scholarly journals Radiation Defect-Induced Lattice Contraction of InP

1986 ◽  
Vol 74 ◽  
Author(s):  
C. R. Wie ◽  
T. Jones ◽  
T. A. Tombrello ◽  
T. Vreeland ◽  
F. Xiong ◽  
...  
Keyword(s):  
Raman Line ◽  
Line Width ◽  
Radiation Defect ◽  
Lattice Spacing ◽  
Lattice Strain ◽  
Line Shift ◽  
Lattice Contraction ◽  
Recovery Stage

AbstractWe studied the lattice strain induced in the MeV ion bombarded InP crystals and the annealing behaviors of lattice strain, Raman line shift, and linewidth. The lattice spacing for the planes parallel to the surface decreases as a result of irradiation, and amounts to a strain of −0.061% for (100) face, −0.056% for (110) face, and −0.050% for (111) face for 15 MeV Cl bombarded samples to a dose of 1.25E15 ions/cm2. The negative lattice strain, Raman line shift, and line width completely recover at 450°C, and show a major recovery stage at 250°C – 350°C.

SIZE DEPENDENT FMR LINE-SHIFT AND LINE-WIDTH STUDIES IN POLYCRYSTALLINE FERRITES AND GARNETS

1977 ◽  
Vol 38 (C1) ◽  
pp. C1-267-C1-269 ◽  
Author(s):  
C. M. SRIVASTAVA ◽  
M. J. PATNI ◽  
N. G. NANADIKAR
Keyword(s):  
Line Width ◽  
Line Shift ◽  
Size Dependent

Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?

2004 ◽  
Vol 443-444 ◽  
pp. 91-94 ◽  
Author(s):  
Thomas L. Christiansen ◽  
Marcel A.J. Somers
Keyword(s):  
Depth Profile ◽  
Lattice Spacing ◽  
Lattice Strain ◽  
Strain Analysis ◽  
Weighted Average ◽  
X Ray Diffraction ◽  
Stress Strain ◽  
X Ray ◽  
Composition Profiles ◽  
Actual Stress

On evaluating lattice strain-depth or stress-depth profiles with X-ray diffraction, the variation of the information depth while combining various tilt angles, in combination with lattice spacing gradients leads to artefacts, so-called ghost or fictitious stresses. X-ray diffraction lattice-strain analysis was simulated for a model stress-depth profile combined with a composition-depth profile. Two principally different methods were investigated for the reconstruction of the actual stress and composition profiles from the simulated data: - considering the stress/strain determined at a specific depth as a weighted average over the actual stress/strain depth profile - considering the lattice spacing determined at a specific depth, for a specific value for as a weighted average over the actual lattice spacing profile for this direction. On the basis of the results it is possible to propose a preferred method for the evaluation of stress/strain and composition profiles, while minimising the risk for ghost stresses.

Properties of Digital Smoothing Polynomial (DISPO) Filters

1981 ◽  
Vol 35 (1) ◽  
pp. 88-92 ◽  
Author(s):  
Horst Ziegler
Keyword(s):  
Noise Reduction ◽  
Real Time ◽  
Line Width ◽  
Time Constant ◽  
Fourth Order ◽  
Digital Filters ◽  
Half Width ◽  
Line Shift ◽  
Scan Speed

Digital filters for spectrometric applications are compared with the classical RC filter. Properties discussed include noise reduction, line shift, and conservation of line moments. For Gaussian and Lorentzian lines, signal deformation and change of half-width as a function of time constant and line width are calculated for several filter types. Using accuracy, sensitivity, and scan speed as criteria, it is shown that a fourth-order digital smoothing polynomial (DISPO) filter is better by typically 1 or even 2 orders of magnitude than the RC filter. Since a real time implementation of these filters is possible, they can directly replace RC filters in all spectrometric applications.

Temperature-depending Raman line-shift of silicon carbide

2009 ◽  
Vol 40 (12) ◽  
pp. 1867-1874 ◽  
Author(s):  
Michael Bauer ◽  
Alexander M. Gigler ◽  
Andreas J. Huber ◽  
Rainer Hillenbrand ◽  
Robert W. Stark
Keyword(s):  
Silicon Carbide ◽  
Raman Line ◽  
Line Shift

On the analysis of the thermal line shift and thermal line width of ions in solids

2015 ◽  
Vol 158 ◽  
pp. 265-267 ◽  
Author(s):  
Brian M. Walsh ◽  
Baldassare Di Bartolo
Keyword(s):  
Line Width ◽  
Line Shift ◽  
Thermal Line

scholarly journals Modelling the coefficient of thermal expansion in graphite crystals: implications of lattice strain due to irradiation and pressure

2018 ◽  
Vol 474 (2218) ◽  
pp. 20180075 ◽  
Author(s):  
Barry Marsden ◽  
Andrew Mummery ◽  
Paul Mummery
Keyword(s):  
Thermal Expansion ◽  
Input Data ◽  
Lattice Spacing ◽  
Lattice Strain ◽  
Coefficient Of Thermal Expansion ◽  
Pyrolytic Graphite ◽  
Theoretical Models ◽  
Nuclear Graphite ◽  
First Time ◽  
Insight Into

Theoretical models for the coefficient of thermal expansion (CTE) first proposed in the 1970s are expanded upon, allowing them, for the first time, to be implemented over a wide temperature range. The models are of interest because they predict the effects of the changes in the crystal lattice spacing and crystallite modulus on the CTE. Hence, they can in turn be used to investigate the influence of pressure and irradiation on the CTE. To date, typographical and mathematical errors and incomplete or conflicting assumptions between the various papers had made the complex mathematical formulations difficult, if not impossible, to follow and apply. This paper has two main aims: firstly to revisit and review the CTE models, correcting the errors and compiling and updating various input data, secondly to use the revised models to investigate the effect of loading and irradiation on the CTE. In particular, the models have been applied to data for natural and highly orientated pyrolytic graphite and compared with experimental data, giving an insight into the influence of temperature, loading and irradiation on both single crystal and polycrystalline graphite. The findings lend credence to postulated microstructural mechanisms attributed to the in-reactor behaviour of nuclear graphite, which finds a wide use in predictive multiscale modelling.

A New Approach to Explain Concentration-Dependent Changes of Isotropic Raman Line Width in the Associated Binary Mixtures

2006 ◽  
Vol 110 (32) ◽  
pp. 9849-9853 ◽  
Author(s):  
Animesh K. Ojha ◽  
Sunil K. Srivastava ◽  
Ranjan K. Singh ◽  
B. P. Asthana
Keyword(s):  
Binary Mixtures ◽  
Raman Line ◽  
Line Width ◽  
New Approach
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