Comparison of the Electromigration Behavior of Al(MgCu) with Al(Cu) and Al(SiCu)

1998 ◽  
Vol 514 ◽  
Author(s):  
Hua Li ◽  
Ann Witvrouw ◽  
Sing Jin ◽  
Hugo Bender ◽  
Karen Maex ◽  
...  
Keyword(s):  
Surface Segregation ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time To Failure ◽  
Experimental Conditions ◽  
Plan View ◽  
Transmission Electron ◽  
Strong Surface ◽  
Mg Addition

ABSTRACTMg is one of the elements that are regarded as having a beneficial effect on the Al electromigration (EM) lifetime. In this paper, we compare the EM behavior of 0.4 μm wide passivated Al-1%Mg-0.5%Cu, Al-0.5%Cu and Al-l%Si-0.5%Cu lines. Plan-view transmission electron microscopy and focused ion beam imaging reveal that Al(MgCu) film undergoes bimodal grain growth. Auger electron spectroscopy and secondary ion mass spectrometry show a strong surface segregation and a severe bulk depletion of Mg. Additionally the line-width dependence of the rate of the resistivity decay during aging shows also a different behavior for Al(MgCu) compared to Al(Cu) and Al(SiCu). All these findings are consistent with the EM results that Al(MgCu), processed with our experimental conditions, has both the lowest median time to failure and deviation in time to failure. The results are discussed in the light of the effect of Mg addition on the microstructure and of the great surface activity of Mg.

TEM FIB Lift-Out of Mount Saint Helens Volcanic Ash

1999 ◽  
Vol 5 (S2) ◽  
pp. 908-909
Author(s):  
J.L. Drown-MacDonald ◽  
B.I. Prenitzer ◽  
T.L. Shofner ◽  
L.A. Giannuzzi
Keyword(s):  
Cross Sections ◽  
Volcanic Ash ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Tem Analysis ◽  
Plan View ◽  
Transmission Electron ◽  
Silver Paint

Focused Ion Beam (FIB) specimen preparation for both scanning and transmission electron microscopy (SEM and TEM respectively) has seen an increase in usage over the past few years. The advantage to the FIB is that site specific cross sections (or plan view sections) may be fabricated quickly and reproducibly from numerous types of materials using a finely focused beam of Ga+ ions [1,2]. It was demonstrated by Prenitzer et al. that TEM specimens may be acquired from individual Zn powder particles by employing the FIB LO specimen preparation technique [3]. In this paper, we use the FIB LO technique to prepare TEM specimens from Mount Saint Helens volcanic ash.Volcanic ash from Mount Saint Helens was obtained at the Microscopy and Microanalysis 1998 meeting in Atlanta. TEM analysis of the ash was performed using the FIB lift out technique [1]. Ash powders were dusted onto an SEM sample stud that had been coated with silver paint.

scholarly journals The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

2020 ◽  
Author(s):  
Motoo Ito ◽  
Naotaka Tomioka ◽  
Kentaro Uesugi ◽  
Masayuki Uesugi ◽  
Yu Kodama ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Isotopic Abundances ◽  
Sample Return Mission ◽  
Extraterrestrial Materials ◽  
Sample Damage

Abstract We developed universal sample holders (the Kochi grid, Kochi clamp, and Okazaki cell) and a transfer vessel (facility-to-facility transfer container (FFTC)) to analyze sensitive and fragile samples, such as extremely small extraterrestrial materials. The holders and container prevent degradation, contamination due to terrestrial atmosphere (water vapor and oxygen gas) and small particles, as well as mechanical sample damages. The FFTC can isolate the samples from the effects of the atmosphere for more than a week. The Kochi grid and clamp were made for a coordinate micro/nano-analysis that utilize a focused-ion beam apparatus, transmission electron microscope, and nanoscale secondary ion mass spectrometry. The Okazaki cell was made as an additional attachment for a scanning transmission X-ray microscope that uses near edge X-ray absorption fine structure. The coordinated analysis involving these holders was successfully carried out without any sample damage or loss, thereby enabling us to obtain sufficient quality of analytical datasets of textures, crystallography, elemental/isotopic abundances, and molecular functional groups for µm-sized minerals and organics in both an Antarctic micrometeorite and a carbonaceous chondrite. We will apply the coordinated analysis to acquire the complex characteristics in samples that obtain by the future spacecraft sample return mission.

scholarly journals The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

2020 ◽  
Vol 72 (1) ◽  
Author(s):  
Motoo Ito ◽  
Naotaka Tomioka ◽  
Kentaro Uesugi ◽  
Masayuki Uesugi ◽  
Yu Kodama ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Isotopic Abundances ◽  
Sample Return Mission ◽  
Extraterrestrial Materials ◽  
Sample Damage

Abstract We developed universal sample holders [the Kochi grid, Kochi clamp, and Okazaki cell) and a transfer vessel (facility-to-facility transfer container (FFTC)] to analyze sensitive and fragile samples, such as extremely small extraterrestrial materials. The holders and container prevent degradation, contamination due to the terrestrial atmosphere (water vapor and oxygen gas) and small particles, as well as mechanical sample damage. The FFTC can isolate the samples from the effects of the atmosphere for more than a week. The Kochi grid and clamp were made for a coordinated micro/nano-analysis that utilizes a focused-ion beam apparatus, transmission electron microscope, and nanoscale secondary ion mass spectrometry. The Okazaki cell was developed as an additional attachment for a scanning transmission X-ray microscope that uses near-edge X-ray absorption fine structure (NEXAFS). These new apparatuses help to minimize possible alterations from the exposure of the samples to air. The coordinated analysis involving these holders was successfully carried out without any sample damage or loss, thereby enabling us to obtain sufficient analytical datasets of textures, crystallography, elemental/isotopic abundances, and molecular functional groups for µm-sized minerals and organics in both the Antarctic micrometeorite and a carbonaceous chondrite. We will apply the coordinated analysis to acquire the complex characteristics in samples obtained by the future spacecraft sample return mission.

scholarly journals Nature's Engineering Marvels: the Structure and Chemistry of a Butterfly Wing

2006 ◽  
Vol 14 (6) ◽  
pp. 16-21
Author(s):  
V.S. Smentkowski ◽  
S.G. Ostrowski ◽  
E.J. Olson ◽  
J. Cournoyer ◽  
K. Dovidenko ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Ion Beam ◽  
Analytical Techniques ◽  
Butterfly Wing ◽  
Transmission Electron ◽  
Micro Machine ◽  
Compare And Contrast

Much effort is currently being expended in nanotechnology and other fields to build biomimetic, or nature-inspired, materials. The first step in this process is often to develop a more complete understanding of the structure and chemistry of biological systems. In this article, we will compare and contrast data collected on a common biological sample, a butterfly wing, using a variety of analytical techniques. Transmission Electron Microscopy (TEM) was used in order to perform bright field imaging of the sample cross section; Light Microscopy (LM) and Scanning Electron Microscopy (SEM) were used to provide structural information of the outer wing surface at various magnifications; Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) was used in order to image the chemical composition of the outer most surface layer; and Focused Ion Beam (FIB) techniques were used to cut (micro machine) features into the wing.

scholarly journals The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

2020 ◽  
Author(s):  
Motoo Ito ◽  
Naotaka Tomioka ◽  
Kentaro Uesugi ◽  
Masayuki Uesugi ◽  
Yu Kodama ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Isotopic Abundances ◽  
Sample Return Mission ◽  
Extraterrestrial Materials ◽  
Sample Damage

Abstract We developed universal sample holders (the Kochi grid, Kochi clamp, and Okazaki cell) and a transfer vessel (facility-to-facility transfer container (FFTC)) to analyze sensitive and fragile samples, such as extremely small extraterrestrial materials. The holders and container prevent degradation, contamination due to terrestrial atmosphere (water vapor and oxygen gas) and small particles, as well as mechanical sample damages. The FFTC can isolate the samples from the effects of the atmosphere for more than a week. The Kochi grid and clamp were made for a coordinate micro/nano-analysis that utilize a focused-ion beam apparatus, transmission electron microscope, and nanoscale secondary ion mass spectrometry. The Okazaki cell was made as an additional attachment for a scanning transmission X-ray microscope that uses near edge X-ray absorption fine structure. The coordinated analysis involving these holders was successfully carried out without any sample damage or loss, thereby enabling us to obtain sufficient quality of analytical datasets of textures, crystallography, elemental/isotopic abundances, and molecular functional groups for µm-sized minerals and organics in both an Antarctic micrometeorite and a carbonaceous chondrite. We will apply the coordinated analysis to acquire the complex characteristics in samples that obtain by the future spacecraft sample return mission.

scholarly journals Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site

2005 ◽  
Vol 13 (1) ◽  
pp. 26-29 ◽  
Author(s):  
R.B. Irwin ◽  
A. Anciso ◽  
P.J. Jones ◽  
C. Patton
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Focused Ion Beam ◽  
Bulk Material ◽  
Ion Beam ◽  
Preparation Technique ◽  
Ion Milling ◽  
Plan View ◽  
Transmission Electron ◽  
Final Sample

Sample preparation for Transmission Electron Microscopy (TEM) is usually performed such that the final sample orientation is either a cross section or a plan view of the bulk material, as shown schematically in Figure 1. The object of any sample preparation technique, for either of these two orientations, is to thin a selected volume of the sample from its initial bulk state to electron transparency, ~ 100nm thick. In doing so, the final sample must be mechanically stable, vacuum compatible, and, most of all, unchanged from the initial bulk material. Many techniques have been used to achieve this goal: cleaving, sawing, mechanical polishing, chemical etching, ion milling, focused ion beam (FIB) milling, and many others.

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