Characterization of a novel methyl radical source and related thin film growth studies
2006 ◽
Vol 24
(4)
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pp. 1044-1050
Keyword(s):
Keyword(s):
1997 ◽
Vol 15
(5)
◽
pp. 2709-2716
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Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
2012 ◽
Keyword(s):
1994 ◽
Vol 13
(11)
◽
pp. 832-834
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