Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

2021 ◽  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Image Reconstruction ◽  
3D Image ◽  
3D Image Reconstruction ◽  
Transmission Electron

scholarly journals A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy

2021 ◽  
Vol 224 ◽  
pp. 113234
Author(s):  
J.P.J. Chen ◽  
K.E. Schmidt ◽  
J.C.H. Spence ◽  
R.A. Kirian
Keyword(s):  
Electron Microscopy ◽  
Image Reconstruction ◽  
3D Image ◽  
3D Image Reconstruction ◽  
Ewald Sphere

The NCEM One-Angstrom Microscope Project Reaches 0.89Å Resolution

2000 ◽  
Vol 6 (S2) ◽  
pp. 1192-1193 ◽  
Author(s):  
Michael A. O'Keefe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Image Reconstruction ◽  
Structural Information ◽  
Computer Software ◽  
Image Simulation ◽  
Resolution Limit ◽  
Transmission Electron ◽  
Better Than

Transmission electron microscopy to a resolution of 0.89Å has been achieved at the National Center for Electron Microscopy and is available to electron microscopists who have a requirement for this level of resolution. Development of this capability commenced in 1993, when the National Center for Electron Microscopy agreed to fund a proposal for a unique facility, a one- Ångstrom microscope (OÅM).2 The OÅM project provides materials scientists with transmission electron microscopy at a resolution better than one Angstrom by exploiting the significantly higher information limit of a FEG-TEM over its Scherzer resolution limit. To turn the misphased information beyond the Scherzer limit into useful resolution, the OÅM requires extensive image reconstruction. One method chosen was reconstruction from off-axis holograms; another was reconstruction from focal series of underfocused images. The OÅM is then properly a combination of a FEG-TEM (a CM300FEG-UT) together with computer software able to generate sub-Ångstrom images from experimental images obtained on the FEG-TEM.Before the advent of the OÅM, NCEM microscopists relied on image simulation to obtain structural information beyond the TEM resolution limit.

scholarly journals Atomic Resolution Structure of the Oncolytic Parvovirus LuIII by Electron Microscopy and 3D Image Reconstruction

Viruses ◽  
2017 ◽  
Vol 9 (11) ◽  
pp. 321 ◽  
Author(s):  
Nikéa Pittman ◽  
Adam Misseldine ◽  
Lorena Geilen ◽  
Sujata Halder ◽  
J. Smith ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Image Reconstruction ◽  
Atomic Resolution ◽  
3D Image ◽  
3D Image Reconstruction ◽  
Resolution Structure

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

Direct Observation of Heat Exchanger Deposits by Cross Sectioning

1967 ◽  
Vol 25 ◽  
pp. 364-365
Author(s):  
R. W. Anderson ◽  
D. L. Senecal
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heat Exchanger ◽  
Direct Observation ◽  
Cross Sections ◽  
Preparation Method ◽  
Specimen Preparation ◽  
Flowing Water ◽  
Transmission Electron ◽  
Deposit Layer

A problem was presented to observe the packing densities of deposits of sub-micron corrosion product particles. The deposits were 5-100 mils thick and had formed on the inside surfaces of 3/8 inch diameter Zircaloy-2 heat exchanger tubes. The particles were iron oxides deposited from flowing water and consequently were only weakly bonded. Particular care was required during handling to preserve the original formations of the deposits. The specimen preparation method described below allowed direct observation of cross sections of the deposit layers by transmission electron microscopy.The specimens were short sections of the tubes (about 3 inches long) that were carefully cut from the systems. The insides of the tube sections were first coated with a thin layer of a fluid epoxy resin by dipping. This coating served to impregnate the deposit layer as well as to protect the layer if subsequent handling were required.

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