Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner
Keyword(s):
Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information.
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2002 ◽
Vol 41
(Part 1, No. 7B)
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pp. 4952-4955
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2003 ◽
Vol 206
(1-4)
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pp. 271-293
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2020 ◽
pp. 119-120
2007 ◽
Vol 46
(9B)
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pp. 6324-6328
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