scholarly journals Influence of Extended Bias Stress on the Electrical Parameters of Mixed Oxide Thin Film Transistors

2012 ◽  
Vol 03 (04) ◽  
pp. 295-299 ◽  
Author(s):  
Winnie P. Mathews ◽  
Rajitha N. P. Vemuri ◽  
Terry L. Alford
Keyword(s):  
Thin Film ◽  
Mixed Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Electrical Parameters ◽  
Bias Stress

Mixed Oxide Thin Film Transistors under Combinatory Optical Irradiation and Electrical Bias

2013 ◽  
Vol 50 (8) ◽  
pp. 179-184
Author(s):  
T. L. Alford ◽  
R. N. P. Vemuri ◽  
W. P. Mathews
Keyword(s):  
Thin Film ◽  
Mixed Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Optical Irradiation ◽  
Electrical Bias

Modeling the behavior of amorphous oxide thin film transistors before and after bias stress

2012 ◽  
Vol 52 (11) ◽  
pp. 2532-2536 ◽  
Author(s):  
A. Cerdeira ◽  
M. Estrada ◽  
B.S. Soto-Cruz ◽  
B. Iñiguez
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Amorphous Oxide ◽  
Bias Stress ◽  
Before And After
Sign in / Sign up

Export Citation Format

Share Document