scholarly journals A Review for Compact Model of Thin-Film Transistors (TFTs)

Micromachines ◽  
2018 ◽  
Vol 9 (11) ◽  
pp. 599 ◽  
Author(s):  
Nianduan Lu ◽  
Wenfeng Jiang ◽  
Quantan Wu ◽  
Di Geng ◽  
Ling Li ◽  
...  

Thin-film transistors (TFTs) have grown into a huge industry due to their broad applications in display, radio-frequency identification tags (RFID), logical calculation, etc. In order to bridge the gap between the fabrication process and the circuit design, compact model plays an indispensable role in the development and application of TFTs. The purpose of this review is to provide a theoretical description of compact models of TFTs with different active layers, such as polysilicon, amorphous silicon, organic and In-Ga-Zn-O (IGZO) semiconductors. Special attention is paid to the surface-potential-based compact models of silicon-based TFTs. With the understanding of both the charge transport characteristics and the requirement of TFTs in organic and IGZO TFTs, we have proposed the surface-potential-based compact models and the parameter extraction techniques. The proposed models can provide accurate circuit-level performance prediction and RFID circuit design, and pass the Gummel symmetry test (GST). Finally; the outlook on the compact models of TFTs is briefly discussed.

2015 ◽  
Vol 117 (21) ◽  
pp. 215705 ◽  
Author(s):  
Zhiwei Zong ◽  
Ling Li ◽  
Jin Jang ◽  
Nianduan Lu ◽  
Ming Liu

Micromachines ◽  
2021 ◽  
Vol 12 (10) ◽  
pp. 1220
Author(s):  
Dmitry Zhevnenko ◽  
Fedor Meshchaninov ◽  
Vladislav Kozhevnikov ◽  
Evgeniy Shamin ◽  
Oleg Telminov ◽  
...  

Memristors are among the most promising devices for building neural processors and non-volatile memory. One circuit design stage involves modeling, which includes the option of memristor models. The most common approach is the use of compact models, the accuracy of which is often determined by the accuracy of their parameter extraction from experiment results. In this paper, a review of existing extraction methods was performed and new parameter extraction algorithms for an adaptive compact model were proposed. The effectiveness of the developed methods was confirmed for the volt-ampere characteristic of a memristor with a vertical structure: TiN/HfxAl1-xOy/HfO2/TiN.


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