Large Area Deposition of Amorphous and Microcrystalline Silicon by Very High Frequency Plasma

1998 ◽  
Vol 507 ◽  
Author(s):  
L. Sansonnens ◽  
A. A. Howling ◽  
Ch. Hollenstein

ABSTRACTTwo aspects of VHF plasma deposition in a large area reactor are investigated: 1) Experiments and model show that voltage inhomogeneities become serious at high frequency but can be reduced by suitable RF connection configuration. These voltage inhomogeneities are the main factor limiting the excitation frequency in order to satisfy film thickness uniformity requirements; 2) the effect of the frequency on the plasma properties has been studied between 13.56 MiHz and 70 MHz. The results show that an increase of the electron density with the frequency leads to a more efficient dissociation of silane. This increase of the gas phase reactivity of the plasma is largely responsible for the higher deposition rates observed athigh frequency.The choice of the excitation frequency for a given application is a compromise between the gain of higher deposition rate and the frequency limit imposed by homogeneity requirements.

2001 ◽  
Vol 16 (7) ◽  
pp. 2130-2135
Author(s):  
Tapati Jana ◽  
Arup Dasgupta ◽  
Swati Ray

We developed p-type μc-silicon carbon alloy thin films by the very high frequency plasma-enhanced chemical vapour deposition technique using a SiH4, H2, CH4, and B2H6 gas mixture at low power (55 mW/cm2) and low substrate temperatures (150–250 °C). Effects of substrate temperature and plasma excitation frequency on the optoelectronic and structural properties of the films were studied. A film with conductivity 5.75 Scm−1 and 1.93 eV optical gap (E04) was obtained at a low substrate temperature of 200 °C using 63.75 MHz plasma frequency. The crystalline volume fractions of the films were estimated from the Raman spectra. We observed that crystallinity in silicon carbon alloy films depends critically on plasma excitation frequency. When higher power (117 mW/cm2) at 180 °C with 66 MHz frequency was applied, the deposition rate of the film increased to 50.7 Å/min without any significant change in optoelectronic properties.


2011 ◽  
Vol 50 (2R) ◽  
pp. 025002 ◽  
Author(s):  
Yoshifumi Nakamine ◽  
Naoki Inaba ◽  
Tetsuo Kodera ◽  
Ken Uchida ◽  
Rui N. Pereira ◽  
...  

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