Automatic determination of optimal endpoint of 1st carbonatation – factory trials

2017 ◽  
pp. 92-95
Author(s):  
Aliye Ylmaz ◽  
Mürsel Yurtseven

The objective of this paper is to determine the applicability of automatic control of the optimal point in 1st carbonatation of juice purification in a beet sugar factory. To realize the automated determination, a pilot carbonatation tank was constructed and installed in the bypass of the industrial production. Automatic stepwise carbonatation was applied to the circulation juice of the 1st carbonatation. pH value measurement started at a pH value of the circulation juice of approximately 12, and carbonatation gas was injected until the pH reached 10.7 in 0.1–0.2 pH units per step by means of an automatic control system. After every pH step, juice was left to settle for 4min. At the end of this clarification time, turbidity measurement was done. In total carbonatation, sedimentation and turbidity measurement take approximately 45–50min. When the period was completed, the tank was discharged and automatically washed out by extraction feed water. Data obtained at the end of the period were recorded and displayed on a personal computer. The computer software prepared for this system compares all the turbidity values, chooses the lowest one and designates the corresponding pH value at that turbidity as the optimal pH.

2011 ◽  
pp. 289-295 ◽  
Author(s):  
Walter Hein ◽  
Hans Bauer ◽  
Florian Emerstorfer

Based on laboratory trials on the optimal flocculating point, in which the variation of this command variable of the juice purification was demonstrated, a prototype for the automated determination was constructed. A measurement system, which is operated in the bypass of the industrial production, is used for an automatic stepwise carbonatation of main liming juice. Starting at pH = 11.2 carbonatation gas is injected to bring down the pH to 10.4 in 0.1 or 0.2 pH units per step. After every pH step, the sedimentation behavior of the juice is characterized by means of a turbidity measurement after a clarification time of 3.5 min. With the function of turbidity versus pH value the optimal end point of the1st carbonatation can be determined. All in all an analysis takes approximately 60 min. Afterwards, an automated cleaning step takes place. For the prototype, the control of every step as well as the interpretation of the results is carried out with a personal computer. Based on the good experiences a so-called industrial version of this measurement system was constructed.


Author(s):  
F.A. Ponce ◽  
H. Hikashi

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.


2000 ◽  
Vol 28 (1-2) ◽  
pp. 237-245 ◽  
Author(s):  
Nasser Hosseini ◽  
Blanka Hejdukova ◽  
Pall E. Ingvarsson ◽  
Bo Johnels ◽  
Torsten Olsson

Author(s):  
P.F. Collins ◽  
W.W. Lawrence ◽  
J.F. Williams

AbstractA procedure for the automated determination of ammonia in tobacco has been developed. Ammonia is extracted from the ground tobacco sample with water and is determined with a Technicon Auto Analyser system which employs separation of the ammonia through volatilization followed by colourimetry using the phenate-hypochlorite reaction. The procedure has been applied to a variety of tobaccos containing from 0.02 to 0.5 % ammonia with an overall relative standard deviation of 2 %. The accuracy of the procedure as judged by recovery tests and by comparison to a manual distillation method is considered adequate


Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.


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