scholarly journals Mixed Signal Integrated Circuit Design for Custom Sensor Interfacing

2016 ◽  
Author(s):  
Steven M. Andryzcik II
Keyword(s):  
Circuit Design ◽  
Integrated Circuit ◽  
Integrated Circuit Design ◽  
Mixed Signal

scholarly journals Achieving Energy Efficiency in Analogue and Mixed Signal Integrated Circuit Design

10.5772/38356 ◽  
2012 ◽  
Author(s):  
E. Lpez-Morillo ◽  
F. Mrquez ◽  
T. Snchez-Rodrguez ◽  
C.I. Lujn-Martnez ◽  
F. Munoz
Keyword(s):  
Energy Efficiency ◽  
Circuit Design ◽  
Integrated Circuit ◽  
Integrated Circuit Design ◽  
Mixed Signal

Teaching Mixed-Signal Integrated Circuit Design to Undergraduates

2006 ◽  
Vol 49 (1) ◽  
pp. 39-48 ◽  
Author(s):  
T.A. Hudson ◽  
E.R. Doering ◽  
G. Lee-Thomas
Keyword(s):  
Circuit Design ◽  
Integrated Circuit ◽  
Integrated Circuit Design ◽  
Mixed Signal

A Case Study of Defects Due to Process-Design Interaction in Nano Scale Technology

2007 ◽  
Author(s):  
Hung-Sung Lin ◽  
Ying-Chin Hou ◽  
Juimei Fu ◽  
Mong-Sheng Wu ◽  
Vincent Huang ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Circuit Design ◽  
Process Design ◽  
Integrated Circuit ◽  
Photon Emission ◽  
Integrated Circuit Design ◽  
Nano Scale ◽  
Leakage Path ◽  
Related Defect

Abstract The difficulties in identifying the precise defect location and real leakage path is increasing as the integrated circuit design and process have become more and more complicated in nano scale technology node. Most of the defects causing chip leakage are detectable with only one of the FA (Failure Analysis) tools such as LCD (Liquid Crystal Detection) or PEM (Photon Emission Microscope). However, due to marginality of process-design interaction some defects are often not detectable with only one FA tool [1][2]. This paper present an example of an abnormal power consumption process-design interaction related defect which could only be detected with more advanced FA tools.

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