Atomic Force Microscopy in Analysis of Rubber Materials

2003 ◽  
Vol 76 (4) ◽  
pp. 846-859 ◽  
Author(s):  
Natalya Yerina ◽  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Processing Conditions ◽  
Electric Force ◽  
Degree Of Cure ◽  
Force Microscopy ◽  
Selective Distribution ◽  
Atomic Force ◽  
The Matrix ◽  
Electric Force Microscopy ◽  
Ratio Of Components

Abstract Atomic force microscopy (AFM) and electric force microscopy (EFM) have been applied for compositional mapping of a number of elastomers and related multicomponent materials. Several aspects of optimizing AFM experiments on polymers are discussed. AFM images revealed changes of EPDM morphology caused by crosslinking and by loading with fillers [carbon black (CB) and silica particles] and oil. It was shown that the morphology of isotactic polypropylene (iPP)/EPDM vulcanizates, which were studied with AFM and EFM, depends on the ratio of components, degree of cure and processing conditions. Diffusion of oil from the elastomer component to the matrix is evidenced in the AFM images. Selective distribution of CB in the iPP matrix is responsible for the electric conductivity of the thermoplastic vulcanizate.

Analysis of Influence of Voltage on Potential Barrier on BiCuVOX and BiTiVOX Ceramics

2013 ◽  
Vol 19 (3) ◽  
pp. 688-692
Author(s):  
S.M. Gheno ◽  
V.L. Pimentel ◽  
M.R. Morelli ◽  
P.I. Paulin Filho
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperatures ◽  
Electric Field Distribution ◽  
Peak Height ◽  
Schottky Barriers ◽  
Electric Force ◽  
Barrier Width ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electric Force Microscopy

AbstractThe BiMeVOx family of compounds appears to be more attractive for applications at low temperatures when ionic conductivity is the determining parameter. The objective of this study was to analysis the influence of voltage of the behavior of the Schottky barrier in both BiCuVOX and BiTiVOX. The samples were analyzed by atomic force microscopy and electric force microscopy (EFM). EFM experiments were conducted to map the electric field distribution on the surface. The formation of Schottky barriers was observed, and their height and width measured. BiCuVOX samples show a barrier width of 140 nm, and BiTiVOX shows a barrier width of 350 nm. The applied voltage has no effect on the barrier width but increases the peak height as observed in the cantilever frequency as measured with the EFM technique.

scholarly journals Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

2012 ◽  
Vol 3 ◽  
pp. 238-248 ◽  
Author(s):  
Joachim Welker ◽  
Esther Illek ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Frequency Modulation ◽  
Matrix Method ◽  
Oscillation Amplitude ◽  
Decay Length ◽  
Amplitude Dependence ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Matrix

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconvolution quality on the oscillation amplitude. The matrix method exhibits spikelike features originating from a numerical artifact. By interpolation of the data, the spikelike features can be circumvented. The Sader–Jarvis method has a continuous amplitude dependence showing two minima and one maximum, which is an inherent property of the deconvolution algorithm. The optimal deconvolution depends on the ratio of the amplitude and the characteristic decay length of the force for the Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality.

Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

2013 ◽  
Vol 1500 ◽  
Author(s):  
Craig Wall ◽  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Photovoltaics ◽  
Nanometer Scale ◽  
Structure Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use ◽  
Structure Property Relationship ◽  
Electric Force Microscopy

ABSTRACTCapabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

Surface morphology of xenon implanted single crystal magnesium oxide observed by Atomic Force Microscopy

1995 ◽  
Vol 53 ◽  
pp. 356-357
Author(s):  
Wenbiao Jiang ◽  
M. Grant Norton ◽  
David B. Poker
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Diffraction ◽  
Noble Gas ◽  
Ceramic Materials ◽  
Metallic Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chemical Effects ◽  
The Matrix ◽  
Implantation Process

The implantation of materials with noble gas ions is of particular interest in studying some of the fundamental aspects of the ion implantation process and resultant phenomena because the noble gas ions are immiscible with the matrix and therefore chemical effects are unlikely. Electron diffraction studies have clearly demonstrated that noble gas ions implantated into either metals or ceramics may coalesce to form inclusions. These inclusions may be either solid or fluid and their formation often results in swelling of the matrix. This swelling can be readily apparent on the surface of metallic materials. However, in ceramic materials the extent of this swelling, particular at low ion fluences, can be very small and hence only detectable with surface sensitive topographic probes such as atomic force microscopy (AFM).Polished (00l)-oriented MgO single crystals were implanted with xenon ions using an accelerating voltage of 200 keV at a range of fluences. The specimens were then examined with AFM. The AFM results showed that, even at the lowest fluence, there was measurable roughening of the surface. At a fluence of 1 × 1017/cm2 small blisters were observed. These blisters have diameters of 0.5 - 0.8 μm and extend to heights of up to 80 nm.

scholarly journals Structural centrosome aberrations promote non-cell-autonomous invasiveness

2017 ◽  
Author(s):  
Olivier Ganier ◽  
Dominik Schnerch ◽  
Philipp Oertle ◽  
Roderick Y. H. Lim ◽  
Marija Plodinec ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Living Cells ◽  
Animal Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Invasive Behavior ◽  
Metastatic Cells ◽  
The Matrix ◽  
Cell Dissemination ◽  
The Impact

AbstractCentrosomes are the main microtubules organizing centers of animal cells. Although centrosome aberrations are common in tumors, their consequences remain subject to debate. Here, we studied the impact of structural centrosome aberrations, induced by deregulated expression of Ninein-like protein (NLP), on epithelial spheres grown in Matrigel matrices. We demonstrate that NLP-induced structural centrosome aberrations trigger the escape (’budding’) of living cells from epithelia. Remarkably, all cells disseminating into the matrix were undergoing mitosis. This invasive behavior reflects a novel mechanism that depends on the acquisition of two distinct properties. First, NLP-induced centrosome aberrations trigger a re-organization of the cytoskeleton, which stabilizes microtubules and weakens E-cadherin junctions during mitosis. Second, atomic force microscopy reveals that cells harboring these centrosome aberrations display increased stiffness. As a consequence, mitotic cells are pushed out of mosaic epithelia, particularly if they lack centrosome aberrations. We conclude that centrosome aberrations can trigger cell dissemination through a novel, non-cell autonomous mechanism, raising the prospect that centrosome aberrations contribute to the dissemination of metastatic cells harboring normal centrosomes.

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