scholarly journals Effects of Domain Boundaries on the Diffraction Patterns of One-Dimensional Structures

2017 ◽  
Vol 2 (1) ◽  
pp. 7 ◽  
Author(s):  
Frederic Timmer ◽  
Joachim Wollschläger
Keyword(s):  
One Dimensional ◽  
Domain Boundaries ◽  
Diffraction Patterns

scholarly journals Effects of Domain Boundaries on the Diffraction Patterns of One Dimensional Structures

2016 ◽  
Author(s):  
Frederic Timmer ◽  
Joachim Wollschläger
Keyword(s):  
Rare Earth ◽  
Diffraction Pattern ◽  
Diffraction Theory ◽  
Model Systems ◽  
Silicide Formation ◽  
One Dimensional ◽  
Domain Boundaries ◽  
Different Types ◽  
Diffraction Patterns ◽  
Surface Technique

Motivated by diffraction experiments on the 23×3R30∘ reconstructed Si(111) due to deposition of rare earth elements (Dy, Tb) and silicide formation we analyse the splitting and non-splitting of superstructure spots. For this purpose, we model diffraction patterns for one dimensional structures generated by the binary surface technique and use supercell models to keep the analysis simple. Diffraction pattern are calculated in the framework of the kinematical diffraction theory and they are analyzed as a function of the domains and domain boundaries. Basic properties of the diffraction pattern are analyzed for model systems of a two-fold and a three-fold periodicity. The rules derived from these calculations are applied to the "real-world" system of Si(111)-(23×3R30∘)-RESi2 (RE = Dy or Tb). Depending on the combination of domains and domain boundaries of different types a plethora of different features are observed in the diffraction patterns. These are analyzed to determine the sizes of both domain boundaries and domains from experimentally observed splitting of specific superstructure spots.

Analysis of Selected Area Diffraction Patterns With Winjade

1998 ◽  
Vol 4 (S2) ◽  
pp. 342-343 ◽  
Author(s):  
S. D. Walck ◽  
P. Ruzakowski-Athey
Keyword(s):  
Single Phase ◽  
Xrd Analysis ◽  
Analysis Program ◽  
X Ray Diffraction ◽  
Program Module ◽  
Vast Number ◽  
One Dimensional ◽  
X Ray ◽  
Diffraction Patterns ◽  
Xrd Patterns

The analysis of Selected Area Diffraction (SAD) patterns that are collected from a single phase material having sufficient crystallites to provide continuous rings is relatively straightforward. However, when this condition is not met and there may be several phases present having rings of a spotty nature, the pattern is complex and can be quite difficult to analyze manually because of the vast number of discrete spots. WinJade from MDI is an X-ray diffraction (XRD) analysis program with an Electron Diffraction Program Module (EDPM) that can be used to aid in the analysis of SAD patterns. The EDPM produces Integrated Circular Density Plots (ICDP), which are one-dimensional intensity profiles plotted as a function of equivalent XRD 20 values or crystal d-spacings. These ICDP's can be overlayed with XRD patterns or with reference lines from the NIST and JCPDS crystalline databases for direct comparisons.

Determination of displacement vector on 180° domain boundary and polarization arrangements in lead titanate crystals

1997 ◽  
Vol 12 (2) ◽  
pp. 457-466 ◽  
Author(s):  
Chen-Chia Chou ◽  
C. Marvin Wayman
Keyword(s):  
Lead Titanate ◽  
Displacement Vector ◽  
Domain Boundary ◽  
Polarization Vector ◽  
Dynamical Theory ◽  
Fringe Contrast ◽  
Displacement Vectors ◽  
Domain Boundaries ◽  
Contrast Analysis ◽  
Diffraction Patterns

180° domain boundaries in flux-grown lead titanate single crystals show intriguing domain boundary extreme fringe contrast using transmission electron microscopy. Symmetrically distributed domain boundaries with alternate contrast have been observed, indicating that opposite displacement vectors exist one by one at boundaries. If appropriate reflection vectors were employed, an inclined domain boundary shows reversed fringe contrast. An analysis based upon the two-beam dynamical theory and a rule similar to stacking-fault contrast analysis was employed to predict the geometric configuration of a 180° domain boundary using the extreme fringe contrast (EFC) behavior. Appropriately choosing reflection vectors and utilizing the EFC reversal, a displacement vector as well as the polarization vector arrangement across a 180° domain boundary can be unambiguously identified. Employing the information derived from diffraction patterns and a tilting experiment across a nearby 90° boundary, the whole polarization configuration can be uniquely determined.

Microstructural properties and formation mechanisms of GaN nanorods grown on Al2O3 (0001) substrates

2009 ◽  
Vol 24 (8) ◽  
pp. 2476-2482
Author(s):  
Kyu H. Lee ◽  
Jeong Y. Lee ◽  
Y.H. Kwon ◽  
Tae W. Kang ◽  
Dong H. Kim ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Hydride Vapor Phase Epitaxy ◽  
Formation Mechanisms ◽  
Gas Mixing ◽  
X Ray Diffraction ◽  
One Dimensional ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
Increasing Temperature ◽  
Microscopy Images

X-ray diffraction patterns, scanning electron microscopy images, and transmission electron microscopy images showed that one-dimensional GaN nanorods with [0001]-oriented single-crystalline wurtzite structures were grown on Al2O3 (0001) substrates by hydride vapor-phase epitaxy without a catalyst. The tip morphology of the GaN nanorods became flat with increasing temperature difference between the gas mixing and the substrate zones. The gas mixing temperature significantly affected the formation of the nanorods, and the substrate temperature influenced the morphology and the strain of the GaN nanorods near the GaN/Al2O3 heterointerface. The strain and the stress existing in the GaN layer near the heterointerface were decreased with increasing growth rate. The formation mechanisms of the GaN nanorods grown on the Al2O3 (0001) substrates are described on the basis of the experimental results.

Structure and Properties of Ultrathin Ge-Si Superlattices

1986 ◽  
Vol 67 ◽  
Author(s):  
J. Bevk ◽  
J. P. Mannaerts ◽  
L. C. Feldman ◽  
B. A. Davidson ◽  
W. P. Lowe ◽  
...  
Keyword(s):  
Optical Transition ◽  
Growth Direction ◽  
Unit Cell ◽  
Silicon Substrates ◽  
Optical Studies ◽  
One Dimensional ◽  
X Ray ◽  
Ordered Alloys ◽  
Diffraction Patterns ◽  
Highly Strained

ABSTRACTWe report the synthesis, structural characterization, and preliminary optical studies of ultrathin Ge-Si superlattices with individual sublayers smaller than the Si unit cell, grown by MBE on (001) silicon substrates. Structures are fabricated one monolayer at a time in a configuration GeGeSiSiGeGe..., resulting in either ordered alloys or complex cell superlattices. Rutherford backscattering and channeling experiments on these highly strained heterostructures indicate excellent crystallinity with tetragonal distortion as high as 3.5%. Electron diffraction patterns exhibit characteristic superlattice reflections indicative of one-dimensional layering with periodicity of four monolayers. X-ray scans along the growth direction at the (002) position in reciprocal space reveal a strong peak not observed in random GeSi alloys. This scattering is attributed indirectly to the GeSi ordered phase. The optical transition energies measured by Schottky barrier electroreflectance correspond to those expected from homogeneous alloys of the same composition; however, the width of optical transitions is less than 30 meV at room temperature, allowing a clear resolution of the splitting of the valence band by strain. Modification of the unit cell of the diamond lattice in this way should permit the design of materials with novel opto-electronic characteristics. Preliminary Raman and photoconductivity measurements are also reported.

Mechanism of the morphotropic transformation between the rutile and corundum structural types

2003 ◽  
Vol 59 (4) ◽  
pp. 456-462 ◽  
Author(s):  
H. Katzke ◽  
R. Schlögl
Keyword(s):  
Simple Model ◽  
Phase Segregation ◽  
Transformation Process ◽  
Transformation Mechanism ◽  
One Dimensional ◽  
X Ray ◽  
Structural Types ◽  
Crystallographic Shear ◽  
Diffraction Patterns ◽  
Shear Planes

The rutile/corundum structural transformation which is based on crystallographic shear is discussed in terms of a one-dimensional disorder model. The transformation process is described by a simple model based on the structural relationship between the rutile-type and corundum-type phases. The model is able to handle randomly spaced crystallographic shear planes, the so-called Wadsley defects, as well as clustered CS planes. Calculations hsow that simply modifying the probability parameters of the model can lead to phase segregation. X-ray powder diffraction patterns are calculated for the proposed transformation mechanism as a function of the stoichiometry x in MO2−x in order to show the influence of such defects on the intensities and linewidths of the Bragg reflections.

Modifications 7 And 8 Of Decagonal AI-Co-Ni

1998 ◽  
Vol 553 ◽  
Author(s):  
S. Ritsch ◽  
K. Hiraga ◽  
C. Beeli ◽  
T. Gödecke ◽  
M. Scheffer ◽  
...  
Keyword(s):  
Rotation Axis ◽  
The Other ◽  
Stability Field ◽  
One Dimensional ◽  
Decagonal Phase ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
The Stability ◽  
Means Of Transmission ◽  
Very High

AbstractBesides the six established decagonal states of the Al-Co-Ni quasicrystal two more modifications have been discovered by means of transmission electron microscopy. One is a pentagonal quasicrystal with a superstructure found in specimens with a very high Co-content and quenched from the highest possible temperature lying within the stability field of decagonal Al-Co-Ni. Its electron diffraction patterns are characterized by a 5-fold rotation axis as a unique symmetry element as well as superstructure reflections similar to those of a related decagonal phase. The other is a one-dimensional quasicrystal closely related to decagonal Al-Co-Ni. The modulation length of 61 Å along the periodic direction in its pseudo 10-fold diffraction patterns can be assumed to be caused by a strong linear, uniform, phason strain in the material.

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