scholarly journals Single Incidence X-Ray Stress Measurement for All Plane Stress Components Using Imaging Plate of Two-Dimensional X-Ray Detector.

1995 ◽  
Vol 44 (504) ◽  
pp. 1138-1143 ◽  
Author(s):  
Toshihiko SASAKI ◽  
Yukio HIROSE
Keyword(s):  
Plane Stress ◽  
Stress Measurement ◽  
Imaging Plate ◽  
Two Dimensional ◽  
X Ray ◽  
Stress Components

scholarly journals Use of Imaging Plates in X-Ray Analysis

1997 ◽  
Vol 29 (1-2) ◽  
pp. 89-101 ◽  
Author(s):  
M. Ermrich ◽  
F. Hahn ◽  
E. R. Wölfel
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Powder Diffraction ◽  
Polycrystalline Materials ◽  
Imaging Plate ◽  
Two Dimensional ◽  
X Ray ◽  
Working Principle ◽  
Imaging Plates

Two-dimensional detectors have opened a new area for the investigation of both single crystals and polycrystalline materials. The working principle of Imaging Plates is described. Some characteristics and the advantages of an Imaging Plate are discussed using the STOE Imaging Plate Diffraction System for different kinds of X-ray analysis: (i) single crystal diffractometry, (ii) powder diffraction and (iii) stress and texture investigations.

Highly Sensitive X-Ray Stress Measurement in Small Areas

1992 ◽  
Vol 36 ◽  
pp. 505-513 ◽  
Author(s):  
Nobuyuki Fujii ◽  
Shigeru Kozaki
Keyword(s):  
Exposure Time ◽  
Stress Measurement ◽  
High Sensitivity ◽  
Measuring Method ◽  
304 Stainless Steel ◽  
Imaging Plate ◽  
List Type ◽  
X Ray ◽  
Small Areas ◽  
The Difference

AbstractThe authors tried a new measuring method for stresses in small areas of ceramics. This method is characterized by the following.1)Applicable to small areas.2)High sensitivity.3)Stress calculations by measuring the average Debye ring radius in view of spotty diffraction rings.4)The use of an imaging processor for (3).5)The use of an imaging plate (IP) for reducing the exposure time.We worked out a computer simulation about errors of the values measured by our method. The result showed a good approximation. With a test piece applied with a certain load, the difference between stresses measured by our method and those by a strain gauge was about 12 percent. We applied this method to the measurement of residual stresses which took place near the silicon nitride (Si3N4)/304 stainless steel brazing point interface. In the case of using an X-ray beam of 100 μm diameter, the exposure time was 90min with a high sensitive X-ray film and 3min with the imaging plate. In the case of an X-ray beam of 40 μm diameter, it was 120 to 190 min with the imaging plate.

New Generation X-Ray Stress Measurement Using Debye Ring Image Data by Two-Dimensional Detection

2014 ◽  
Vol 783-786 ◽  
pp. 2103-2108 ◽  
Author(s):  
Toshihiko Sasaki
Keyword(s):  
Stress Analysis ◽  
Generation X ◽  
Stress Measurement ◽  
Image Data ◽  
Two Dimensional ◽  
Analysis Method ◽  
X Ray ◽  
Debye Ring ◽  
New Type ◽  
New Generation

Measuring theory of two types of X-ray stress analysis method was compared with each other. One is the conventional method, in which zero-or one-dimensional detector is used for obtaining diffracted beam and stress is determined using the standard sin2ψ method. Another is the new type of X-ray stress analysis method, in which two-dimensional detector is used to obtain whole Debye ring and stress is determined using the cosα method. An experiment was conducted to investigate the validity.

Two-Dimensional Stress and Inertia Combinations

1957 ◽  
Vol 61 (557) ◽  
pp. 353-354
Author(s):  
D. E. R. Godfrey
Keyword(s):  
Plane Stress ◽  
Two Dimensional ◽  
Stress Theory ◽  
Stress Components ◽  
Established Fact ◽  
Photoelastic Analysis ◽  
Image Position

A Similarity in properties will be demonstrated between the moments and product of inertia of a lamina and the components of plane stress. It is now a well established fact that in two-dimensional stress theory it is advantageous to use certain combinationsof the stress components.1First, it will be shown that the use of similar combinations of the moments and product of inertia leads to a useful graphical means of obtaining these quantities for awkwardly placed axes and also to some results not normally to be found in the text-books. Secondly, an application to photoelastic analysis is also made.

Spalling Stress in Oxidized Thermal Barrier Coatings Evaluated by X-Ray Diffraction Method

2005 ◽  
Vol 490-491 ◽  
pp. 631-636 ◽  
Author(s):  
Kenji Suzuki ◽  
Keisuke Tanaka
Keyword(s):  
Thermal Barrier Coatings ◽  
Plane Stress ◽  
Stress Measurement ◽  
Diffraction Method ◽  
High Energy ◽  
Thermally Grown Oxide ◽  
Thermal Barrier ◽  
X Rays ◽  
Barrier Coatings ◽  
X Ray

The spallation of thermal barrier coatings (TBCs) is promoted by thermally grown oxide (TGO). To improve TBCs, it is very important to understand the influence of TGO on the spalling stress. In this study ,the TBCs were oxidized at 1373 K for four diferent periods: 0, 500,1000 and 2000 h. The distribution of the in-plane stress in oxidized TBCs, s1, was obtained by repeating the X-ray stress measurement with low energy X-rays after successive removal of the surface layer. The distribution of the out-of-plane stress, s1− s3, was measured with hard synchrotron X-rays, because high energry X-rays have a large penetration depth. From the results by the low and high energy Xrays, the spalling stress in the oxidized TBCs, s3, was evaluated. The evaluated value of the spalling stress for the oxidized TBC was a small tension beneath the surface, but steeply increased near the interface between the top and bond coating. This large tensile stress near the interface is responsible for the spalling of the top coating.

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