Influence of grain boundaries on the electrical properties of polycrystalline-silicon films. Progress report, 1980-1981

Mapping Intimacies ◽

10.2172/6557482 ◽

1981 ◽

Author(s):

D.G. Ast

Keyword(s):

Electrical Properties ◽

Grain Boundaries ◽

Polycrystalline Silicon ◽

Progress Report ◽

Silicon Films ◽

Polycrystalline Silicon Films

Download Full-text

Some investigations on the influence of defects/grain boundaries on photovoltaic mechanisms in polycrystalline silicon films

Solar Cells ◽

10.1016/0379-6787(80)90070-8 ◽

1980 ◽

Vol 1 (3) ◽

pp. 237-250 ◽

Cited By ~ 8

Author(s):

B.L. Sopori ◽

A. Baghdadi

Keyword(s):

Grain Boundaries ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films

Download Full-text

Current Paths over Grain Boundaries in Polycrystalline Silicon Films

Japanese Journal of Applied Physics ◽

10.1143/jjap.40.l97 ◽

2001 ◽

Vol 40 (Part 2, No. 2A) ◽

pp. L97-L99 ◽

Cited By ~ 4

Author(s):

Mutsumi Kimura ◽

Satoshi Inoue ◽

Tatsuya Shimoda ◽

Toshiyuki Sameshima

Keyword(s):

Grain Boundaries ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films

Download Full-text

TCAD Simulation of the Influence of Grain Boundaries on the Temperature Dependence of Conductivity in Polycrystalline Silicon Films

2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) ◽

10.1109/edm.2018.8434950 ◽

2018 ◽

Author(s):

Vladislava I. Saburova ◽

Victor A. Gridchin ◽

Gennady N. Kamaev ◽

Igor G. Neizvestnyi ◽

Alexei S. Cherkaev

Keyword(s):

Temperature Dependence ◽

Grain Boundaries ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Temperature Dependence Of Conductivity ◽

Tcad Simulation ◽

Polycrystalline Silicon Films

Download Full-text

Recrystallization behaviour and electrical properties of germanium ion implanted polycrystalline silicon films

Journal of Materials Science Materials in Electronics ◽

10.1007/bf00180785 ◽

1996 ◽

Vol 7 (6) ◽

Author(s):

Myeon-Koo Kang ◽

Takayuki Matsui ◽

Hiroshi Kuwano

Keyword(s):

Electrical Properties ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films ◽

Ion Implanted

Download Full-text

Effect of grain boundaries on the formation of luminescent porous silicon from polycrystalline silicon films

Applied Physics Letters ◽

10.1063/1.112869 ◽

1994 ◽

Vol 65 (14) ◽

pp. 1787-1789 ◽

Cited By ~ 28

Author(s):

P. Guyader ◽

P. Joubert ◽

M. Guendouz ◽

C. Beau ◽

M. Sarret

Keyword(s):

Porous Silicon ◽

Grain Boundaries ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films

Download Full-text

Electrical properties and grain size of phosphorus in situ doped and cw laser annealed polycrystalline silicon films

Vacuum ◽

10.1016/0042-207x(85)90251-9 ◽

1985 ◽

Vol 35 (8) ◽

pp. 341

Keyword(s):

Grain Size ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Cw Laser ◽

Polycrystalline Silicon Films

Download Full-text

Electrical properties of polycrystalline silicon films formed from amorphous silicon films by flash lamp annealing

Current Applied Physics ◽

10.1016/j.cap.2010.10.008 ◽

2011 ◽

Vol 11 (3) ◽

pp. 604-607 ◽

Cited By ~ 6

Author(s):

Takuya Nishikawa ◽

Keisuke Ohdaira ◽

Hideki Matsumura

Keyword(s):

Electrical Properties ◽

Amorphous Silicon ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Flash Lamp ◽

Polycrystalline Silicon Films

Download Full-text

ChemInform Abstract: ELECTRICAL PROPERTIES OF THERMALLY AND LASER ANNEALED POLYCRYSTALLINE SILICON FILMS HEAVILY DOPED WITH ARSENIC AND PHOSPHORUS

Chemischer Informationsdienst ◽

10.1002/chin.198250012 ◽

1982 ◽

Vol 13 (50) ◽

Author(s):

S. SOLMI ◽

M. SEVERI ◽

R. ANGELUCCI ◽

L. BALDI ◽

R. BILENCHI

Keyword(s):

Electrical Properties ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Heavily Doped ◽

Polycrystalline Silicon Films

Download Full-text

Electrically inactive grain boundaries in rapid thermal annealed boron‐implanted polycrystalline silicon films

Applied Physics Letters ◽

10.1063/1.102879 ◽

1990 ◽

Vol 56 (25) ◽

pp. 2536-2538 ◽

Cited By ~ 4

Author(s):

A. Almaggoussi ◽

J. Sicart ◽

J. L. Robert ◽

G. Chaussemy ◽

A. Laugier

Keyword(s):

Grain Boundaries ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films

Download Full-text

Electrical properties and grain size of phosphorusinsitudoped and cw laser annealed polycrystalline silicon films

Journal of Applied Physics ◽

10.1063/1.331341 ◽

1982 ◽

Vol 53 (7) ◽

pp. 5086-5092 ◽

Cited By ~ 2

Author(s):

T. Ternisien d’Ouville ◽

D. P. Vu ◽

A. Perio ◽

A. Baudrant

Keyword(s):

Grain Size ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Cw Laser ◽

Polycrystalline Silicon Films

Download Full-text