Effect of Hydrogen Plasma Treatments at very High Frequency on p-Type Amorphous and Microcrystalline Silicon Films

1998 ◽  
Vol 536 ◽  
Author(s):  
E. Centurioni ◽  
A. Desalvo ◽  
R. Pinghini ◽  
R. Rizzoli ◽  
C. Summonte ◽  
...  

AbstractVery high frequency (100 MHz) hydrogen plasma treatments on a-Si:H deposited by plasma enhanced chemical vapour deposition were studied. Ex-situ optical measurements have shown that etching and chemical transport occur as competing phenomena. The one that prevails is determined by the plasma conditions. In particular, very efficient chemical etching is observed for high H2 flow rates, while, for low H2 flow rates, the equilibrium is shifted toward deposition, and a structural modification of the sample is observed. The experimental conditions were stressed in the direction of utilizing chemical transport from the cathode to deposit very thin (7 nm) microcrystalline films with a pure H2 plasma.

1994 ◽  
Vol 358 ◽  
Author(s):  
P. Hapke ◽  
F. Finger ◽  
M. Luysberg ◽  
R. Carius ◽  
H. Wagner

ABSTRACTThe growth mechanism and material properties of -type µc-Si:H prepared with plasma enhanced chemical vapour deposition in the very high frequency range is investigated. By increasing the plasma excitation frequency the grain size, deposition rate and Hall mobility can be simultaneously increased without having to adjust other deposition parameters in particular the temperature. This effect is explained by an enhanced selective etching of amorphous tissue and grain boundary regions together with a sufficient supply of growth species at high frequency plasmas.


2013 ◽  
Vol 52 (11S) ◽  
pp. 11ND01 ◽  
Author(s):  
Kohei Ogiwara ◽  
Weiting Chen ◽  
Kiichiro Uchino ◽  
Yoshinobu Kawai

2012 ◽  
Vol 61 (16) ◽  
pp. 165203
Author(s):  
Li Yan-Yang ◽  
Yang Shi-E ◽  
Chen Yong-Sheng ◽  
Zhou Jian-Peng ◽  
Li Xin-Li ◽  
...  

2008 ◽  
Vol 40 (2) ◽  
pp. 166-181
Author(s):  
Sukirno ◽  
Satria Zulkarnaen Bisri ◽  
Rasih Yulia Sari ◽  
Lilik Hasanah ◽  
Mursal ◽  
...  

2013 ◽  
Vol 547 ◽  
pp. 132-136 ◽  
Author(s):  
Kohei Ogiwara ◽  
Weiting Chen ◽  
Kiichiro Uchino ◽  
Yoshinobu Kawai

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