Effects of hydrogen in AlAs growth by atomic hydrogenassisted molecular beam epitaxy

1999 ◽  
Vol 570 ◽  
Author(s):  
Kee-Youn Jang ◽  
Yoshitaka Okada ◽  
Mitsuo Kawabe

ABSTRACTThe transition temperature Tc for the AlAs growth to change from/to a nucleation mode and step-flow mode have been studied on vicinal GaAs substrates (A-surface and B-surface) in molecular beam epitaxy (MBE) and atomic hydrogen-assisted MBE (H-MBE) using reflection high-energy electron diffraction (RHEED). The lowering of Tc was clearly observed in H-MBE compared to conventional MBE. For growth of AlAs on vicinal GaAs substrate in H-MBE, atomic H is thought to promote not only the re-evaporation of Al adatoms on the terrace, but also the incorporation of Al at the step edges, thereby facilitating a step-flow growth mode at a lower temperature than in MBE. The differences in the fundamental growth mode between on A-surface and B-surface have also been studies based on the differences in the atomic structure between the two substrates.

1988 ◽  
Vol 144 ◽  
Author(s):  
M. M. AI-Jassim ◽  
J. P. Goral ◽  
P. Sheldon ◽  
K. M. Jones

ABSTRACTEpitaxial InAs layers were grown by molecular beam epitaxy (MBE) on GaAs substrates. The initial stages of nucleation were studied by in situ reflection high energy electron diffraction (RHEED). Cross-sectional TEM examination was used to investigate the morphology of the growing layer, while plan-view examination revealed the generation of misfit dislocations. The growth mode was found to depend mainly on the conditions used to nucleate the epitaxial layer. In most cases, Stranski-Krastanov type of growth was observed.


2D Materials ◽  
2020 ◽  
Vol 7 (3) ◽  
pp. 035014 ◽  
Author(s):  
James Thomas ◽  
Jonathan Bradford ◽  
Tin S Cheng ◽  
Alex Summerfield ◽  
James Wrigley ◽  
...  

1995 ◽  
Vol 395 ◽  
Author(s):  
U. Rossner ◽  
J.-L. Rouviere ◽  
A. Bourret ◽  
A. Barski

ABSTRACTElectron Cyclotron Resonance Plasma Assisted Molecular Beam Epitaxy (ECR-MBE) and Gas Source Molecular Beam Epitaxy (GSMBE) have been used to grow hexagonal GaN on Si (111). In the ECR-MBE configuration high purity nitrogen has been used as nitrogen source. In GSMBE ammonia was supplied directly to the substrate to be thermally cracked in the presence of gallium.By a combined application of in-situ reflection high-energy electron-diffraction (RHEED) and cross-sectional transmission electron microscopy (TEM) the growth mode and structure of GaN were determined. The growth mode strongly depends on growth conditions. Quasi two dimensional growth was observed in ECR-MBE configuration for a substrate temperature of 640°C while three dimensional growth occured in GSMBE configuration in the temperature range from 640 to 800°C.Low temperature (9 K) photoluminescence spectra show that for samples grown by ECR-MBE and GSMBE a strong near band gap emission peak dominates while transitions due to deep level states are hardly detectable. The best optical results (the highest near band gap emission peak intensity) have been observed for samples grown by GSMBE at high temperature (800°C). This could be explained by the increase of grain dimensions (up to 0,3 – 0,5 μm) observed in samples grown by GSMBE at 800°C.


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