Rocket Model Satellite Positive Ion Beam System.

1978 ◽  
Author(s):  
T. Masek
Keyword(s):  
Ion Beam ◽  
Beam System ◽  
Positive Ion

Satellite Positive Ion Beam System

1976 ◽  
Author(s):  
T. MASEK ◽  
H. COHEN
Keyword(s):  
Ion Beam ◽  
Beam System ◽  
Positive Ion

Satellite Positive-Ion-Beam System

1978 ◽  
Vol 15 (1) ◽  
pp. 27-33 ◽  
Author(s):  
T. D. Masek ◽  
H. A. Cohen
Keyword(s):  
Ion Beam ◽  
Beam System ◽  
Positive Ion

A 1 eV - 1000 eV ion beam system designed for the calibration of low-energy ion mass spectrometers

2020 ◽  
Author(s):  
Yiren Li ◽  
Bin Miao ◽  
Xinjun Hao ◽  
Tielong Zhang ◽  
Yuming Wang
Keyword(s):  
Imaging System ◽  
Ion Beam ◽  
Low Energy ◽  
Beam Diagnostics ◽  
Large Area ◽  
Mass Spectrometers ◽  
Faraday Cup ◽  
Beam System ◽  
Electrostatic Lenses ◽  
Positive Ion

<p>For the calibration of space plasma analyzers, in particular low-energy ion mass spectrometers, a low energy ion beam system was developed. The positive ion beam is produced by a hot-cathode penning source and modified by a series of electrostatic lenses. And a 75 mm diameter 2-D imaging system and a Faraday cup mounted on movable arms are used for ion beam diagnostics. With protons as primary species, the system provides an ion beam in the energy range of 1 eV - 1000 eV with a large area ( ~ 50 cm<sup>2</sup>), highly parallel ( ± 0.5°), and spatially uniform ( ± 5%).</p>

Metallic Nanoneedles Arrays for TEM Sample Preparation “Lift-Out”

2012 ◽  
Author(s):  
Romaneh Jalilian ◽  
David Mudd ◽  
Neil Torrez ◽  
Jose Rivera ◽  
Mehdi M. Yazdanpanah ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Electron Microscope ◽  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam System ◽  
Transmission Electron ◽  
Nanoneedle Array ◽  
Superior Mechanical Properties ◽  
And Performance

Abstract The sample preparation for transmission electron microscope can be done using a method known as "lift-out". This paper demonstrates a method of using a silver-gallium nanoneedle array for a quicker sharpening process of tungsten probes with better sample viewing, covering the fabrication steps and performance of needle-tipped probes for lift-out process. First, an array of high aspect ratio silver-gallium nanoneedles was fabricated and coated to improve their conductivity and strength. Then, the nanoneedles were welded to a regular tungsten probe in the focused ion beam system at the desired angle, and used as a sharp probe for lift-out. The paper demonstrates the superior mechanical properties of crystalline silver-gallium metallic nanoneedles. Finally, a weldless lift-out process is described whereby a nano-fork gripper was fabricated by attaching two nanoneedles to a tungsten probe.

FIB Micromachining and Nano-Structure Fabrication

1999 ◽  
Author(s):  
Raymond A. Lee ◽  
Patrick J. Wolpert
Keyword(s):  
High Precision ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Biological Applications ◽  
Optical Lens ◽  
Nano Structure ◽  
Beam System ◽  
Afm Tips ◽  
Established Technique ◽  
Made In

Abstract FIB Micromachining has long been an established technique, but until recently it has been overshadowed by the more mainstream semiconductor application of the Focused Ion Beam system. Nano- Structure fabrication using the FIB system has become more popular recently due to several factors. The need for sub-micron structures have grown significantly due to a need for enhanced optical and biological applications. Another reason for the growth in micromachining is the improvement made in the ability of FIB systems to produce geometric shapes with high precision. With the latest high-end FIB systems, it is possible to produce microstructures with tens of nano-meters of precision. Optical lens, AFM tips, and nano-apertures are all part of the growing application for FIB Micromachining. This paper will discuss the ability and limitations of the FIB system and some possible application for FIB Micromachining.

Forced neutralisation of a positive ion beam by negative ions

1975 ◽  
Vol 17 (7-8) ◽  
pp. 525-538 ◽  
Author(s):  
J Pelletier ◽  
C Pomot
Keyword(s):  
Ion Beam ◽  
Negative Ions ◽  
Positive Ion
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