The Use of Ti, Si, C, Be and LiF in Soft X-Ray Optics

1988 ◽  
Vol 102 ◽  
pp. 303
Author(s):  
A.V. Vinogradov
Keyword(s):  
Normal Incidence ◽  
Grazing Incidence ◽  
X Rays ◽  
Optical Elements ◽  
Ray Optics ◽  
X Ray

SummaryTi, Si, C, Be and LiF have been studied as coatings for normal incidence (multilayers) and grazing incidence (steering many-fold reflection mirrors) optical elements. The multilayers have been tested with soft (130+250 Å and hard (1.54 Å) X-rays. From these measurements the multilayer parameters have been deduced.The carbon and lithium fluorine steering mirrors showed the reflection of 10+60% for the turning angles of 30 and 45 degrees and two wavelengths of 44.7 Å and 67.6 Å. The perspectives of other materials are also discussed.

LAYERED SYNTHETIC MICROSTRUCTURES AS OPTICAL ELEMENTS FOR THE EXTREME ULTRAVIOLET AND SOFT X-RAYS

1991 ◽  
Vol 05 (13) ◽  
pp. 2133-2228 ◽  
Author(s):  
PURUSHOTTAM CHAKRABORTY
Keyword(s):  
Visible Light ◽  
Extreme Ultraviolet ◽  
Normal Incidence ◽  
Great Promise ◽  
Major Advance ◽  
X Rays ◽  
Ray Optics ◽  
X Ray ◽  
Transmission Electron ◽  
Synthetic Microstructures

In recent years, the availability of intense continuous radiation sources, such as electron synchrotrons and laser-induced hot plasmas, has given rise to a renewed interest in soft x-ray and x-uv reflectivity measurements. Such studies were, for a long time, hindered because of mainly two reasons. First, it was really difficult to generate soft x-rays in the laboratories and second, there was no possibility for practical implementation and design of optical systems, such as focusing elements, mirrors, etc. associated with that particular wavelength region. Soft x-rays, with wavelength range usually from 10 to about 200 angstroms, can produce images of higher resolution than visible light due to their shorter wavelength. For years, physicists have wanted to construct an x-ray microscope that would exploit the ability of soft x-rays to detect small structures. The need for such an instrument is clear. The resolution of light microscopes is limited by the comparatively long wavelength of visible light. Although transmission electron microscopes have much higher resolution, they are weak in penetrating power and are, therefore, limited to very thin specimens. Therefore, transmission electron microscopy involves extreme care in sample preparation. Such preparations which might alter the very structure of a biological sample, would not be required in x-ray microscopy. The difficulties in constructing an x-ray microscope, however, have proved to be irresistible, because of the fact that soft x-rays cannot be brought together to form an image. In other words, soft x-rays cannot be made reflected from any known single surface at normal or near-normal incidence. The only possibility that existed until now employs grazing incidence, the only form of focusing x-ray optics. But their quality (resolution) has been limited because they must be machined in the form of a paraboloid or hyperboloid. Lenses of the kind used in ordinary optical microscopes cannot be made for use at wavelengths less than about 1000 angstroms. There are two reasons for this. First, there is only a tiny difference in the refractive indices among the different materials at soft x-ray wavelengths. Second, soft x-rays are strongly absorbed by all materials and cannot penetrate any conceivable lens, used in ordinary optical microscopes or telescopes. A major advance in x-ray optics holds a great promise both in the fields of high resolution scanning x-ray microscopy, lithography and substantial improvements in the quality of x-ray telescopes. Recent improvements in the techniques for quality control of evaporated and sputtered films have led to the interest in the controlled fabrication of multilayered structures known as 'Layered Synthetic Microstructures', to be used as mirrors for the extreme ultraviolet and soft x-ray regions. These can be produced with virtually any layer spacing greater than approximately 10 angstroms and they have a considerably high diffraction efficiency at normal or near-normal incidence. This remarkable enhancement in normal-incidence reflectivities at x-uv domain of the electromagnetic spectrum leads to another innovative application of these microstructures, i.e. the production of x-ray lasers with high gain-length products, where the enhanced normal-incidence reflectivity of the multilayers has been applied for multiple pass gain of the laser media by increasing the effective path lengths of the plasma columns. The present article covers the theoretical considerations, development and different techniques of controlled fabrication of layered synthetic microstructures along with their potential applications in the fields of x-ray spectroscopy, microscopy, x-ray laser production and lithography.

Application of X-ray Optics to Energy-Dispersive Spectroscopy

1998 ◽  
Vol 4 (6) ◽  
pp. 632-641 ◽  
Author(s):  
Jon J. McCarthy ◽  
David J. McMillan
Keyword(s):  
Grazing Incidence ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray Diffraction ◽  
Wavelength Dispersive Spectroscopy ◽  
Ray Optics ◽  
X Ray ◽  
Analytical Instruments ◽  
Focus Effect ◽  
Flux Incident

X-ray optics have been used in X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy. X-ray optics have been used to increase the X-ray flux incident on the sample or to direct and focus emitted X-rays from a sample. We report here the use of a grazing incidence optic (GIO) as a flux-enhancing collimator for use with an energy-dispersive (ED) detector used to perform electron beam microanalysis. We found that the GIO in combination with an ED spectrometer (EDS) provides substantial intensity gain for X-ray lines with energy below 1 keV. The GIO is also found to provide a modest focus effect, and introduces minimal spectral artifacts.

Application of X-Ray Optics to Energy Dispersive Spectroscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 178-179
Author(s):  
J. J. McCarthy ◽  
D. J. McMillan
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
High Intensity ◽  
Grazing Incidence ◽  
Detection Sensitivity ◽  
X Rays ◽  
Wavelength Dispersive Spectroscopy ◽  
Ray Optics ◽  
X Ray ◽  
Capillary Optics ◽  
Convergent Beam

The application of x-ray optics for focusing x-rays into high intensity spots or for collimation of x-ray beams has been reported by several authors. Example applications for x-ray optics include microfluorescence, microdiffraction, tomography and lithography, and WDS. Kirkland et al. pointed out that the use of an optic, in a collimating configuration could provide enhanced detection sensitivity in wavelength dispersive spectroscopy. In these proceedings last year, Agnello et al. presented data from a new WDS device specifically designed to use a grazing incidence collimating x-ray optic that confirmed and extended the work of Kirkland.A few studies have appeared reporting the use X-ray optics in applications using EDS. Focusing x-ray optics have been used on both the excitation and detection side of EDS systems. In a series of papers, Carpenter and his collaborators describe an x-ray microprobe which uses capillary optics to provide an intense convergent beam of x-rays from a microfocus x-ray tube to excite the sample for x-ray microfluorescence studies. Wollman et al.

scholarly journals Optics for coherent X-ray applications

2014 ◽  
Vol 21 (5) ◽  
pp. 976-985 ◽  
Author(s):  
Makina Yabashi ◽  
Kensuke Tono ◽  
Hidekazu Mimura ◽  
Satoshi Matsuyama ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
Cooling System ◽  
Spot Size ◽  
High Heat ◽  
Design Parameters ◽  
X Rays ◽  
Diagnostic Systems ◽  
Optical Elements ◽  
Ray Optics ◽  
X Ray ◽  
Expected Performance

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed.

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

Diamond channel-cut crystals for high-heat-load beam-multiplexing narrow-band X-ray monochromators

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Yuri Shvyd'ko ◽  
Sergey Terentyev ◽  
Vladimir Blank ◽  
Tomasz Kolodziej
Keyword(s):  
Heat Load ◽  
Narrow Band ◽  
Bragg Reflection ◽  
High Heat ◽  
High Repetition Rate ◽  
X Rays ◽  
Ray Optics ◽  
X Ray ◽  
Load Beam ◽  
High Heat Load

Next-generation high-brilliance X-ray photon sources call for new X-ray optics. Here we demonstrate the possibility of using monolithic diamond channel-cut crystals as high-heat-load beam-multiplexing narrow-band mechanically stable X-ray monochromators with high-power X-ray beams at cutting-edge high-repetition-rate X-ray free-electron laser (XFEL) facilities. The diamond channel-cut crystals fabricated and characterized in these studies are designed as two-bounce Bragg reflection monochromators directing 14.4 or 12.4 keV X-rays within a 15 meV bandwidth to 57Fe or 45Sc nuclear resonant scattering experiments, respectively. The crystal design allows out-of-band X-rays transmitted with minimal losses to alternative simultaneous experiments. Only ≲2% of the incident ∼100 W X-ray beam is absorbed in the 50 µm-thick first diamond crystal reflector, ensuring that the monochromator crystal is highly stable. Other X-ray optics applications of diamond channel-cut crystals are anticipated.

Effect of surface roughness of substrate on grazing incidence x-ray optics

1998 ◽  
Author(s):  
Keisuke Tamura ◽  
Koujun Yamashita ◽  
Hideyo Kunieda ◽  
Yuzuru Tawara ◽  
Kazutoshi Haga ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Grazing Incidence ◽  
Ray Optics ◽  
X Ray ◽  
Effect Of Surface

The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays

2009 ◽  
Vol 24 (6) ◽  
pp. 792 ◽  
Author(s):  
Alex von Bohlen ◽  
Markus Krämer ◽  
Christian Sternemann ◽  
Michael Paulus
Keyword(s):  
Coherence Length ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray

Zone plates for x-ray optics at grazing incidence angles

1996 ◽  
Vol 29 (1) ◽  
pp. 129-132 ◽  
Author(s):  
I A Schelokov ◽  
Yu A Basov
Keyword(s):  
Grazing Incidence ◽  
Ray Optics ◽  
X Ray ◽  
Zone Plates
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