scholarly journals Multiangle Long-Axis Lateral Illumination Photoacoustic Imaging Using Linear Array Transducer

Sensors ◽  
2020 ◽  
Vol 20 (14) ◽  
pp. 4052
Author(s):  
João H. Uliana ◽  
Diego R. T. Sampaio ◽  
Guilherme S. P. Fernandes ◽  
María S. Brassesco ◽  
Marcello H. Nogueira-Barbosa ◽  
...  

Photoacoustic imaging (PAI) combines optical contrast with ultrasound spatial resolution and can be obtained up to a depth of a few centimeters. Hand-held PAI systems using linear array usually operate in reflection mode using a dark-field illumination scheme, where the optical fiber output is attached to both sides of the elevation plane (short-axis) of the transducer. More recently, bright-field strategies where the optical illumination is coaxial with acoustic detection have been proposed to overcome some limitations of the standard dark-field approach. In this paper, a novel multiangle long-axis lateral illumination is proposed. Monte Carlo simulations were conducted to evaluate light delivery for three different illumination schemes: bright-field, standard dark-field, and long-axis lateral illumination. Long-axis lateral illumination showed remarkable improvement in light delivery for targets with a width smaller than the transducer lateral dimension. A prototype was developed to experimentally demonstrate the feasibility of the proposed approach. In this device, the fiber bundle terminal ends are attached to both sides of the transducer’s long-axis and the illumination angle of each fiber bundle can be independently controlled. The final PA image is obtained by the coherent sum of subframes acquired using different angles. The prototype was experimentally evaluated by taking images from a phantom, a mouse abdomen, forearm, and index finger of a volunteer. The system provided light delivery enhancement taking advantage of the geometry of the target, achieving sufficient signal-to-noise ratio at clinically relevant depths.

2012 ◽  
Vol 20 (3) ◽  
pp. 38-41 ◽  
Author(s):  
Ted Clarke

A little-known illumination method for light microscopy goes by several names, the most prominent being “circular oblique lighting” (COL) and “hollow-cone illumination”. Matthews notes that hollow-cone or annular bright field illumination can give contrast and resolution superior to that obtainable with narrow-pencil illumination and under favorable conditions comparable to that obtained with phase optics. He demonstrates this with photomicrographs of the same unstained epithelial cell from the mouth mounted in saliva, imaged with a 0.65 numerical aperture (NA) 40× objective. Matthews also notes that the dot pattern of Pleurosigmaangulatum can be resolved with a 0.50 NA objective using circular oblique lighting. Leitz previously marketed the Heine illuminator for transmitted annular (hollow cone) illumination. The NA of the Heine condenser's annular illumination can be adjusted to match the phase annuli in phase contrast objectives. The NA can be increased to provide dark field illumination or circular oblique illumination in bright field. The instructions for the Heine condenser call for the annular illumination just falling within the NA of the objective, what Paul James calls COL and Frithjof A. S. Sterrenberg calls extreme annular illumination, “bright field with very rich contrast.” H. J. Dethloff published a more recent article describing the need for the increased contrast of hollow cone bright field to help resolve the striae of pores in the diatom Amplipleurapellucida. This diatom has been the traditional test of the resolution limit of the light microscope; it is considered a low-contrast subject because the visibility of pores in the transparent amorphous silica frustules is determined by the refractive index difference between the mountant and the frustules. The low contrast makes this a challenging, perhaps even unsuitable, test object for resolution. Resolution tests of modern objectives are done with high-contrast but costly patterns of chrome on glass obtained by electron lithography.


Author(s):  
Suhyun Park ◽  
Andrei B. Karpiouk ◽  
Salavat R. Aglyamov ◽  
Stanislav Y. Emelianov

1930 ◽  
Vol 3 (4) ◽  
pp. 755-763
Author(s):  
Raymond P. Allen

Abstract THE possibility of seeing pigment particles in a rubber stock has always been a desire of rubber chemists. There has been a natural belief that if the particles in rubber could actually be observed with a microscope more could be learned about their action and properties. The main difficulty in attaining this end lies in the preparation of sufficiently thin sections. For clear observation of highly loaded gas-black stocks the sections must be less than 1 micron thick. For bright-field work with light-colored or colorless pigments, such as litharge and zinc oxide, the sections may be somewhat thicker. However, if the examination is to be made with dark-field illumination the sections for even the colorless pigments must again be very thin. Several methods have been proposed and utilized for making thin sections, and the names of Dannenberg (2), Depew (3), Green (4), Grenquist (5), Hauser (7), Moore (11), Pohle (9), Ruby (3), Spear (11), and Walton (12) are identified with the skilful manipulation which is necessary for achieving the desired result. There have been many other workers in this field, including Weber (13), Breuil (1), Loewen (8), Regnaud (10), and Hardman (6). The method to be described was developed in this laboratory in 1926. It has been used continually since that time and has proved valuable in the study of rubber compounds and pigments. While it bears a slight similarity to some of the other methods, it has certain unique and distinct advantages of its own.


2014 ◽  
Author(s):  
Haroon Zafar ◽  
Aedán Breathnach ◽  
Hrebesh M. Subhash ◽  
Martin J. Leahy

Author(s):  
Michael T. Yan ◽  
Brian W. Surgenor

In this paper, three basic lighting geometries are compared quantitatively in an inspection task that checks for the presence of J-clips on an aluminum carrier. Two independent LabVIEW® machine vision algorithms were used to evaluate backlight, bright field and dark field illumination on their ability to minimize variations within a pass (clip present) or fail (clip absent) sample set, as well as maximize the separation between sample sets. Results showed that there were clear differences in performance with the different lighting geometries, with over a 30% change in performance. Although it is widely acknowledged that the choice of lighting is not a trivial exercise for machine vision systems, this paper provides a case study of the quantitative performance of different lighting geometries.


1984 ◽  
pp. 267-333

Abstract This chapter discusses the tools and techniques of light microscopy and how they are used in the study of materials. It reviews the basic physics of light, the inner workings of light microscopes, and the relationship between resolution and depth of field. It explains the difference between amplitude and optical-phase features and how they are revealed using appropriate illumination methods. It compares images obtained using bright field and dark field illumination, polarized and cross-polarized light, and interference-contrast techniques. It also discusses the use of photometers, provides best practices and recommendations for photographing structures and features of interest, and describes the capabilities of hot-stage and hot-cell microscopes.


2009 ◽  
Vol 17 (3) ◽  
pp. 20-29
Author(s):  
Jörg Piper

In light microscopy, dark field and interference contrast are widely used for examination of transparent specimens. These methods both suffer from various limitations when photomicrographs have to be taken from fine details, especially in three-dimensional specimens requiring a large depth of field.In common dark field illumination, the condenser either is not equipped with an aperture diaphragm, or an existing condenser diaphragm has to remain in the wide-open position. Thus, the depth of field is lower than in bright field images. Moreover, dark field imaging is associated with marginal blooming, especially in linear structures exhibiting with large differences in phase or density (e.g. cell walls, edges in crystals and other mineralogical material).


2013 ◽  
Vol 19 (3) ◽  
pp. 629-634 ◽  
Author(s):  
F. Leroux ◽  
E. Bladt ◽  
J.-P. Timmermans ◽  
G. Van Tendeloo ◽  
S. Bals

AbstractImaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.


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