Microstructural Characterization of Longitudinal Magnetic Recording Media

1999 ◽  
Vol 589 ◽  
Author(s):  
Robert Sinclair ◽  
Dong-Won Park ◽  
Claus Habermeier ◽  
Kai Ma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Microstructural Characterization ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Grain Sizes ◽  
Transmission Electron ◽  
The Media

AbstractThe optimization of disc manufacturing conditions is required to increase the storage capacities of magnetic recording media, which is strongly related to both magnetic properties and microstructural features. Analyzing the microstructure requires transmission electron microscopy (TEM), since the small grain sizes of the media prevent other tools from characterizing them. This paper discusses several fascinating characteristics of TEM in understanding and analyzing the properties of the recording media.

Quantitative Measurements of Segregation In Co-Cr-X Magnetic Recording Media by Energy-Filtered Transmission Electron Microscopy

1998 ◽  
Vol 517 ◽  
Author(s):  
J. Bentley ◽  
J.E. Wittig ◽  
T.P. Nolan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Core Loss ◽  
Specimen Thickness ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Quantitative Measurements ◽  
Transmission Electron ◽  
Random Angle

AbstractReliable core-loss spectroscopic methods have been developed for mapping elemental segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy. Extraction of quantitative compositions at a spatial resolution approaching 1 nm involves sophisticated treatments for diffraction contrast, variations in specimen thickness, and closely-spaced oxygen K and chromium L23 ionization edges. These methods reveal that intergranular chromium levels are ∼25 at.% for random-angle boundaries and ∼15 at.% for 90° boundaries in films of Co84Cr12Ta4 d.c. magnetron sputtered at 250°C.

Aberration-Corrected Transmission Electron Microscopy of the Intergranular Phase in Magnetic Recording Media

Nano Letters ◽  
2012 ◽  
Vol 12 (5) ◽  
pp. 2595-2598 ◽  
Author(s):  
Faraz Hossein-Babaei ◽  
Ai Leen Koh ◽  
Kumar Srinivasan ◽  
Gerardo A. Bertero ◽  
Robert Sinclair
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Intergranular Phase ◽  
Transmission Electron ◽  
Aberration Corrected

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

TEM Study of AlGaN/GaN on Hexagonal SiC Substrates

2014 ◽  
Vol 936 ◽  
pp. 656-660
Author(s):  
Alexandra Gkanatsiou ◽  
Christos B. Lioutas ◽  
Nikolaos Frangis ◽  
Narendraraj Chandraraj ◽  
Efstathios K. Polychroniadis ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Tem Characterization ◽  
Transmission Electron ◽  
Surface Undulation

The present work concerns the microstructural characterization of a multi-component (based on GaN and related materials) and multi-layered (5 layers) film, grown on 6H-SiC substrate (with a misorientation of 1 degree off from the (0001) plane), using transmission electron microscopy (TEM). The TEM characterization showed no surface undulation, despite the presence of steps in the SiC/AlN interface.

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