Infrared Cathodoluminescence Studies from Dislocations in Silicon in tem, a Fourier Transform Spectrometer for Cl in Tem and Els/cl Coincidence Measurements of Lifetimes in Semiconductors

1986 ◽  
Vol 82 ◽  
Author(s):  
R. J. Graham ◽  
J.C.H. Spence ◽  
H. Alexander
Keyword(s):  
Fourier Transform ◽  
Electron Microscope ◽  
High Spatial Resolution ◽  
Life Time ◽  
Infrared Emission ◽  
Fourier Transform Spectrometer ◽  
Infrared Band ◽  
Loss Event ◽  
Electron Energy Loss ◽  
Coincidence Measurements

ABSTRACTIn this paper we report the first observations by cathodoluminescence in TEM of radiative infrared emission from dislocations in silicon. These results were obtained at 23-25K in a Philips EM400 electron microscope. Our results are interpreted in the light of earlier photoluminescence work, and the prospects for obtaining spectra from a small number of well characterized dislocations with high spatial resolution are reviewed. Preliminary results are also reported showing the infrared band-gap emission spectrum of GaInAs at 90K recorded using a small Fourier Transform Spectrometer fitted to the same electron microscope. Finally, we describe timing coincidence experiments from samples in which only those visible CL photons are counted which arrive at the detector at the same time as the corresponding transmitted electron energy loss event. We describe the use of this technique for life-time mapping in semiconductors.

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

The infrared spectrum of CS

1984 ◽  
Vol 62 (12) ◽  
pp. 1414-1419 ◽  
Author(s):  
R. J. Winkel Jr. ◽  
Sumner P. Davis ◽  
Rubén Pecyner ◽  
James W. Brault
Keyword(s):  
Fourier Transform ◽  
Infrared Emission ◽  
Solar Observatory ◽  
Band Head ◽  
The Other ◽  
Fourier Transform Spectrometer ◽  
National Solar Observatory ◽  
Carbon Monosulfide ◽  
Vibration Rotation ◽  
The Fourier Transform

The infrared emission spectrum of carbon monosulfide was observed as a sequence of vibration–rotation bands in the X1Σ+ state, with strong heads of the Δν = 2 sequence degraded to the red. Eight bands of 12C32S were identified, and bands corresponding to the isotope 12C34S were also observed. The most prominent band head, that of the (2–0) band, is at 2585 cm−1, with the other heads spaced approximately 26 cm−1 to smaller wavenumbers. Our data, taken with the Fourier transform spectrometer at the National Solar Observatory (Kitt Peak) include the first reported laboratory observations of the band heads and as many as 200 lines in each band. These observations allowed the calculation of vibrational and rotational constants to higher order than previously reported.

Experimental verification of the need for either jj or intermediate coupling in the 5f states of plutonium

2003 ◽  
Vol 802 ◽  
Author(s):  
K. T. Moore ◽  
M. A. Wall ◽  
A. J. Schwartz ◽  
B. W. Chung ◽  
J. G. Tobin ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Electron Microscope ◽  
Synchrotron Radiation ◽  
Single Phase ◽  
High Spatial Resolution ◽  
Intermediate Coupling ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Energy Loss ◽  
X Ray Absorption

ABSTRACTHere, we demonstrate the power of electron energy-loss spectroscopy (EELS) in a transmission electron microscope (TEM) to investigate the electronic structure plutonium. Using EELS, TEM, and synchrotron-radiation-based X-ray absorption spectroscopy (XAS), we provide the first experimental evidence that Russell-Saunders (LS) coupling fails for the 5f states of Pu. These results support the assumption that only the use of jj or intermediate coupling is appropriate for the 5f states of Pu. EELS experiments were performed in a TEM and are coupled with image and diffraction data, therefore, the measurements are completely phase specific. It is shown that EELS in a TEM may be used to circumvent the difficulty of producing single-phase or single-crystal samples due to its high spatial resolution.

The antisymmetric stretching fundamental band of free MgD2

2004 ◽  
Vol 82 (6) ◽  
pp. 947-950 ◽  
Author(s):  
Alireza Shayesteh ◽  
Dominique RT Appadoo ◽  
Iouli Gordon ◽  
Peter F Bernath
Keyword(s):  
Fourier Transform ◽  
Emission Spectrum ◽  
Electrical Discharge ◽  
Bond Distance ◽  
Infrared Emission ◽  
Fourier Transform Spectrometer ◽  
High Temperature Furnace ◽  
Vibration Rotation ◽  
First Time ◽  
Temperature Furnace

The gaseous MgD2 molecule has been synthesized for the first time in an electrical discharge inside a high-temperature furnace. The high-resolution infrared emission spectrum of MgD2 was recorded with a Fourier transform spectrometer, and the antisymmetric stretching mode (v3) was detected near 1176.5 cm–1. The v3 band was rotationally analyzed, and the r0 Mg—D bond distance was determined to be 1.700 874(8) Å.Key words: gaseous MgD2, vibration-rotation emission spectrum, Mg-D bond distance.

High-resolution infrared emission spectrum of InF

1994 ◽  
Vol 72 (11-12) ◽  
pp. 1213-1217 ◽  
Author(s):  
T. Karkanis ◽  
M. Dulick ◽  
Z. Morbi ◽  
J. B. White ◽  
P. F. Bernath
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Emission Spectrum ◽  
Ground State ◽  
Infrared Emission ◽  
Fourier Transform Spectrometer

A high-resolution infrared emission spectrum of InF was recorded with a Fourier transform spectrometer. A total of 2664 rotational lines from ν = 1 → 0 to ν = 12 → 11 were measured for the major isotopomer 115InF and 179 lines for ν = 1 → 0 and ν = 2 → 1 for the minor isotope 113InF in the X1Σ+ ground state. Revised Dunham Yij constants for each isotopomer as well as isotopically invariant Dunham Uij constants are reported. Also, an effective Born–Oppenheimer potential was determined by fitting the data directly to the eigenvalues of a parameterized potential.

Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution

Nanoscale ◽  
2015 ◽  
Vol 7 (5) ◽  
pp. 1534-1548 ◽  
Author(s):  
Angela E. Goode ◽  
Alexandra E. Porter ◽  
Mary P. Ryan ◽  
David W. McComb
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Transmission Electron Microscope ◽  
High Spatial Resolution ◽  
Scanning Transmission Electron Microscope ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss ◽  
X Ray Absorption

Benefits and challenges of correlative spectroscopy: electron energy-loss spectroscopy in the scanning transmission electron microscope (STEM-EELS) and X-ray absorption spectroscopy in the scanning transmission X-ray microscope (STXM-XAS).

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

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