Material Characterization by Contactless Photoconductivity Measurements
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AbstractTransient photoconductivity measurements with the time-resolved microwave conductivity (TRMC) method have been applied to three different types of semiconductors: hydrogenated amorphous silicon, single crystalline silicon and GaAs/GaAlAs multiple quantum well structures. Analysis of the signals in terms of charge carrier-lattice interaction points to an intimate relation between TRMC signals and intrinsic material properties. It is shown that the TRMC-technique is an excellent tool to characterize photosensitive materials.
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1999 ◽
Vol 4
(1)
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1992 ◽
Vol 06
(12)
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pp. 703-716
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