An optical method for evaluating the degradation mechanism of a developing RuO2 thick film resistor element for power modules
2017 ◽
Vol 125
(6)
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pp. 476-481
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Keyword(s):
2014 ◽
Vol 617
◽
pp. 367-373
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1991 ◽
Vol 14
(3)
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pp. 592-596
Keyword(s):
Keyword(s):
2010 ◽
Vol 2010
(1)
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pp. 000752-000759
1978 ◽
Vol 1
(4)
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pp. 383-392
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