scholarly journals Calculation of electron emission from a tantalum foil irradiated by 100-kV and 50-kV x-rays

1998 ◽  
Author(s):  
M Berger
Keyword(s):  
Electron Emission ◽  
Tantalum Foil ◽  
X Rays

Kinetics of Electron Emission from TGS Crystals Irradiated by X-Rays

2006 ◽  
Vol 334 (1) ◽  
pp. 181-185
Author(s):  
O. V. Rogazinskaya ◽  
S. D. Milovidova ◽  
A. A. Sidorkin ◽  
A. B. Plaksitskii ◽  
V. A. Sidorkin ◽  
...  
Keyword(s):  
Electron Emission ◽  
X Rays ◽  
Kinetics Of

scholarly journals Production of Different Non-Thermal Electron Groups in Small Solar Flares

1972 ◽  
Vol 14 ◽  
pp. 822-823
Author(s):  
S. R. Kane
Keyword(s):  
Electron Emission ◽  
Solar Flares ◽  
Electron Acceleration ◽  
X Rays ◽  
Thermal Electron ◽  
X Ray ◽  
Type Iii

Using the measurements of impulsive solar X-rays made with the OGO-5 satellite to identify the flash phase electron acceleration in solar flares of Hα-importance ≲ 1, the satellite and ground based observations are analyzed to study the origin of the different groups of non-thermal electrons responsible for the impulsive X-ray, impulsive microwave, type III radio and interplanetary electron emission.

scholarly journals The efficiency of secondary electron emission

1933 ◽  
Vol 139 (838) ◽  
pp. 436-447 ◽  
Keyword(s):  
Velocity Distribution ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Inelastic Collisions ◽  
Secondary Beam ◽  
X Rays ◽  
Secondary Electrons ◽  
The Third ◽  
Primary Electrons

The velocity distribution of the secondary electrons produced by bombarding a metallic face with a stream of primary electrons has been a matter of interest ever since the beginning of the study of secondary electron emission. As early as in 1908, Richardson and von Baeyer independently showed that slow moving electrons were copiously reflected from conducting faces. Farnsworth showed that for primary electrons having velocities less than 9 volts, most of the secondary electrons had velocities equal to the primary. As the primary potential was increased, the percentage of the reflected electrons decreased gradually but was appreciable at 110 volts. Davisson and Kunsman obtained reflected electrons even at primary potentials of 1000 and 1500 volts in the cases of some metal faces. At higher potentials we have also the electrons that undergo the Davisson and Germer scattering from the many crystal facets on the bombarded targets. As the potential is increased, the number of electrons with low velocities increases steadily and at large applied potentials, we have a large percentage of these in the secondary beam. These conclusions followed as a result of the work of Farnsworth who studied the distribution of velocities of the secondary electrons by the retarding potential method. He did not actually calculate the energy distribution from his curves but has drawn attention to the above conclusions. A careful investigation of the velocity distribution of the secondary electrons from various conducting faces was made by Rudberg at primary potentials ranging up to about 1000 volts. He adopted a magnetic deflection method similar to the one used in the analysis of the β rays and of the electrons excited by X-rays. The method had indeed been used by previous workers for the study of secondary emission, but Rudberg improved the technique considerably and obtained better focussing conditions. His results suggest that there are three groups of electrons in the secondary beam. The first group contains electrons returning with the same velocity as the primary. In the second group of electrons, we have those which undergo inelastic collisions with the orbital and structure electrons and hence are returned with some loss of energy. Richardson has drawn attention to the well-marked minimum between the two groups in Rudberg’s curves and infers that free electrons are not involved in the collisions. Finally there is the third group which contains the slow secondary electrons. The second and the third groups appear to be definitely connected with each other since they are both predominant at high primary potentials and become negligible at low primary potentials. Richardson suggests that the third group is the result of the excitation accompanying the inelastic collisions.

scholarly journals Total secondary electron emission from polycrystalline Nickel

1930 ◽  
Vol 128 (807) ◽  
pp. 41-56 ◽  
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Considerable Proportion ◽  
Secondary Beam ◽  
X Rays ◽  
Applied Potential ◽  
Polycrystalline Nickel ◽  
Low Velocity ◽  
Secondary Electrons

The importance of secondary electron emission in its relation to the excitation of soft X-rays has been pointed out in a recent paper by Prof. O. W. Richardson. He has shown that at every potential where there is an increased excitation of soft X-rays, there is correspondingly an increase in the emission of secondary electrons, and has discussed at some length the mechanism of the generation of secondary electrons. It was therefore felt that a much clearer idea of the phenomenon of soft X-ray excitation from metallic surfaces could be had by studying the secondary electron emission from polycrystalline and single crystal faces. As early as in 1908 Richardson showed that slowly moving electrons are reflected in considerable proportion from metallic plates. Davisson and Kunsman, in a series of papers commencing from 1921, showed that at low voltages up to about 9 volts most of the secondary electrons were purely reflected electrons with velocities the same as the incident electrons. The percentage of the reflected electrons fell rapidly as the applied potential was increased above 9 volts, while that of low velocity electrons increased steadily. Farnsworth, with improved apparatus, added much valuable information regarding the generation of secondary electrons and the conditions operating in such cases. These observers showed that the total emission of secondary electrons from a metal surface depended on the applied potential, the nature of the surface and the previous heat treatment of the metal. They also found that the ratio of the secondary beam to the primary increases with applied potential and becomes greater than 1 after a certain potential, depending on the nature of the bombarded metal, is reached.

Magnetic Spectro-Microscopy Using Magneto-Dichroic Effects in Photon-Induced Auger Electron Emission

1993 ◽  
Vol 313 ◽  
Author(s):  
C.M. Schneider ◽  
K. Meinel ◽  
K. Holldack ◽  
H.P. Oepen ◽  
M. Grunze ◽  
...  
Keyword(s):  
Single Crystals ◽  
Domain Structure ◽  
Electron Emission ◽  
Auger Electron ◽  
Magnetic Domain ◽  
X Rays ◽  
Auger Electrons ◽  
New Approach ◽  
Circularly Polarized ◽  
Microscopic Scale

ABSTRACTWe have imaged the magnetic domain structure on the surface of Fe (100) single crystals using energy resolved photoemission microscopy with circularly polarized soft x-rays. The contrast between different domains arises due to Magneto-dichroic effects in the emitted Auger electrons. This new approach offers a surface sensitive way to combine chemical and magnetic information on a microscopic scale.

Characteristics of secondary electron emission from CsI induced by x rays with energies up to 100 keV

1993 ◽  
Vol 74 (12) ◽  
pp. 7506-7509 ◽  
Author(s):  
A. Gibrekhterman ◽  
A. Akkerman ◽  
A. Breskin ◽  
R. Chechik
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
X Rays

Enhanced DNA Damage Induced by Secondary Electron Emission from a Tantalum Surface Exposed to Soft X Rays

2006 ◽  
Vol 165 (3) ◽  
pp. 365-371 ◽  
Author(s):  
Zhongli Cai ◽  
Pierre Cloutier ◽  
Darel Hunting ◽  
Léon Sanche
Keyword(s):  
Dna Damage ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
X Rays

scholarly journals Model for electron emission of high-Z radio-sensitizing nanoparticle irradiated by X-rays

2014 ◽  
Vol 16 (7) ◽  
Author(s):  
R. Casta ◽  
J.-P. Champeaux ◽  
P. Cafarelli ◽  
P. Moretto-Capelle ◽  
M. Sence
Keyword(s):  
Electron Emission ◽  
X Rays
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