scholarly journals A revolutionary rotatable electron energy analyzer for advanced high-resolution spin-polarized photoemission studies. Final Report

1999 ◽  
Author(s):  
G. D. Waddill ◽  
R. F. Willis
Keyword(s):  
High Resolution ◽  
Electron Energy ◽  
Final Report ◽  
Energy Analyzer ◽  
Spin Polarized

Adapting a compact Mott spin polarimeter to a large commercial electron energy analyzer for spin‐polarized electron spectroscopy

1993 ◽  
Vol 64 (12) ◽  
pp. 3474-3479 ◽  
Author(s):  
Di‐Jing Huang ◽  
Jae‐Yong Lee ◽  
Jih‐Shih Suen ◽  
G. A. Mulhollan ◽  
A. B. Andrews ◽  
...  
Keyword(s):  
Electron Energy ◽  
Electron Spectroscopy ◽  
Energy Analyzer ◽  
Spin Polarized

Spin -Orbit Coupling in the O-2 Anion

1995 ◽  
Vol 50 (11) ◽  
pp. 1041-1044 ◽  
Author(s):  
J. Schiedt ◽  
R. Weinkauf
Keyword(s):  
High Resolution ◽  
Electron Energy ◽  
Ground State ◽  
Photoelectron Spectroscopy ◽  
Spin Orbit Coupling ◽  
Spin Orbit ◽  
Energy Analyzer ◽  
Orbit Splitting ◽  
Spin Orbit Splitting ◽  
Good Agreement

Abstract We could resolve the spin-orbit splitting of 160 ± 4 cm-1 in the 2II ground state of O2- anions by high resolution photodetachment photoelectron spectroscopy. The observed splitting is in good agreement with the theoretically derived value. Our directly measured electron affinity of O 2 is 450 ± 2 meV and deviates within experiment errors from previous values. kHz repetition rate was applied to avoid space charge and improve electron energy resolution in a time-of-flight electron energy analyzer.

Atomic resolution characterisation of interface structures by Electron Energy Loss Spectroscopy

1993 ◽  
Vol 51 ◽  
pp. 576-577
Author(s):  
N. D. Browning ◽  
M. M. McGibbon ◽  
M. F. Chisholm ◽  
S. J. Pennycook
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Imaging Technique ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Reference Image ◽  
The Impact ◽  
Electron Energy Loss

The recent development of the Z-contrast imaging technique for the VG HB501 UX dedicated STEM, has added a high-resolution imaging facility to a microscope used mainly for microanalysis. This imaging technique not only provides a high-resolution reference image, but as it can be performed simultaneously with electron energy loss spectroscopy (EELS), can be used to position the electron probe at the atomic scale. The spatial resolution of both the image and the energy loss spectrum can be identical, and in principle limited only by the 2.2 Å probe size of the microscope. There now exists, therefore, the possibility to perform chemical analysis of materials on the scale of single atomic columns or planes.In order to achieve atomic resolution energy loss spectroscopy, the range over which a fast electron can cause a particular excitation event, must be less than the interatomic spacing. This range is described classically by the impact parameter, b, which ranges from ~10 Å for the low loss region of the spectrum to <1Å for the core losses.

Some problems and solutions in electron energy loss spectroscopy of cryosections

1993 ◽  
Vol 51 ◽  
pp. 566-567
Author(s):  
Zhifeng Shao ◽  
Ruoya Ho ◽  
Andrew P. Somlyo
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Biological Research ◽  
Specimen Thickness ◽  
Elemental Distribution ◽  
Electron Dose ◽  
Simple Assumption ◽  
Electron Energy Loss

Electron energy loss spectroscopy (EELS) has been a powerful tool for high resolution studies of elemental distribution, as well as electronic structure, in thin samples. Its foundation for biological research has been laid out nearly two decades ago, and in the subsequent years it has been subjected to rigorous, but by no means extensive research. In particular, some problems unique to EELS of biological samples, have not been fully resolved. In this article we present a brief summary of recent methodological developments, related to biological applications of EELS, in our laboratory. The main purpose of this work was to maximize the signal to noise ratio (S/N) for trace elemental analysis at a minimum dose, in order to reduce the electron dose and/or time required for the acquisition of high resolution elemental maps of radiation sensitive biological materials.Based on the simple assumption of Poisson distribution of independently scattered electrons, it had been generally assumed that the optimum specimen thickness, at which the S/N is a maximum, must be the total inelastic mean free path of the beam electron in the sample.

Fast parallel acquisition electron energy analyzer

1999 ◽  
Author(s):  
Christopher G. H. Walker ◽  
Andrew Walker ◽  
Ranjan Badheka ◽  
Sumio Kumashiro ◽  
Marcus Jacka ◽  
...  
Keyword(s):  
Electron Energy ◽  
Energy Analyzer ◽  
Parallel Acquisition
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