Substituting transition faults with path delay faults as a basic delay fault model

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 ◽

10.7873/date2014.241 ◽

2014 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Fault Model ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Delay Fault ◽

Transition Faults

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Substituting transition faults with path delay faults as a basic delay fault model

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 ◽

10.7873/date.2014.241 ◽

2014 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Fault Model ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Delay Fault ◽

Transition Faults

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Transition Path Delay Faults: A New Path Delay Fault Model for Small and Large Delay Defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2007.909796 ◽

2008 ◽

Vol 16 (1) ◽

pp. 98-107 ◽

Cited By ~ 26

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Fault Model ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Transition Path ◽

Large Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Delay Defects

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Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults

Proceedings of International Conference on Computer Aided Design ◽

10.1109/iccad.1996.569900 ◽

2002 ◽

Cited By ~ 6

Author(s):

M. Sivaraman ◽

A.J. Strojwas

Keyword(s):

Fault Coverage ◽

Delay Faults ◽

Estimation Technique ◽

Path Delay ◽

Path Delay Faults ◽

Delay Fault

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Improving diagnostic resolution of delay faults using path delay fault model

Proceedings. 21st VLSI Test Symposium, 2003. ◽

10.1109/vtest.2003.1197673 ◽

2003 ◽

Cited By ~ 5

Author(s):

A.K. Majhi ◽

G. Gronthoud ◽

C. Hora ◽

M. Lousberg ◽

P. Valer ◽

...

Keyword(s):

Fault Model ◽

Delay Faults ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Diagnostic Resolution

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Compaction mechanism to reduce test pattern counts and segmented delay fault testing for path delay faults

10.17077/etd.llxnejgn ◽

2013 ◽

Author(s):

Sharada Jha

Keyword(s):

Test Pattern ◽

Delay Faults ◽

Path Delay ◽

Fault Testing ◽

Path Delay Faults ◽

Delay Fault ◽

Delay Fault Testing

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Parallel pattern fault simulation of path delay faults

Proceedings of the 1989 26th ACM/IEEE conference on Design automation conference - DAC '89 ◽

10.1145/74382.74442 ◽

1989 ◽

Cited By ~ 46

Author(s):

M. Schulz ◽

F. Fink ◽

K. Fuchs

Keyword(s):

Fault Simulation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Parallel Pattern

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A satisfiability-based test generator for path delay faults in combinational circuits

33rd Design Automation Conference Proceedings, 1996 ◽

10.1109/dac.1996.545574 ◽

2005 ◽

Cited By ~ 30

Author(s):

Chih-Ang Chen ◽

S.K. Gupta

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

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Fast test pattern generation for all path delay faults considering various test classes

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246529 ◽

2002 ◽

Cited By ~ 15

Author(s):

K. Fuchs ◽

H.C. Wittmann ◽

K.J. Antreich

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

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Functional-based ATPG for path delay faults

2000 Southwest Symposium on Mixed-Signal Design (Cat. No.00EX390) ◽

10.1109/ssmsd.2000.836465 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Michael ◽

S. Tragoudas

Keyword(s):

Delay Faults ◽

Path Delay ◽

Path Delay Faults

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Exploring Linear Structures of Critical Path Delay Faults to Reduce Test Efforts

2006 IEEE/ACM International Conference on Computer Aided Design ◽

10.1109/iccad.2006.320072 ◽

2006 ◽

Author(s):

Shun-yen Lu ◽

Pei-ying Hsieh ◽

Jing-jia Liou

Keyword(s):

Critical Path ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Linear Structures ◽

Critical Path Delay

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