scholarly journals Calibration-measurement unit for the automation of vector network analyzer measurements

2008 ◽  
Vol 6 ◽  
pp. 27-30
Author(s):  
I. Rolfes ◽  
B. Will ◽  
B. Schiek
Keyword(s):  
Vector Network Analyzer ◽  
Measurement Unit ◽  
Network Analyzer ◽  
Scattering Parameters ◽  
Calibration Standards ◽  
Calibration Measurement ◽  
Vector Network Analyzers ◽  
Network Analyzers ◽  
The One ◽  
User Friendly

Abstract. With the availability of multi-port vector network analyzers, the need for automated, calibrated measurement facilities increases. In this contribution, a calibration-measurement unit is presented which realizes a repeatable automated calibration of the measurement setup as well as a user-friendly measurement of the device under test (DUT). In difference to commercially available calibration units, which are connected to the ports of the vector network analyzer preceding a measurement and which are then removed so that the DUT can be connected, the presented calibration-measurement unit is permanently connected to the ports of the VNA for the calibration as well as for the measurement of the DUT. This helps to simplify the calibrated measurement of complex scattering parameters. Moreover, a full integration of the calibration unit into the analyzer setup becomes possible. The calibration-measurement unit is based on a multiport switch setup of e.g. electromechanical relays. Under the assumption of symmetry of a switch, on the one hand the unit realizes the connection of calibration standards like one-port reflection standards and two-port through connections between different ports and on the other hand it enables the connection of the DUT. The calibration-measurement unit is applicable for two-port VNAs as well as for multiport VNAs. For the calibration of the unit, methods with completely known calibration standards like SOLT (short, open, load, through) as well as self-calibration procedures like TMR or TLR can be applied.

scholarly journals Calibration of vector network analyzers on the basis of the LRR-method

2003 ◽  
Vol 1 ◽  
pp. 21-25 ◽  
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Vector Network Analyzer ◽  
The Self ◽  
The Other ◽  
Network Analyzer ◽  
Calibration Standards ◽  
Self Calibration ◽  
Vector Network Analyzers ◽  
Network Analyzers ◽  
Line Standard

Abstract. The LRR method for the calibration of vector network analyzers is presented. This method belongs to the self calibration procedures where the calibration circuits might be partly unknown. The LRR calibration circuits are all of equal mechanical length in contrast to the well known TRL calibration, which needs a line-standard with a different length than the other calibration standards. For the LRR method it is thus not necessary to displace the connectors of the vector network analyzer during calibration in order to contact the calibration structures. The calibration circuits mainly consist of reflective networks that have to be placed at three consecutive positions. As the algorithm accounts for different distances between the reflective networks, the circuits are easy to realize. The robust functionality of the LRR method is confirmed by measurements.

scholarly journals Automated Measuring Complex for the Research of the Frequency Characteristics of Microwave Filters in a Wide Range of Frequencies

2019 ◽  
pp. 765-772
Author(s):  
Andrey B. Gladyshev ◽  
Dmitry D. Dmitriev ◽  
Peter Yu. Zverev ◽  
Ivan A. Smolev
Keyword(s):  
Frequency Characteristics ◽  
Signal Generator ◽  
Spectrum Analyzer ◽  
Vector Network Analyzer ◽  
Microwave Filters ◽  
Output Power Level ◽  
Network Analyzer ◽  
Measuring Complex ◽  
Vector Network Analyzers ◽  
Network Analyzers

The article proposes a variant of an automated measuring complex designed to study the frequency characteristics of microwave filters. When developing microwave filters, it is necessary to control their frequency parameters, for which standard instruments are used – vector network analyzers. However, new technologies for manufacturing microwave filters, aimed at improving the frequency-selective characteristics and miniaturizing the design, do not allow for comprehensive studies using only one vector network analyzer. This is mainly due to the insufficient dynamic range of the vector network analyzers, which does not allow for a qualitative measurement of such parameters as attenuation in the filter barrier bands. This problem can be easily solved using a signal generator with an increased output power level and a spectrum analyzer. For a comprehensive study of the characteristics of microwave filters, a combination of methods for measuring the parameters of microwave filters is proposed, where the main characteristics will be measured in the passband using a vector network analyzer and the parameters of the obstacle bands using a signal generator and spectrum analyzer. By connecting devices into a network under the control of special software, we obtain a flexible and convenient system for automated research of the characteristics of microwave filters

scholarly journals Uncertainty of VNA S-parameter measurement due to non-ideal TMSO or LMSO calibration standards

2003 ◽  
Vol 1 ◽  
pp. 1-8 ◽  
Author(s):  
U. Stumper
Keyword(s):  
Reflection Coefficients ◽  
Calibration Standards ◽  
S Parameter ◽  
S Parameters ◽  
Vector Network Analyzers ◽  
Network Analyzers ◽  
Error Terms ◽  
The One ◽  
Test Objects ◽  
Transmission Phase

Abstract. For the widespread 12-term TMSO and LMSO calibration of 4-sampler vector network analyzers (VNA), the sensitivity coefficients of the S-parameters of two-ports are developed as functions of the deviations of the reflection coefficients of the one-port calibration standards and of an imperfect through or line connection. Expressions representing the deviations of the S-parameters with respect to the error terms and for the deviations of the error terms with respect to the non-ideal calibration standards are also given. It is shown that the deviations of the S-parameters become quite large particularly for high-reflective two-port test objects. If applying a broadband load (instead of using the time consuming “ideal" sliding load routine) and the VNA-internal firmware-operated calibration and evaluation routines where the reflection coefficient is set to zero, deviations may appear of some 0,1 dB for the attenuation and some degrees of the transmission phase angle.

Accuracy Improvement for Scattering-Parameters Evaluating of Microwave Coplanar Probe Using One-Port Two-Tier Multi-TRL Calibration Method

2013 ◽  
Vol 333-335 ◽  
pp. 254-258 ◽  
Author(s):  
Hui Huang ◽  
Xin Meng Liu ◽  
Xin Lv
Keyword(s):  
Calibration Method ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Random Errors ◽  
Scattering Parameters ◽  
Accuracy Improvement ◽  
S Parameters ◽  
Improving Accuracy ◽  
System Errors ◽  
Residual Errors

This paper presents a method improving accuracy for evaluating S-parameters (Scattering-parameters) of MCP (Microwave Coplanar Probe). This method may be named one-port two-tier Multi-TRL (Thru-Reflect-Line) calibration method. It measures two-port devices only at one port of VNA (Vector Network Analyzer). It decreases the random errors caused of cable movements and connecting times. This method is implemented with coaxial OSL (Open-Short-Load) and on-wafer TRL calibration kit. It directly calculates and removes the residual errors caused of coaxial OSL calibration kit imperfection. It significantly reduced system errors by using on-wafer TRL calibration kit. To verify the effectiveness of the proposed method, the measured S-parameters up to 50GHz of MCP configured with GSG-100 are given and discussed.

scholarly journals Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

2007 ◽  
Vol 5 ◽  
pp. 439-445 ◽  
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Error Correction ◽  
Measurement System ◽  
Systematic Errors ◽  
Microwave Circuits ◽  
Calibration Procedure ◽  
Vector Network Analyzer ◽  
Switching Network ◽  
Network Analyzer ◽  
Scattering Parameters

Abstract. In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected to the analyzer ports at a time, the remaining device ports have to be terminated by external reflections. In order to measure the scattering parameters of the DUT without the influence of systematic errors and of the external terminations, an error correction has to be performed besides the calibration. For this purpose, the application of the multi-port procedure is presented. This method has the advantage, that the external reflective terminations can be chosen arbitrarily. Furthermore, these terminations can be unknown except for one. An automatized measurement system based on a switching network is shown, which is optimized for the measurement of planar microwave circuits. An error model for the description of the measurement setup as well as a calibration procedure for the elimination of the systematic errors are presented.

scholarly journals An Error Correction Procedure for Multi-Port Measurements at High Frequencies

2005 ◽  
Vol 3 ◽  
pp. 59-64
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Error Correction ◽  
Short Circuit ◽  
Correction Method ◽  
Frequency Characteristics ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Correction Procedure ◽  
Scattering Parameters ◽  
High Frequencies ◽  
Port Device

Abstract. The multi-port method for the measurement of the scattering parameters of multi-ports with the help of a vector network analyzer (VNA) with only two measurement ports is presented. For the measurements only two ports of the N-port device can be connected to the two ports of the VNA at a time. The remaining N-2 ports of the device under test (DUT) are connected to external terminations. As these external terminations might be mismatched, the measured scattering parameters depend on the reflective characteristics of the terminations. An error correction becomes necessary in order to calculate the effective scattering parameters of the DUT (Tippet and Speciale, 1982; Lu and Chu, 2003). In contrast to the correction method of Tippet and Speciale (1982), the multi-port method has the advantage, that the external terminations can be chosen arbitrarily. Thus, a realization as an open or short circuit is possible as well. Furthermore, the terminations can be unknown except for one, similar to self-calibration procedures of VNAs. This helps to improve the accuracy of the measurements, because the inconsistency problem due to a slightly erroneous knowledge of the frequency characteristics of the terminations can be eliminated.

scholarly journals A 10 kHz to 6 GHz Low-Cost Vector Network Analyzer

2021 ◽  
Vol 19 ◽  
pp. 17-22
Author(s):  
Andreas Depold ◽  
Stefan Erhardt ◽  
Robert Weigel ◽  
Fabian Lurz
Keyword(s):  
Dynamic Range ◽  
Low Cost ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Frequency Range ◽  
Network Analyzers ◽  
Commercial Off The Shelf ◽  
Large Frequency ◽  
Cost Vector

Abstract. This publication introduces a low-cost vector network analyzer with very large frequency range made of commercial off-the-shelf components. It utilizes two identical receivers and two directional bridges to allow for two fully bidirectional measurement ports. The design surpasses the performance of competing low-cost network analyzers in regards of dynamic range, frequency span and calibration capability.

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