scholarly journals Energy Level Spectroscopy of Individual Quantum Dots by Electric Force Detection with Atomic force Microscopy

2018 ◽  
Vol 61 (10) ◽  
pp. 645-650
Author(s):  
Yoichi MIYAHARA
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Energy Level ◽  
Electric Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

scholarly journals Different directional energy dissipation of heterogeneous polymers in bimodal atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (47) ◽  
pp. 27464-27474 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dynamic Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Powerful Technique ◽  
Atomic Force ◽  
Nanoscale Imaging ◽  
Heterogeneous Polymers

Dynamic force microscopy (DFM) has become a multifunctional and powerful technique for the study of the micro–nanoscale imaging and force detection, especially in the compositional and nanomechanical properties of polymers.

Atomic Force Microscopy Studies of DNA-Wrapped Carbon Nanotube Structure and Binding to Quantum Dots

2008 ◽  
Vol 130 (32) ◽  
pp. 10648-10655 ◽  
Author(s):  
Jennifer F. Campbell ◽  
Ingrid Tessmer ◽  
H. Holden Thorp ◽  
Dorothy A. Erie
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy of InAs quantum dots on the vicinal surface of a GaAs crystal

2002 ◽  
Vol 28 (2) ◽  
pp. 139-141
Author(s):  
V. P. Evtikhiev ◽  
O. V. Konstantinov ◽  
E. Yu. Kotel’nikov ◽  
A. V. Matveentsev ◽  
A. N. Titkov ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Vicinal Surface ◽  
Gaas Crystal ◽  
Inas Quantum Dots ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

1999 ◽  
Vol 38 (Part 1, No. 6B) ◽  
pp. 3958-3961 ◽  
Author(s):  
Masami Kageshima ◽  
Hisato Ogiso ◽  
Shizuka Nakano ◽  
Mark A. Lantz ◽  
Hiroshi Tokumoto
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Atomic Force
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