A bridging fault model for line coverage in the presence of undetected transition faults

2017 ◽  
Author(s):  
Irith Pomeranz
Keyword(s):  
Fault Model ◽  
Transition Faults ◽  
Bridging Fault

scholarly journals Black box delay fault models for non-scan sequential circuits

2018 ◽  
Vol 15 (1) ◽  
pp. 237-256
Author(s):  
Eduardas Bareisa ◽  
Vacius Jusas ◽  
Kestutis Motiejunas ◽  
Liudas Motiejunas ◽  
Rimantas Seinauskas
Keyword(s):  
Fault Model ◽  
Black Box ◽  
Sequential Circuits ◽  
Fault Models ◽  
Delay Fault ◽  
Second Stage ◽  
Transition Faults ◽  
Transition Fault ◽  
Functional Delay ◽  
Two Stages

We presented nine new black box delay fault models for non-scan sequential circuits at the functional level, when the primary inputs and primary outputs are available only. We examined the suggested fault models in two stages. During the first stage of the experiment, we selected the best two fault models for further examination on the base of criterion proposed in the paper. During the second stage, we used the functional delay fault model and two black box delay fault models from the first stage for test selection. The comparison of fault coverages was carried out for transition faults. The obtained results demonstrate that transition fault coverages of tests selected based on proposed black box fault models are similar to coverages of tests selected based on functional delay fault model that uses the inner state of circuit.

scholarly journals Analysis of multibackground memory testing techniques

2010 ◽  
Vol 20 (1) ◽  
pp. 191-205 ◽  
Author(s):  
Ireneusz Mrozek
Keyword(s):  
Initial Conditions ◽  
Fault Coverage ◽  
Fault Model ◽  
Memory Testing ◽  
March Test ◽  
Transition Faults ◽  
Complex Fault ◽  
Pattern Sensitive Faults ◽  
Testing Techniques ◽  
March Tests

Analysis of multibackground memory testing techniquesMarch tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model—such as pattern sensitive faults—their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.

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