scholarly journals Localization of the large-angle foil-scattering beam loss caused by the multiturn charge-exchange injection

2013 ◽  
Vol 16 (7) ◽  
Author(s):  
Shinichi Kato ◽  
Kazami Yamamoto ◽  
Masahiro Yoshimoto ◽  
Hiroyuki Harada ◽  
Michikazu Kinsho
Keyword(s):  
Charge Exchange ◽  
Large Angle ◽  
Beam Loss

Large-Angle Charge-Exchange Scattering of Pions byHe3at 200, 250, 275, and 290 MeV

1979 ◽  
Vol 42 (3) ◽  
pp. 159-162 ◽  
Author(s):  
J. Källne ◽  
H. A. Thiessen ◽  
C. L. Morris ◽  
S. L. Verbeck ◽  
M. J. Devereaux ◽  
...  
Keyword(s):  
Charge Exchange ◽  
Large Angle ◽  
Exchange Scattering

Beam loss in heavy-ion fusion accelerators due to charge exchange scattering

1993 ◽  
Vol 106 (11) ◽  
pp. 1621-1630 ◽  
Author(s):  
D. Budicin ◽  
I. Hofmann ◽  
M. Conte ◽  
R. Schulze ◽  
F. Melchert ◽  
...  
Keyword(s):  
Charge Exchange ◽  
Heavy Ion ◽  
Beam Loss ◽  
Exchange Scattering ◽  
Heavy Ion Fusion

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

Parallel Detection of Electron Energy Loss Spectra in Direct Mode

1990 ◽  
Vol 48 (2) ◽  
pp. 82-83
Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Energy Resolution ◽  
Large Angle ◽  
Maximum Energy ◽  
Semiconductor Detectors ◽  
Parallel Detection ◽  
Photodiode Arrays ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.

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