Microstructural characterization of Ni-22Fe-22Cr-6Al metallic foam by transmission electron microscopy

2012 ◽  
Vol 61 (5) ◽  
pp. 299-304 ◽  
Author(s):  
H. G. Kim ◽  
T. W. Lee ◽  
J. Y. Lee ◽  
E. S. Lee ◽  
K. O. Oh ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Metallic Foam ◽  
Transmission Electron

TEM Study of AlGaN/GaN on Hexagonal SiC Substrates

2014 ◽  
Vol 936 ◽  
pp. 656-660
Author(s):  
Alexandra Gkanatsiou ◽  
Christos B. Lioutas ◽  
Nikolaos Frangis ◽  
Narendraraj Chandraraj ◽  
Efstathios K. Polychroniadis ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Tem Characterization ◽  
Transmission Electron ◽  
Surface Undulation

The present work concerns the microstructural characterization of a multi-component (based on GaN and related materials) and multi-layered (5 layers) film, grown on 6H-SiC substrate (with a misorientation of 1 degree off from the (0001) plane), using transmission electron microscopy (TEM). The TEM characterization showed no surface undulation, despite the presence of steps in the SiC/AlN interface.

Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films

2011 ◽  
Vol 110 (7) ◽  
pp. 073514 ◽  
Author(s):  
Benedikt Haas ◽  
Andreas Beyer ◽  
Wiebke Witte ◽  
Tobias Breuer ◽  
Gregor Witte ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Transmission Electron

Microstructural Characterization of Longitudinal Magnetic Recording Media

1999 ◽  
Vol 589 ◽  
Author(s):  
Robert Sinclair ◽  
Dong-Won Park ◽  
Claus Habermeier ◽  
Kai Ma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Microstructural Characterization ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Grain Sizes ◽  
Transmission Electron ◽  
The Media

AbstractThe optimization of disc manufacturing conditions is required to increase the storage capacities of magnetic recording media, which is strongly related to both magnetic properties and microstructural features. Analyzing the microstructure requires transmission electron microscopy (TEM), since the small grain sizes of the media prevent other tools from characterizing them. This paper discusses several fascinating characteristics of TEM in understanding and analyzing the properties of the recording media.

Synthesis and Microstructural Analysis of Si3N4 Nanorods

2002 ◽  
Vol 8 (1) ◽  
pp. 5-10 ◽  
Author(s):  
Y.H. Gao ◽  
Y. Bando ◽  
K. Kurashima ◽  
T. Sato
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Activated Carbon ◽  
Carbothermal Reduction ◽  
Microstructural Analysis ◽  
Microstructural Characterization ◽  
X Ray ◽  
Transmission Electron ◽  
Closest Packing

α-Si3N4 nanorods with 20–80 nm width were synthesized by carbothermal reduction of SiO with amorphous activated carbon (AAC) as a reductant. Microstructural characterization of the synthesized nanorods was carried out by high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray analysis. Many Si3N4 nanorods were found to be twisted. Each twisted nanorod contained several straight Si3N4 parts. The straight parts had the rod axes orientated along the 〈1010〉 direction, which is the closest packing direction of α-Si3N4. There were two kinds of joints between the two adjacent straight Si3N4 parts. Formation mechanism of the Si3N4 nanorods is discussed.

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