Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner

The Analyst ◽  
2016 ◽  
Vol 141 (5) ◽  
pp. 1753-1760 ◽  
Author(s):  
Lu Lu ◽  
Song Xu ◽  
Donghui Zhang ◽  
Jayne C. Garno

Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information.

2015 ◽  
Vol 7 (17) ◽  
pp. 7106-7127 ◽  
Author(s):  
J. J. Bang ◽  
S. R. Russell ◽  
K. K. Rupp ◽  
S. A. Claridge

Multimodal scanning probe microscopy enables analysis of not only surface topography, but also surface chemistry, electrical, magnetic, and mechanical properties.


2007 ◽  
Vol 3 (1) ◽  
pp. 97-103 ◽  
Author(s):  
Hisashi Haga ◽  
Masafumi Nagayama ◽  
Kazushige Kawabata

2002 ◽  
Vol 41 (Part 1, No. 7B) ◽  
pp. 4952-4955 ◽  
Author(s):  
Masafumi Nagayama ◽  
Hisashi Haga ◽  
Yoshio Tanaka ◽  
Yoshihiko Hirai ◽  
Masaaki Kabuto ◽  
...  

Author(s):  
I. Yaminsky

Probe microscopy allows obtaining unique data on the viruses local physic-mechanical properties, while the preparation procedure, unlike other methods, is simple and does not require additional reagents. With the help of scanning probe microscopy, it is possible to obtain high resolution - up to 1 angstrom.


2007 ◽  
Vol 46 (9B) ◽  
pp. 6324-6328 ◽  
Author(s):  
Masashi Kitazawa ◽  
Ryo Ohta ◽  
Tatsuhiko Okita ◽  
Junya Tanaka ◽  
Masaki Tanemura

Sign in / Sign up

Export Citation Format

Share Document