scholarly journals In situ Monitoring of Vapor-phase Polymerization and Characterization of Poly(3,4-ethylenedioxythiophene) Thin Films

2018 ◽  
Vol 30 (12) ◽  
pp. 2873 ◽  
Author(s):  
Yasuko Koshiba ◽  
Mana Hirai ◽  
Shohei Horike ◽  
Masahiro Morimoto ◽  
Masahiro Misaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Phase ◽  
In Situ Monitoring ◽  
Vapor Phase Polymerization

scholarly journals In Situ Lorentz Differential Phase Contrast STEM Characterization of Rashba Interaction on Skyrmion Thin Films

2018 ◽  
Vol 24 (S1) ◽  
pp. 1900-1901
Author(s):  
B. D. Esser ◽  
A. S. Ahmed ◽  
K. Meng ◽  
J. Rowland ◽  
M. Randeria ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Contrast ◽  
Differential Phase ◽  
Rashba Interaction ◽  
Differential Phase Contrast

scholarly journals A new method based on diffusive gradients in thin films for in situ monitoring microcystin-LR in waters

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Lei Yao ◽  
Alan D. Steinman ◽  
Xiang Wan ◽  
Xiubo Shu ◽  
Liqiang Xie
Keyword(s):  
Thin Films ◽  
Passive Sampling ◽  
Sampling Method ◽  
Binding Capacity ◽  
Accurate Method ◽  
In Situ Monitoring ◽  
Active Sampling ◽  
Binding Agent ◽  
Diffusive Gradients

AbstractThe passive sampling method of diffusive gradients in thin-films (DGT) was developed to provide a quantitative and time-integrated measurement of microcystin-LR (MC-LR) in waters. The DGT method in this study used HLB (hydrophilic-lipophilic-balanced) material as a binding agent, and methanol as an eluent. The diffusion coefficient of MC-LR was 5.01 × 10−6 cm2 s−1 at 25 °C in 0.45 mm thick diffusion layer. This DGT method had a binding capacity of 4.24 μg per binding gel disk (3.14 cm2), ensuring sufficient capacity to measure MC-LR in most water matrices. The detection limit of HLB DGT was 0.48 ng L−1. DGT coupled to analysis by HPLC appears to be an accurate method for MC-LR monitoring. Comparison of DGT measurements for MC-LR in water and a conventional active sampling method showed little difference. This study demonstrates that HLB-based DGT is a useful tool for in situ monitoring of MC-LR in fresh waters.

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O2 atmosphere

2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Photoreflectance Characterization of the Semi-Insulating InP Substrate Interface with InGaAs and InAlAs Epilayers

1992 ◽  
Vol 281 ◽  
Author(s):  
Weimin Zhou ◽  
H. Shen ◽  
J. Pamulapati ◽  
M. Dutta ◽  
B. R. Bennett ◽  
...  
Keyword(s):  
Electron Transition ◽  
In Situ Monitoring ◽  
Signal Phase ◽  
Mbe Growth ◽  
Substrate Interface ◽  
Inp Substrate ◽  
Excitonic Transition ◽  
Inp Substrates

ABSTRACTPhotoreflectance (PR) has been performed on a series of undoped and n-type, InGaAs and InAlAs molecular beam epitaxy (MBE) grown layers with different In mole fractions, and epilayer thicknesses on Fe-doped semi-insulating (SI)-InP substrates. From investigations of the temperature dependence, time constant dependence and an additional cw light beam intensity dependence, three substrate peaks are identified as an excitonic transition from the substrate, a free electron transition near the interface which gives a Franz-Keldysh oscillation (KFO), and a transition from the spin-orbit split-off valence band. The results are indicative of a redistribution of charge near the substrate interface in the process of MBE growth; the associated PR signal (phase) could be used for in-situ monitoring of epilayer growth on SI-InP wafers.

Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering

1992 ◽  
Vol 124 (1-4) ◽  
pp. 1-9 ◽  
Author(s):  
D.W. Kisker ◽  
G.B. Stephenson ◽  
P.H. Fuoss ◽  
F.J. Lamelas ◽  
S. Brennan ◽  
...  
Keyword(s):  
Epitaxial Growth ◽  
Vapor Phase ◽  
Grazing Incidence ◽  
Atomic Scale ◽  
X Ray ◽  
X Ray Scattering ◽  
Scale Characterization ◽  
Ray Scattering
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