Fast parallel acquisition electron energy analyzer

Author(s):  
Christopher G. H. Walker ◽  
Andrew Walker ◽  
Ranjan Badheka ◽  
Sumio Kumashiro ◽  
Marcus Jacka ◽  
...  
1999 ◽  
Vol 70 (5) ◽  
pp. 2282-2287 ◽  
Author(s):  
M. Jacka ◽  
M. Kirk ◽  
M. M. El Gomati ◽  
M. Prutton

2008 ◽  
Vol 1 (1) ◽  
pp. 413-423 ◽  
Author(s):  
G. Lebedev ◽  
C. Jozwiak ◽  
N. Andresen ◽  
A. Lanzara ◽  
Z. Hussain

2007 ◽  
Vol 91 (17) ◽  
pp. 173506 ◽  
Author(s):  
S. A. Hilbert ◽  
B. Barwick ◽  
M. Fabrikant ◽  
C. J. G. J. Uiterwaal ◽  
H. Batelaan

1993 ◽  
Vol 64 (12) ◽  
pp. 3474-3479 ◽  
Author(s):  
Di‐Jing Huang ◽  
Jae‐Yong Lee ◽  
Jih‐Shih Suen ◽  
G. A. Mulhollan ◽  
A. B. Andrews ◽  
...  

1986 ◽  
Vol 57 (8) ◽  
pp. 1494-1500 ◽  
Author(s):  
D. W. Turner ◽  
I. R. Plummer ◽  
H. Q. Porter

1973 ◽  
Vol 17 ◽  
pp. 498-508
Author(s):  
K. Hayakawa ◽  
H. Okano ◽  
S. Kawase ◽  
S. Yamamoto

AbstractAn electron probe Auger emission microanalyzer has been constructed. The instrument is composed of an electromagnetic focussing primary probe column and a cylindrical mirror electron energy analyzer. By using this instrument, Auger electron spectroscopy studies have been carried out in the modes of both emission microanalysis and emission micrograph. The feasibility o£ this method is investigated through its application to the study of iron surface.


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