scholarly journals The effects of varying humidity on copper sulfide film formation.

2004 ◽  
Author(s):  
Thomas Michael Mayer ◽  
Nancy A. Missert ◽  
John Charles Barbour ◽  
John Patrick Sullivan ◽  
Robert Guild Copeland ◽  
...  
2002 ◽  
Vol 75 (2) ◽  
pp. 199-214 ◽  
Author(s):  
Jong Myoung Kim ◽  
Wim J. van Ooij

Abstract The sulfidization reaction of brass was studied in a squalene model system by Time-of-Flight Secondary Ion Mass Spectrometry, TOF-SIMS. Fragments of the accelerator were observed on the surface of the brass and their concentration changed with reaction time. Copper sulfide formation in the brass panels was confirmed from the TOF-SIMS spectra. The composition of the brass panels could be studied by varying the analysis depth. TOF-SIMS spectra of copper sulfide layer showed a pattern of cluster formation. Cobalt was observed to exist in the sulfide film partly in combination with carbon. Evidence was found of covalent bonding between copper sulfides and squalene.


2010 ◽  
Vol 1249 ◽  
Author(s):  
Uri Cohen

AbstractCopper-sulfide is proposed as a selective self-aligned passivation capping film on Cu lines, to improve the lines immunity against electromigration. Copper-sulfide is tenacious, having excellent adhesion (chemically bonded) to the underlying copper lines and strong adhesion to the overlying dielectric capping barrier. Contrary to other passivation schemes, Cu sulfidation is 100% selective. The sulfidation can be done by a wet or a dry process. A very thin copper-sulfide film (of about 25-100Å) will be required, and no significant increase of RC delay is expected.


CORROSION ◽  
2007 ◽  
Vol 63 (2) ◽  
pp. 135-144 ◽  
Author(s):  
J. Smith ◽  
Z. Qin ◽  
F. King ◽  
L. Werme ◽  
D. W. Shoesmith

2020 ◽  
Vol 72 (1-2) ◽  
pp. 300-307 ◽  
Author(s):  
Mengnan Guo ◽  
Jian Chen ◽  
Taylor Martino ◽  
Christina Lilja ◽  
Johannes A. Johansson ◽  
...  

2003 ◽  
Vol 9 (S02) ◽  
pp. 380-381
Author(s):  
M. J. Campin ◽  
J. C. Barbour ◽  
J. W. Braithwaite ◽  
P. P. Provencio ◽  
J. G. Zhu

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