scholarly journals Booster beam loss due to beam-residual gas charge exchange

1988 ◽  
Author(s):  
Hseuh H. C.
Keyword(s):  
Charge Exchange ◽  
Beam Loss ◽  
Residual Gas

Population inversion due to charge-exchange interaction of plasma jets from plasma focus with residual gas

1998 ◽  
Vol 58 (6) ◽  
pp. 7819-7822 ◽  
Author(s):  
A. Engel ◽  
K. N. Koshelev ◽  
Yu. V. Sidelnikov ◽  
S. S. Churilov ◽  
C. Gavrilescu ◽  
...  
Keyword(s):  
Exchange Interaction ◽  
Charge Exchange ◽  
Plasma Focus ◽  
Population Inversion ◽  
Plasma Jets ◽  
Residual Gas

Beam loss in heavy-ion fusion accelerators due to charge exchange scattering

1993 ◽  
Vol 106 (11) ◽  
pp. 1621-1630 ◽  
Author(s):  
D. Budicin ◽  
I. Hofmann ◽  
M. Conte ◽  
R. Schulze ◽  
F. Melchert ◽  
...  
Keyword(s):  
Charge Exchange ◽  
Heavy Ion ◽  
Beam Loss ◽  
Exchange Scattering ◽  
Heavy Ion Fusion

scholarly journals Localization of the large-angle foil-scattering beam loss caused by the multiturn charge-exchange injection

2013 ◽  
Vol 16 (7) ◽  
Author(s):  
Shinichi Kato ◽  
Kazami Yamamoto ◽  
Masahiro Yoshimoto ◽  
Hiroyuki Harada ◽  
Michikazu Kinsho
Keyword(s):  
Charge Exchange ◽  
Large Angle ◽  
Beam Loss

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

Residual Gas Reactions in the Electron Microscope: I. Qualitative Observations on the Water Gas Reaction

1968 ◽  
Vol 26 ◽  
pp. 292-293
Author(s):  
Richard E. Hartman ◽  
Roberta S. Hartman ◽  
Peter L. Ramos
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Gas Phase ◽  
Absolute Temperature ◽  
Residual Gas ◽  
Gas Reactions ◽  
Image Position ◽  
The Right ◽  
Water Gas ◽  
Thinning Rate

The action of water and the electron beam on organic specimens in the electron microscope results in the removal of oxidizable material (primarily hydrogen and carbon) by reactions similar to the water gas reaction .which has the form:The energy required to force the reaction to the right is supplied by the interaction of the electron beam with the specimen.The mass of water striking the specimen is given by:where u = gH2O/cm2 sec, PH2O = partial pressure of water in Torr, & T = absolute temperature of the gas phase. If it is assumed that mass is removed from the specimen by a reaction approximated by (1) and that the specimen is uniformly thinned by the reaction, then the thinning rate in A/ min iswhere x = thickness of the specimen in A, t = time in minutes, & E = efficiency (the fraction of the water striking the specimen which reacts with it).

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