scholarly journals Using Graphene-powder-based Thermal Interface Material for High Lumen LED Array Chip: An Experimental Study of Heat Dissipation

2020 ◽  
Vol 32 (12) ◽  
pp. 4277
Author(s):  
Chih-Neng Hsu ◽  
Chun-Chih Chen ◽  
Chen-Hui Chang ◽  
Cheng-Chi Wang
Keyword(s):  
Experimental Study ◽  
Heat Dissipation ◽  
Thermal Interface Material ◽  
Thermal Interface ◽  
Led Array

Thermal Resistance Analysis of Sn-Bi Solder Paste Used as Thermal Interface Material for Power Electronics Applications

2014 ◽  
Vol 136 (1) ◽  
Author(s):  
Rui Zhang ◽  
Jian Cai ◽  
Qian Wang ◽  
Jingwei Li ◽  
Yang Hu ◽  
...  
Keyword(s):  
Thermal Resistance ◽  
Power Electronics ◽  
Heat Dissipation ◽  
Laser Flash ◽  
Acoustic Microscopy ◽  
Thermal Interface Material ◽  
Solder Paste ◽  
Good Reliability ◽  
Thermal Interface ◽  
Power Modules

To promote heat dissipation in power electronics, we investigated the thermal conduction performance of Sn-Bi solder paste between two Cu plates. We measured the thermal resistance of Sn-Bi solder paste used as thermal interface material (TIM) by laser flash technique, and a thermal resistance less than 5 mm2 K/W was achieved for the Sn-Bi TIM. The Sn-Bi solder also showed a good reliability in terms of thermal resistance after thermal cycling, indicating that it can be a promising candidate for the TIM used for power electronics applications. In addition, we estimated the contact thermal resistance at the interface between the Sn-Bi solder and the Cu plate with the assistance of scanning acoustic microscopy. The experimental data showed that Sn-Bi solder paste could be a promising adhesive material used to attach power modules especially with a large size on the heat sink.

A review of thermal interface material fabrication method toward enhancing heat dissipation

2020 ◽  
Author(s):  
Raihana Bahru ◽  
Mohd Faiz Muaz Ahmad Zamri ◽  
Abd Halim Shamsuddin ◽  
Norazuwana Shaari ◽  
Mohd Ambri Mohamed
Keyword(s):  
Heat Dissipation ◽  
Thermal Interface Material ◽  
Fabrication Method ◽  
Thermal Interface ◽  
Material Fabrication

Silicone Gel Thermal Interface Materials for High Heat Dissipation and Thermo-Mechanical Stress Management for Good Reliability Performance

2005 ◽  
Author(s):  
J. C. Matayabas ◽  
Vassou LeBonheur
Keyword(s):  
High Performance ◽  
Heat Dissipation ◽  
High Heat ◽  
Thermal Interface Material ◽  
Market Demand ◽  
Heat Spreader ◽  
Good Reliability ◽  
Theoretical Understanding ◽  
Thermal Interface ◽  
Silicone Gel

The recent trend in microprocessor architecture has been to increase the number of transistors (higher power), shrink processor size (smaller die), and increase clock speeds (higher frequency) in order to meet the market demand for high performance microprocessors. These have resulted in the escalation of power dissipation as well as the heat flux at the silicon die level. The Intel packaging technology development group has been challenged to develop packaging solutions that not only meet the package thermal targets but also the reliability requirements. As a result, an integrated heat spreading (IHS) package was developed, comprising a Cu based heat spreader and a first level thermal interface material (TIM) between the die and the heat spreader. Due to CTE mismatches between its different elements, the IHS package is subjected to high level of thermo-mechanical stresses which lead to severe failures post reliability testing. A significant amount of theoretical understanding of thermal resistance has been developed and applied to the development of TIM formulations, and it was found that the thermo-mechanical properties of the TIM material need to be optimized to mitigate the package reliability stresses. Several material and process solutions have been investigated using fundamental approaches, and, as a result of these efforts, low stress silicone gel TIM’s were developed. This paper provides an overview of the silicone gel TIM technologies investigated at Intel, and the key learnings from the fundamental material and package integration studies.

Thermal Conductivity Enhancement in Polymer-Clay Nanocomposite Using Casting Techniques

2020 ◽  
Vol 995 ◽  
pp. 15-20
Author(s):  
Ivy Ann C. Razonado ◽  
Emee Grace T. Suarnaba ◽  
Lawrence V. Madriaga ◽  
Leslie Joy L. Diaz
Keyword(s):  
Thermal Conductivity ◽  
Heat Dissipation ◽  
Thermal Conductivity Coefficient ◽  
Unsaturated Polyester ◽  
Tape Casting ◽  
Thermal Interface Material ◽  
Thermal Interface ◽  
Conductivity Enhancement ◽  
Casting Technique ◽  
Polymer Clay Nanocomposite

Nowadays, there is a need for efficiency and miniaturization in electronic products. However, in the chip level, heat dissipation can limit the performance of these gadgets. Semiconductor industries addressed this thermal management challenge by using thermal interface material. Previous studies have shown that polymer-clay nanocomposite has an enhanced thermal conductivity which can be used as a thermal interface material. In this study, the aim was to determine the effect of casting techniques on the microstructure and thermal conductivity of the polymer-clay nanocomposites. Solution intercalation method was used in fabricating the 5vol% polymer-clay nanocomposite. Organo-modified montmorillonite (MMT) was dispersed in unsaturated polyester (UP) matrix by means of high frequency ultrasonication and formed using two casting techniques; mold casting and tape casting. Results showed a slight increase in the thermal conductivity coefficient of the tape-casted samples at 2.99 W/m-K compared to the mold-casted samples at 2.87 W/m-K. Transmission electron microscopy (TEM) and x-ray diffraction (XRD) results exhibited dispersed microstructure for both casting techniques. Polymer intercalation of ~16% increase in d-spacing of clay for mold-casted samples and with a ~20% increase in d-spacing of clay for tape-casted samples were observed. With these microstructure modifications, the increase in the thermal conductivity coefficient of the tape-casted samples can be attributed to the shear force employed by the tape casting technique.

Maximum Resolution of a Probe-Based, Steady-State Thermal Interface Material Characterization Instrument

2016 ◽  
Vol 139 (1) ◽  
Author(s):  
Ronald J. Warzoha ◽  
Andrew N. Smith ◽  
Maurice Harris
Keyword(s):  
Steady State ◽  
Thermal Resistance ◽  
High Performance ◽  
Heat Dissipation ◽  
Thermal Contact ◽  
Thermal Interface Material ◽  
Interfacial Thermal Resistance ◽  
Uniform Heat Flux ◽  
Thermal Probe ◽  
Thermal Interface

Thermal interface materials (TIMs) constitute a critical component for heat dissipation in electronic packaging systems. However, the extent to which a conventional steady-state thermal characterization apparatus can resolve the interfacial thermal resistance across current high-performance interfaces (RT < 1 mm2⋅K/W) is not clear. In this work, we quantify the minimum value of RT that can be measured with this instrument. We find that in order to increase the resolution of the measurement, the thermal resistance through the instrument's reference bars must be minimized relative to RT. This is practically achieved by reducing reference bar length. However, we purport that the minimization of reference bar length is limited by the effects of thermal probe intrusion along the primary measurement pathway. Using numerical simulations, we find that the characteristics of the probes and surrounding filler material can significantly impact the measurement of temperature along each reference bar. Moreover, we find that probes must be spaced 15 diameters apart to maintain a uniform heat flux at the interface, which limits the number of thermal probes that can be used for a given reference bar length. Within practical constraints, the minimum thermal resistance that can be measured with an ideal instrument is found to be 3 mm2⋅K/W. To verify these results, the thermal resistance across an indium heat spring material with an expected thermal contact resistance of ∼1 mm2⋅K/W is experimentally measured and found to differ by more than 100% when compared to manufacturer-reported values.

Thermal Interface Material Technology Advancements and Challenges: An Overview

2005 ◽  
Author(s):  
Ashay Dani ◽  
James C. Matayabas ◽  
Paul Koning
Keyword(s):  
Flip Chip ◽  
Phase Change Materials ◽  
Heat Dissipation ◽  
Low Cost ◽  
Thermal Interface Material ◽  
Next Generation ◽  
Material Technology ◽  
Thermal Interface ◽  
Flip Chip Packaging ◽  
Architecture And Design

With an increase in the number of transistors (higher power), shrinking processor size (smaller die), and increasing clock speeds (higher frequency) for next generation microprocessors, heat dissipation at the silicon die level has become a critical focus area for microprocessor architecture and design. In addition, power removal at low cost continues to remain the key challenge as we develop the next generation packaging technologies. Novel Thermal Interface Materials (TIM) are required to be designed and developed to meet these new package thermal targets. This paper presents an overview of the novel TIM technologies developed at Intel including greases, phase change materials (PCM), gels, polymer solder hybrids, and solder TIM for multiple generations of desktop, server and mobile microprocessors. The advantages and limitations of these TIM technologies in the thermal management of flip chip packaging are reviewed for Intel’s microprocessors.

Structural design of multilayer thermally conductive nanofibrillated cellulose hybrid film with electrically insulating and antistatic properties

2018 ◽  
Vol 6 (26) ◽  
pp. 7085-7091 ◽  
Author(s):  
Na Song ◽  
Haidong Pan ◽  
Xiaofei Liang ◽  
Donglei Cao ◽  
Liyi Shi ◽  
...  
Keyword(s):  
Tensile Strength ◽  
Structural Design ◽  
Heat Dissipation ◽  
Hybrid Film ◽  
Nanofibrillated Cellulose ◽  
Thermal Interface Material ◽  
Environment Friendly ◽  
Thermal Interface ◽  
Thermally Conductive

We fabricate a thermally conductive, electrically insulating and environment-friendly composite as a thermal interface material (TIM) with excellent tensile strength for heat dissipation.

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