scholarly journals Calibration and Characterization of a Reduced Form-Factor High Accuracy Three-Axis Teslameter

Electronics ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 151
Author(s):  
Johann Cassar ◽  
Andrew Sammut ◽  
Nicholas Sammut ◽  
Marco Calvi ◽  
Zarko Mitrovic ◽  
...  
Keyword(s):  
Form Factor ◽  
Measurement Techniques ◽  
Calibration Procedure ◽  
Reduced Form ◽  
Hall Probe ◽  
X Ray ◽  
Temperature Offset ◽  
Paul Scherrer ◽  
Reference Fields

A new reduced form-factor three axes digital teslameter, based on the spinning current technique, has been developed. This instrument will be used to characterize the SwissFEL insertion devices at the Paul Scherrer Institute (PSI) for the ATHOS soft X-ray beamline. A detailed and standardized calibration procedure is critical to optimize the performance of this precision instrument. This paper presents the measurement techniques used for the corrective improvements implemented through non-linearity, temperature offset, temperature sensitivity compensation of the Hall probe and electronics temperature compensation. A detailed quantitative analysis of the reduction in errors on the application of each step of the calibration is presented. The percentage peak error reduction attained through calibration of the instrument for reference fields in the range of ±2 T is registered to drop from 1.94% down to 0.02%.

scholarly journals Design and Development of a Reduced Form-Factor High Accuracy Three-Axis Teslameter

Electronics ◽  
2019 ◽  
Vol 8 (3) ◽  
pp. 368 ◽  
Author(s):  
Johann Cassar ◽  
Andrew Sammut ◽  
Nicholas Sammut ◽  
Marco Calvi ◽  
Sasa Dimitrijevic ◽  
...  
Keyword(s):  
Broadband Noise ◽  
Reduced Form ◽  
Hall Probe ◽  
Digital Conversion ◽  
X Ray ◽  
New Instrument ◽  
Absolute Encoder ◽  
Paul Scherrer ◽  
Analogue To Digital ◽  
Performance Results

A novel three-axis teslameter and other similar machines have been designed and developed for SwissFEL at the Paul Scherrer Institute (PSI). The developed instrument will be used for high fidelity characterisation and optimisation of the undulators for the ATHOS soft X-ray beamline. The teslameter incorporates analogue signal conditioning for the three-axes interface to a SENIS Hall probe, an interface to a Heidenhain linear absolute encoder and an on-board high-resolution 24-bit analogue-to-digital conversion. This is in contrast to the old instrumentation setup used, which only comprises the analogue circuitry with digitization being done externally to the instrument. The new instrument fits in a volumetric space of 150 mm × 50 mm × 45 mm, being very compact in size and also compatible with the in-vacuum undulators. This paper describes the design and the development of the different components of the teslameter. Performance results are presented that demonstrate offset fluctuation and drift (0.1–10 Hz) with a standard deviation of 0.78 µT and a broadband noise (10–500 Hz) of 2.05 µT with an acquisition frequency of 2 kHz.

scholarly journals Performance Analysis of a Reduced Form-Factor High Accuracy Three-Axis Teslameter

Electronics ◽  
2019 ◽  
Vol 8 (11) ◽  
pp. 1230 ◽  
Author(s):  
Johann Cassar ◽  
Andrew Sammut ◽  
Nicholas Sammut ◽  
Marco Calvi ◽  
Sasa Spasic ◽  
...  
Keyword(s):  
Analog Signal ◽  
Reduced Form ◽  
Hall Probe ◽  
Signal Conditioning ◽  
Cross Sectional ◽  
New Instrument ◽  
Absolute Encoder ◽  
Paul Scherrer ◽  
Signal Conditioning Circuitry

In the framework of the SwissFEL project at the Paul Scherrer Institute (PSI), a Hall probe bench is being developed for the high-precision magnetic characterization of the insertion devices for the ATHOS soft X-ray beamline. For this purpose, a novel three-axis teslameter has been developed, which will be placed between the undulator and its outer shell in a very limited volumetric space of 150 x 50 x 45 mm. Together with a Hall probe at the center of the cross sectional area of the undulator, the setup will traverse along the undulator length on a specifically designed rig with minimal vibrations. This teslameter has all the analog signal conditioning circuitry for the Hall probe and also has on board 24-bit digitization. The instrument also handles an interface to a linear absolute encoder. The old instrumentation used only had analog signal conditioning circuitry whilst digitization was done off board. The new instrument also provides a very accurate magnetic field map in the µT range with simultaneous readings from the position encoder at an accuracy of ±3 µm. In this paper, a series of tests are described, which were performed at PSI in order to establish the measuring precision and repeatability of the instrument.

scholarly journals Magnetic assessment and modelling of the Aramis undulator beamline

2018 ◽  
Vol 25 (3) ◽  
pp. 686-705 ◽  
Author(s):  
M. Calvi ◽  
C. Camenzuli ◽  
R. Ganter ◽  
N. Sammut ◽  
Th. Schmidt
Keyword(s):  
Magnetic Properties ◽  
Magnetic Measurement ◽  
Hall Probe ◽  
Measurement Equipment ◽  
Series Production ◽  
Close Collaboration ◽  
X Ray ◽  
Short Period ◽  
Reduction Methods ◽  
Paul Scherrer

Within the SwissFEL project at the Paul Scherrer Institute (PSI), the hard X-ray line (Aramis) has been equipped with short-period in-vacuum undulators, known as the U15 series. The undulator design has been developed within the institute itself, while the prototyping and the series production have been implemented through a close collaboration with a Swiss industrial partner, Max Daetwyler AG, and several subcontractors. The magnetic measurement system has been built at PSI, together with all the data analysis tools. The Hall probe has been designed for PSI by the Swiss company SENIS. In this paper the general concepts of both the mechanical and the magnetic properties of the U15 series of undulators are presented. A description of the magnetic measurement equipment is given and the results of the magnetic measurement campaign are reported. Lastly, the data reduction methods and the associated models are presented and their actual implementation in the control system is detailed.

scholarly journals Calibration Method for Confocal X-Ray Microanalysis with Polychromatic Excitation

2015 ◽  
Vol 2015 ◽  
pp. 1-7 ◽  
Author(s):  
C. Sosa ◽  
V. Stoytschew ◽  
J. Leani ◽  
H. J. Sánchez ◽  
C. A. Pérez ◽  
...  
Keyword(s):  
Profile Analysis ◽  
Calibration Method ◽  
Calibration Procedure ◽  
Depth Profile Analysis ◽  
Standard Samples ◽  
X Ray ◽  
Fundamental Parameters ◽  
Experimental Parameters ◽  
Relative Errors

To apply the fundamental parameters method at the confocal setup the knowledge of the sensitivity of the spectrometer is required which depends on the characteristics of two X-ray lenses: one in the excitation channel and another in the detection channel. For the particular case of polychromatic excitation, the theory shows that the focalization properties of the excitation lens for all incident energies affect the X-ray fluorescence intensity. Therefore the traditional calibration method based on the measurement of standard samples becomes unstable since the number of required fitting parameters is too high. To reduce these parameters a previous characterization of the excitation lens by a simulation program was employed giving rise to a simplified confocal setup calibration. The developed calibration method was applied for a confocal spectrometer implemented in the Brazilian Synchrotron Radiation Source (LNLS) with white beam. The experimental parameters of the sensitivity were obtained from depth profile analysis of several pure thin films. The calibrated confocal setup was used to quantify reference standards in order to validate the calibration procedure. Our results for elemental concentrations show relative errors less than 15% for the quantitative analysis of a light matrix reference standard.

Electrochemistry and spectral characterization of arsenic porphyrins with σ-bonded axial ligands: X-ray crystallographic analysis of [(OEP)As(F)2]+PF6−, [(OEP)As(CH3)(OCH3)]+ClO4− and [(OEP)As(C2H5)2]+PF6−

2002 ◽  
Vol 06 (05) ◽  
pp. 325-335 ◽  
Author(s):  
Karl M. Kadish ◽  
Zhongping Ou ◽  
Xiaoyu Tan ◽  
Wataru Satoh ◽  
Yohsuke Yamamoto ◽  
...  
Keyword(s):  
Esr Spectroscopy ◽  
Supporting Electrolyte ◽  
Crystallographic Analysis ◽  
Reduced Form ◽  
X Ray ◽  
Group Iii ◽  
Axial Ligands ◽  
Group I ◽  
Uv Visible

The electrochemistry of nine arsenic(V) octaethylporphyrins is reported in benzonitrile or dichloromethane containing 0.1 M tetra-n-butylammonium perchlorate as supporting electrolyte and the results compared to data for phosphorus and antimony porphyrins containing a similar set of σ-bonded and/or anionic axial ligands. The investigated compounds are divided into three groups based on the nature of the axial ligands and are represented as [( OEP ) As ( R )( R ')]+ (group I), [( OEP ) As ( R )( X )]+ (group II) and [( OEP ) As ( F )2]+ (group III) where R and R’ = CH 3 or C 2 H 5, X = OH −, OCH 3−, OC 2 H 5−, OC 3 H 7− or NHC 4 H 9− and OEP = the dianion of octaethylporphyrin. Each compound was characterized in its neutral, oxidized and reduced form by UV-visible and ESR spectroscopy. An X-ray crystallographic analysis of [( OEP ) As ( F )2]+ PF 6−, [( OEP ) As ( CH 3)( OCH 3)]+ ClO 4− and [( OEP ) As ( C 2 H 5)2]+ PF 6− is also presented.

scholarly journals Characterization of Microbial Degradation Products of Steviol Glycosides

Molecules ◽  
2021 ◽  
Vol 26 (22) ◽  
pp. 6916
Author(s):  
Gert Steurs ◽  
Nico Moons ◽  
Luc Van Meervelt ◽  
Boudewijn Meesschaert ◽  
Wim Michel De Borggraeve
Keyword(s):  
Chemical Synthesis ◽  
Microbial Degradation ◽  
Degradation Products ◽  
Reduced Form ◽  
Steviol Glycosides ◽  
X Ray ◽  
Incubation Experiments ◽  
Tricyclic Ketone ◽  
Nmr Methods

Steviol glycosides were subjected to bacteria present in a soil sample collected from a Stevia plantation in Paraguay. During the incubation experiments, next to the aglycon steviol, steviol degradation products were also formed. X-ray analysis and NMR methods in combination with chemical synthesis and GIAO NMR calculations were used to fully characterize the structure of these compounds as a tricyclic ketone and the corresponding reduced form. They were nicknamed monicanone and monicanol. The latter has the (S)-configuration at the alcohol site.

The contributions of Albert W. Hull to X-ray powder diffraction at one hundred years of his landmark publication

2017 ◽  
Vol 32 (1) ◽  
pp. 2-9 ◽  
Author(s):  
José Miguel Delgado
Keyword(s):  
Powder Diffraction ◽  
Physical Review ◽  
General Electric Company ◽  
X Ray ◽  
Electric Company ◽  
Characterization Of Materials ◽  
University Of Göttingen ◽  
Paul Scherrer ◽  
The University

One hundred years ago X-ray powder diffraction, one of the premier techniques used in the characterization of materials, was invented. Its origins can be traced to two landmark contributions presented to the scientific community in 1916. They are the better known and celebrated work carried out by Paul Scherrer under the guidance of Peter W. Debye, at the University of Göttingen, Germany, and the lesser known work of Albert W. Hull performed at the Research Laboratory of the General Electric Company, Schenectady, NY, USA. The great contributions of Scherrer and Debye have been prominently recognized. They are presented in many textbooks and in technical and scientific articles published in the area of characterization of materials using powder diffraction techniques. The camera designed by them, later called “the Debye–Scherrer camera”, was used extensively for many years and the experimental setup (“the Debye–Scherrer geometry”) is still used today. On the other hand, the work performed by Hull has not been adequately appreciated and remembered. In this communication, an account of his contributions to X-ray powder diffraction and to crystallography is presented at 100 years of his landmark publication, which appeared in the first issue of Physical Review of 1917.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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