Characterization of Step-Edge Barriers in Organic Thin-Film Growth
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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2009 ◽
Vol 130
(12)
◽
pp. 124701
◽
2012 ◽
Keyword(s):
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