Multilayer optics for XUV spectral region: technology fabrication and applications

Open Physics ◽  
2003 ◽  
Vol 1 (1) ◽  
Author(s):  
S. Andreev ◽  
A. Akhsakhalyan ◽  
M. Bibishkin ◽  
N. Chkhalo ◽  
S. Gaponov ◽  
...  

AbstractWe present research investigations in the field of multilayer optics in X-ray and extreme ultra-violet ranges (XUV), aimed at the development of optical elements for applications in experiments in physics and in scientific instrumentation. We discuss normal incidence multilayer optics in the spectral region of “water window”, multilayer optics for collimation and focusing of hard X-ray, multilayer dispersing elements for X-ray spectroscopy of high-temperature plasma, multilayer dispersing elements for analysis of low Z-elements. Our research pays special attention to optimization of multilayer optics for projection EUV-lithography (ψ-13nm) and short period multilayer optics.

1999 ◽  
Author(s):  
Hans M. Hertz ◽  
Lars Rymell ◽  
Magnus Berglund ◽  
Goeran A. Johansson ◽  
Thomas Wilhein ◽  
...  
Keyword(s):  
X Ray ◽  

2003 ◽  
Vol 28 (24) ◽  
pp. 2494 ◽  
Author(s):  
Fredrik Eriksson ◽  
Göran A. Johansson ◽  
Hans M. Hertz ◽  
Eric M. Gullikson ◽  
Ulrich Kreissig ◽  
...  

2020 ◽  
Vol 27 (6) ◽  
pp. 1614-1617
Author(s):  
Jingtao Zhu ◽  
Jiayi Zhang ◽  
Haochuan Li ◽  
Yuchun Tu ◽  
Jinwen Chen ◽  
...  

The `water window', covering 2.4–4.4 nm, is an important wavelength range particularly essential to biology research. Cr/Ti multilayers are one of the promising reflecting elements in this region because the near-normal-incidence reflectivity is theoretically as high as 64% at 2.73 nm. However, due to multilayer imperfections, the reported reflectivity is lower than 3% for near-normal incidence. Here, B and C were intentionally incorporated into ultra-thin Cr/Ti soft X-ray multilayers by co-deposition of B4C at the interfaces. The effect on the multilayer structure and composition has been investigated using X-ray reflectometry, X-ray photoelectron spectroscopy, and cross-section electron microscopy. It is shown that B and C are mainly bonded to Ti sites, forming a nonstoichiometric TiB x C y composition, which hinders the interface diffusion, supresses the crystallization of the Cr/Ti multilayer and dramatically improves the interface quality of Cr/TiB x C y multilayers. As a result, the near-normal-incidence reflectivity of soft X-rays increases from 4.48% to 15.75% at a wavelength of 2.73 nm.


1988 ◽  
Vol 102 ◽  
pp. 303
Author(s):  
A.V. Vinogradov

SummaryTi, Si, C, Be and LiF have been studied as coatings for normal incidence (multilayers) and grazing incidence (steering many-fold reflection mirrors) optical elements. The multilayers have been tested with soft (130+250 Å and hard (1.54 Å) X-rays. From these measurements the multilayer parameters have been deduced.The carbon and lithium fluorine steering mirrors showed the reflection of 10+60% for the turning angles of 30 and 45 degrees and two wavelengths of 44.7 Å and 67.6 Å. The perspectives of other materials are also discussed.


2006 ◽  
Vol 86 (3) ◽  
pp. 519-522 ◽  
Author(s):  
J.A. Chakera ◽  
S.R. Kumbhare ◽  
P.A. Naik ◽  
P.D. Gupta

2015 ◽  
Vol 107 (12) ◽  
pp. 121101 ◽  
Author(s):  
Thanh-Hung Dinh ◽  
Yuhei Suzuki ◽  
Goki Arai ◽  
Bowen Li ◽  
Padraig Dunne ◽  
...  

2016 ◽  
Vol 49 (6) ◽  
pp. 2161-2171 ◽  
Author(s):  
Anton Haase ◽  
Saša Bajt ◽  
Philipp Hönicke ◽  
Victor Soltwisch ◽  
Frank Scholze

Cr/Sc multilayer systems can be used as near-normal incidence mirrors for the water window spectral range. It is shown that a detailed characterization of these multilayer systems with 400 bilayers of Cr and Sc, each with individual layer thicknesses <1 nm, is attainable by the combination of several analytical techniques. EUV and X-ray reflectance measurements, resonant EUV reflectance across the ScLedge, and X-ray standing wave fluorescence measurements were used. The parameters of the multilayer model were determinedviaa particle-swarm optimizer and validated using a Markov chain Monte Carlo maximum-likelihood approach. For the determination of the interface roughness, diffuse scattering measurements were conducted.


Author(s):  
Thanh-Hung Dinh ◽  
Yuhei Suzuki ◽  
Goki Arai ◽  
Masaharu Nishikino ◽  
Noboru Hasegawa ◽  
...  

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