scholarly journals Application of High-Speed Infrared Imaging to Study Transient Joule Heating in Station Class Zinc Oxide Surge Arresters

2004 ◽  
Author(s):  
R. B. Dinwiddie ◽  
H. Wang ◽  
B. Johnnerfelt
2018 ◽  
Vol 4 (4) ◽  
pp. 4-13
Author(s):  
Vladimir A. SIDOROV ◽  
◽  
Gennady D. DOMASHENKO ◽  
Marat R. AKHMETGAREYEV ◽  
Yurii V. SHCHERBAKOV ◽  
...  

1981 ◽  
Vol PER-1 (11) ◽  
pp. 41-42 ◽  
Author(s):  
M. Oyama ◽  
I. Ohshima ◽  
M. Honda ◽  
M. Yamashita ◽  
S. Kojima

2001 ◽  
Vol 16 (4) ◽  
pp. 576-581 ◽  
Author(s):  
M. Hama ◽  
H. Ishizaka ◽  
J. Shimizu ◽  
S. Nishiki ◽  
I. Kaku

2019 ◽  
Vol 114 (16) ◽  
pp. 161101 ◽  
Author(s):  
Mohsen Rezaei ◽  
Min-Su Park ◽  
Cobi Rabinowitz ◽  
Chee Leong Tan ◽  
Skylar Wheaton ◽  
...  

2014 ◽  
Vol 136 (4) ◽  
Author(s):  
Fahad Mirza ◽  
Gaurang Naware ◽  
Ankur Jain ◽  
Dereje Agonafer

Three-dimensional (3D) through-silicon-via (TSV) technology is emerging as a powerful technology to reduce package footprint, decrease interconnection power, higher frequencies, and provide efficient integration of heterogeneous devices. TSVs provide high speed signal propagation due to reduced interconnect lengths as compared to wire-bonding. The current flowing through the TSVs results in localized heat generation (joule heating), which could be detrimental to the device performance. The effect of joule heating on performance measured by transconductance, electron mobility (e− mobility), and channel thermal noise is presented. Results indicate that joule heating has a significant effect on the junction temperature and subsequently results in 10–15% performance hit.


2004 ◽  
Author(s):  
Kwong-Kit Choi ◽  
Kok Ming Leung ◽  
Theodor Tamir ◽  
Carlos Monroy ◽  
F. Wang ◽  
...  
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