Characterization of Mechanical Properties of Thin Polymer Films using Scanning Probe Microscopy

1998 ◽  
Vol 522 ◽  
Author(s):  
J. Xu ◽  
J. Hooker ◽  
I. Adhihmetty ◽  
P. Padmanabhan ◽  
W. Chen
Keyword(s):  
Mechanical Properties ◽  
Polymer Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Thin Polymer Films ◽  
Probe Microscopy ◽  
Thin Polymer

Development and characterization of thin polymer films relevant to fiber processing

2009 ◽  
Vol 517 (15) ◽  
pp. 4348-4354 ◽  
Author(s):  
Junlong Song ◽  
Jing Liang ◽  
Xiaomeng Liu ◽  
Wendy E. Krause ◽  
Juan P. Hinestroza ◽  
...  
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Thin Polymer ◽  
Fiber Processing

Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner

The Analyst ◽  
2016 ◽  
Vol 141 (5) ◽  
pp. 1753-1760 ◽  
Author(s):  
Lu Lu ◽  
Song Xu ◽  
Donghui Zhang ◽  
Jayne C. Garno
Keyword(s):  
Mechanical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Modulation ◽  
Topographic Information

Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information.

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