Aberration-Corrected Transmission Electron Microscopy of the Intergranular Phase in Magnetic Recording Media

Nano Letters ◽  
2012 ◽  
Vol 12 (5) ◽  
pp. 2595-2598 ◽  
Author(s):  
Faraz Hossein-Babaei ◽  
Ai Leen Koh ◽  
Kumar Srinivasan ◽  
Gerardo A. Bertero ◽  
Robert Sinclair
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Intergranular Phase ◽  
Transmission Electron ◽  
Aberration Corrected

Quantitative Measurements of Segregation In Co-Cr-X Magnetic Recording Media by Energy-Filtered Transmission Electron Microscopy

1998 ◽  
Vol 517 ◽  
Author(s):  
J. Bentley ◽  
J.E. Wittig ◽  
T.P. Nolan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Core Loss ◽  
Specimen Thickness ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Quantitative Measurements ◽  
Transmission Electron ◽  
Random Angle

AbstractReliable core-loss spectroscopic methods have been developed for mapping elemental segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy. Extraction of quantitative compositions at a spatial resolution approaching 1 nm involves sophisticated treatments for diffraction contrast, variations in specimen thickness, and closely-spaced oxygen K and chromium L23 ionization edges. These methods reveal that intergranular chromium levels are ∼25 at.% for random-angle boundaries and ∼15 at.% for 90° boundaries in films of Co84Cr12Ta4 d.c. magnetron sputtered at 250°C.

Microstructural Characterization of Longitudinal Magnetic Recording Media

1999 ◽  
Vol 589 ◽  
Author(s):  
Robert Sinclair ◽  
Dong-Won Park ◽  
Claus Habermeier ◽  
Kai Ma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Microstructural Characterization ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Grain Sizes ◽  
Transmission Electron ◽  
The Media

AbstractThe optimization of disc manufacturing conditions is required to increase the storage capacities of magnetic recording media, which is strongly related to both magnetic properties and microstructural features. Analyzing the microstructure requires transmission electron microscopy (TEM), since the small grain sizes of the media prevent other tools from characterizing them. This paper discusses several fascinating characteristics of TEM in understanding and analyzing the properties of the recording media.

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk

1991 ◽  
Vol 49 ◽  
pp. 580-581
Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Magnetic Thin Films ◽  
Magnetic Films ◽  
Substrate Bias ◽  
Epitaxial Relationship ◽  
Transmission Electron

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.

scholarly journals The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

2010 ◽  
Vol 16 (S2) ◽  
pp. 122-123
Author(s):  
P Specht ◽  
R Gulotty ◽  
D Barton ◽  
R Cieslinski ◽  
S Rozeveld ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
The Impact ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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