometry shows excellent capabilities for fast compositional depth profiling of modern and challenging materials.

scholarly journals Quantitative Depth Profiling Using Saturation-Equalized Photoacoustic Spectra

2002 ◽  
Vol 56 (4) ◽  
pp. 409-418 ◽  
Author(s):  
Roger W. Jones ◽  
John F. McClelland
Keyword(s):  
Prior Knowledge ◽  
Depth Profile ◽  
Phase Modulation ◽  
High Speed ◽  
Mathematical Problem ◽  
Depth Profiling ◽  
Low Frequency ◽  
Saturation Level ◽  
Frequency Spectra ◽  
Photoacoustic Spectra

Depth profiling using photoacoustic spectra taken at multiple scanning speeds or modulation frequencies is normally impaired by the increase in spectral saturation that occurs with decreasing speed or frequency. Photothermal depth profiling in general is also impeded by the ill conditioned nature of the mathematical problem of determining a depth profile from photothermal data. This paper describes a method for reducing the saturation level in low-speed or low-frequency spectra to the level at high speed or frequency so that all spectra have the same saturation. The conversion method requires only magnitude spectra, so it is applicable to both conventional and phase-modulation photoacoustic spectra. This paper also demonstrates a method for quantitative depth profiling with these converted spectra that makes use of prior knowledge about the type of profile existing in a sample to reduce the instabilities associated with the mathematically ill conditioned task.

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