scholarly journals X-Ray Study on Deformation and Fracture of Solid. X-Ray Stress Measurement on Ni3Al Specimens by Using Imaging Plate.

1997 ◽  
Vol 46 (7) ◽  
pp. 756-762
Author(s):  
Toshihiko SASAKI ◽  
Tokimasa GOTO ◽  
Hiroyuki TABATA ◽  
Yukio HIROSE
Keyword(s):  
Stress Measurement ◽  
Imaging Plate ◽  
X Ray ◽  
Deformation And Fracture

Highly Sensitive X-Ray Stress Measurement in Small Areas

1992 ◽  
Vol 36 ◽  
pp. 505-513 ◽  
Author(s):  
Nobuyuki Fujii ◽  
Shigeru Kozaki
Keyword(s):  
Exposure Time ◽  
Stress Measurement ◽  
High Sensitivity ◽  
Measuring Method ◽  
304 Stainless Steel ◽  
Imaging Plate ◽  
List Type ◽  
X Ray ◽  
Small Areas ◽  
The Difference

AbstractThe authors tried a new measuring method for stresses in small areas of ceramics. This method is characterized by the following.1)Applicable to small areas.2)High sensitivity.3)Stress calculations by measuring the average Debye ring radius in view of spotty diffraction rings.4)The use of an imaging processor for (3).5)The use of an imaging plate (IP) for reducing the exposure time.We worked out a computer simulation about errors of the values measured by our method. The result showed a good approximation. With a test piece applied with a certain load, the difference between stresses measured by our method and those by a strain gauge was about 12 percent. We applied this method to the measurement of residual stresses which took place near the silicon nitride (Si3N4)/304 stainless steel brazing point interface. In the case of using an X-ray beam of 100 μm diameter, the exposure time was 90min with a high sensitive X-ray film and 3min with the imaging plate. In the case of an X-ray beam of 40 μm diameter, it was 120 to 190 min with the imaging plate.

scholarly journals X-Ray Study on Deformation and Fracture of Solid. X-Ray Stress Measurement for Oriented TiC Films.

1997 ◽  
Vol 46 (7) ◽  
pp. 750-755 ◽  
Author(s):  
Shouichi EJIRI ◽  
Zheng LIN ◽  
Toshihiko SASAKI ◽  
Yukio HIROSE
Keyword(s):  
Stress Measurement ◽  
X Ray ◽  
Deformation And Fracture

Estimation of the noise in TEM image recorded on “imaging plate”

1987 ◽  
Vol 45 ◽  
pp. 748-749
Author(s):  
T. Oikawa ◽  
N. Mori ◽  
T. Katoh ◽  
Y. Harada ◽  
J. Miyahara ◽  
...  
Keyword(s):  
Low Dose ◽  
Quantum Noise ◽  
Laser Light ◽  
Imaging Plate ◽  
Total System ◽  
Electron Dose ◽  
X Ray ◽  
Image Recording ◽  
Recording Material ◽  
Highly Sensitive

The “Imaging Plate”(IP) is a highly sensitive image recording plate for X-ray radiography. It has been ascertained that the IP has superior properties and high practicability as an image recording material in a TEM. The sensitivity, one of the properties, is about 3 orders higher than that of conventional photo film. The IP is expected to be applied to low dose techniques. In this paper, an estimation of the quantum noise on the TEM image which appears in case of low electron dose on the IP is reported.In this experiment, the JEM-2000FX TEM and an IP having the same size as photo film were used.Figure 1 shows the schematic diagram of the total system including the TEM used in this experiment. In the reader, He-Ne laser light is scanned across the IP, then blue light is emitted from the IP.

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