Rarefied-Flow Transition Regime Orbiter Aerodynamic Acceleration Flight Measurements

1997 ◽  
Vol 34 (1) ◽  
pp. 8-15 ◽  
Author(s):  
Robert C. Blanchard ◽  
Richard G. Wilmoth ◽  
Gerald J. LeBeau
Keyword(s):  
Transition Regime ◽  
Flow Transition ◽  
Rarefied Flow ◽  
Flight Measurements

Rarefied-flow aerodynamics and thermosphere structure from Shuttle flight measurements

1986 ◽  
Vol 23 (1) ◽  
pp. 18-24 ◽  
Author(s):  
Robert C. Blanchard ◽  
Gregory M. Buck
Keyword(s):  
Rarefied Flow ◽  
Flight Measurements

Aerodynamic Flight Measurements and Rarefied-Flow Simulations of Mars Entry Vehicles

1997 ◽  
Vol 34 (5) ◽  
pp. 687-690 ◽  
Author(s):  
Robert C. Blanchard ◽  
Richard G. Wilmoth ◽  
James N. Moss
Keyword(s):  
Rarefied Flow ◽  
Flow Simulations ◽  
Flight Measurements

Transport Path in Hydrogenated Microcrystalline Silicon

2002 ◽  
Vol 715 ◽  
Author(s):  
N. Wyrsch ◽  
C. Droz ◽  
L. Feitknecht ◽  
J. Spitznagel ◽  
A. Shah
Keyword(s):  
Raman Spectroscopy ◽  
Volume Fraction ◽  
Conductivity Measurement ◽  
Dark Conductivity ◽  
Transition Regime ◽  
Conductivity Data ◽  
Crystalline Volume Fraction ◽  
Microcrystalline Silicon ◽  
Crystalline Fraction ◽  
Transport Path

AbstractUndoped microcrystalline silicon samples deposited in the transition regime between amorphous and microcrystalline growth have been investigated by dark conductivity measurement and Raman spectroscopy. From the latter, a semi-quantitative crystalline volume fraction Xc of the sample was deduced and correlated with dark conductivity data in order to reveal possible percolation controlled transport. No threshold was observed around the critical crystalline fraction value Xc of 33%, as reported previously, but a threshold in conductivity data was found at Xc≈50%. This threshold is interpreted here speculatively as being the result of postoxidation, and not constituting an actual percolation threshold.

MSX satellite - Flight measurements of contaminant films

1998 ◽  
Author(s):  
B. Wood ◽  
D. Hall ◽  
J. Lesho ◽  
M. Boies ◽  
D. Silver ◽  
...  
Keyword(s):  
Flight Measurements
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