Wafer Level Packaging of Compound Semiconductors

2010 ◽  
Vol 7 (3) ◽  
pp. 152-159
Author(s):  
Andrew Strandjord ◽  
Thorsten Teutsch ◽  
Axel Scheffler ◽  
Bernd Otto ◽  
Anna Paat ◽  
...  

The microelectronics industry has implemented a number of different wafer level packaging (WLP) technologies for high volume manufacturing, including: UBM deposition, solder bumping, wafer thinning, and dicing. These technologies were successfully developed and implemented at a number of contract manufacturing companies, and then licensed to many of the semiconductor manufacturers and foundries. The largest production volumes for these technologies are for silicon-based semiconductors. Continuous improvements and modifications to these WLP processes have made them compatible with the changes observed over the years in silicon semiconductor technologies. These industry changes include: the move from aluminum to copper interconnect metallurgy, increases in wafer size, decreases in pad pitch, and the use of Low-K dielectrics. In contrast, the direct transfer of these WLP technologies to compound semiconductor devices, like GaAs, SiC, InP, GaN, and sapphire; has been limited due to a number of technical compatibility issues, several perceived compatibility issues, and some business concerns From a technical standpoint, many compound semiconductor devices contain fragile air bridges, gold bond pads, topographical cavities and trenches, and have a number of unique bulk material properties which are sensitive to the mechanical and chemical processes associated with the standard WLP operations used for silicon wafers. In addition, most of the newer contract manufacturing companies and foundries have implemented mostly 200 and 300 mm wafer capabilities into their facilities. This limits the number of places that one can outsource the processing of 100 and 150 mm compound semiconductor wafers. Companies that are processing large numbers of silicon based semiconductor wafers at their facilities are reluctant to process many of these compound semiconductors because there is a perceived risk of cross contamination between the different wafer materials. Companies are not willing to risk their current business of processing silicon wafers by introducing these new materials into existing process flows. From a business perspective, many companies are reluctant to take the liability risks associated with some of the very high-value compound semiconductors. In addition, the volumes for many of the compound semiconductor devices are very small compared with silicon based devices, thus making it hard to justify interruption in the silicon wafer flows to accommodate these lower volume products. In spite of these issues and perceptions, the markets for compound semiconductors are expanding. Several high profile examples include the increasing number of frequency and power management devices going into cell phones, light emitting diodes, and solar cells The strategy for the work described in this paper is to protect all structures and surfaces with either a spin-on resist or a laminated film during each step in the process flow. These layers will protect the wafer from mechanical and chemical damage, and at the same time protect the fab from contamination by the compound semiconductor.

2008 ◽  
Vol 1068 ◽  
Author(s):  
Kenneth Elliott ◽  
Pamela Patterson ◽  
James C. Li ◽  
Yakov Royter ◽  
Tahir Hussain

ABSTRACTIn the COSMOS program, HRL Laboratories, LLC. is developing technology for intimate integration of CMOS devices with 400 GHz InP HBTs to form complex integrated circuits. This research is investigating innovative approaches to the transistor-scale integration of compound semiconductor and silicon-based transistors so as to enable revolutionary advances in science, devices, circuits, and systems.


2010 ◽  
Vol 2010 (DPC) ◽  
pp. 002225-002248
Author(s):  
Andrew Strandjord ◽  
Thorsten Teutsch ◽  
Axel Scheffler ◽  
Bernd Otto ◽  
Jing Li

There are a number of qualified technologies for backend processing of traditional silicon based semiconductors. GaAs wafers have several unique properties that make these established technologies inadequate, including: the presence of air bridges, gold bond pads, and the bulk material properties of the GaAs. In this paper, we describe a process flow and a set of materials which enable the pad resurfacing, UBM deposition, and solder bumping of GaAs wafers. The gold bond pads are resurfaced using a resist liftoff technology and TiCu sputtering. The combination of these allows for pad resurfacing while protecting the air bridges and GaAs. The UBM is deposited on these new TiCu pads by using a thin film layer to again protect the air bridges and GaAs, followed by electrolessly plating nickel and gold. The solder bumping is accomplished using a laser based sphere drop process which is fluxless. To complete the backend processing, the bumped GaAs wafers are then diced and sorted into waffle packs. Details will be discussed relative to the processing conditions, materials used, and yields.


2010 ◽  
Vol 2010 (DPC) ◽  
pp. 001137-001176
Author(s):  
Jeff Perkins

If LED lighting is to fulfill the promise it holds across all lighting segments, costs need to drop significantly and production volumes will need to double several times over in the coming years. To achieve both, cost improvements must happen at every level of manufacturing and manufacturing processes must evolve. When talking about LED device costs today, packaging holds the greatest cost saving opportunities. As with many semiconductor devices and for LED devices in particular, wafer level packaging will be a key cost saving move for the future. Much needs to be done and much is being done - this talk will take a look at the full spectrum of developments to bring LED into mainstream lighting applications.


2012 ◽  
Vol 132 (8) ◽  
pp. 246-253 ◽  
Author(s):  
Mamoru Mohri ◽  
Masayoshi Esashi ◽  
Shuji Tanaka

Author(s):  
A. Orozco ◽  
N.E. Gagliolo ◽  
C. Rowlett ◽  
E. Wong ◽  
A. Moghe ◽  
...  

Abstract The need to increase transistor packing density beyond Moore's Law and the need for expanding functionality, realestate management and faster connections has pushed the industry to develop complex 3D package technology which includes System-in-Package (SiP), wafer-level packaging, through-silicon-vias (TSV), stacked-die and flex packages. These stacks of microchips, metal layers and transistors have caused major challenges for existing Fault Isolation (FI) techniques and require novel non-destructive, true 3D Failure Localization techniques. We describe in this paper innovations in Magnetic Field Imaging for FI that allow current 3D mapping and extraction of geometrical information about current location for non-destructive fault isolation at every chip level in a 3D stack.


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